Highly Accelerated Life Test
Processes a product through extreme temperature, vibration and product tailored stresses to expose design limits.
See Also: HALT
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Deep Learning Accelerators
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ADLINK’s Deep Learning Accelerators provide GPU- and VPU-accelerated inferencing with embedded, small, and standard form factors. ADLINK’s Deep Learning Accelerators offer high performance, power efficiency and longevity support required of AI applications at the edge, delivering actionable insights at the right place at the right time for industrial automation, transportation, smart city, military and aerospace applications and more.
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PCIe Based FPGA Processing / Acceleration Card
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iWave’s PCIe based FPGA Processing / Acceleration Card is a half-length PCIe x4 card featuring a high-performance user-configurable Xilinx® Kintex®-7 FPGA enhanced with high-speed memory and a high-throughput serial interface. Front I/O adds dual SFP ports, 1x HDMI1.4a IN, 1x HDMI1.4a OUT. All of these features combine to make the card ideal for a wide range of applications such as Edge Computing, ARINC818 Avionics Video Bus, Acceleration.
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Acceleration Simulation Mode (ASM)
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Maschinenbau Haldenwang GmbH & Co. KG.
MAHA Acceleration Simulation Mode (ASM) Products
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In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Automated Screenshots of Webpages for Accelerated Layout Testing
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Auto-generate full-paged screenshots of your webpages across multiple devices, operating systems, browsers, and resolutions - in a single go! LambdaTest Automated Browser Screenshot feature accelerates your UI and Layout testing helping you quickly identify layout issues across browser versions and screen sizes.
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Accelerated Product Life Cycle
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Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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Hybrid Single Site Test Handler
3110
Test Handler
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Automated Test System
Marvin GBATS
Test Platform
GBATS (Basic Automated Test System) is a preconfigured, modular PXI test platform that addresses analogue, digital, mixed-signal and avionics test needs.
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EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Non-standard Constant Acceleration Tester
KRD32 series
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KRD32 series non-standard constant acceleration testing machine is test equipment for military products to simulate dynamic centrifugal motion, dual environmental force centrifugal motion and central high-speed rotating motion.
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Hailo-8™ MXM AI Acceleration Module
EAI-2300
Acceleration Module
52 TOPS powered by dual Hailo-8 NPU. Slim type MXM 3.1 Type A. -40~70°C operating temp. with optional fansink. Max. 20W power consumption. Rich AI Development Toolkits for Runtime SDK integration, Model build, Model Convert, and Pre-trained AI application.
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Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Extremely Accelerated Stress Test Chambers
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The extremely accelerated stress environment is defined by high temperature, high humidity and high pressure. WEIBER provides humidity resistance evaluation test for electronics components through customized Extremely Accelerated Stress Test Chamber. This chamber provides high performance test in minimal amount of time according to international IEC 60068-2-66 standard. This chamber also known as Accelerated Stress Test Chamber, Halt and Hass Test Chamber, Halt Test Chamber and Hass Test Chamber.This chamber reduces the time taken for humidity testing in electronic components. 2 types of tests saturated and unsaturated extremely accelerated stress test can be performed. In saturated test the temperature is maintained at 1210C at 100%RH, and for unsaturated temperature of 110, 120, 1300C is maintained at 85%RH. Normally for electronic components unsaturated type test is done.
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Aging and Life Test Rack
SY2036
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SY2036 Aging and life test rack is fully designed according to the IEC standard, and can also be designed based on the customer request. SY2036 can test LED, CFL, HID Indoor lamp and Outdoor lamp. Input Power supply: AC220V, 50/60HZ, 12KVA Min (110V is option) • Built-in transformer: 0-250V 5KVA and 0-300V 5KVA (Other power is option) • Maximum power for EUT: 5KVA and 12A (Other power is option) • EUT and Number: 112pcs B22, 112pcs E27. 36pcs T5/T8/T12 Tube. 32pcs LED panel (Other EUT can be designed according to customer request) • ON/OFF test: Can be set on the touch screen with program • Test number: 0~99999（Adjustable）
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Acceleration Simulation Mode (ASM) Roller Set
ASM-P | VP 230046
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Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-P roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. The increased tractive force of its eddy current brake means that the ASM-P is also suitable for power measurements at constant speed and constant tractive force.
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Highly Shielded Phase Stable Assemblies
PhaseMaster® Enhanced
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Does your application require cable assemblies offering some combination of phase stability and low loss, significant shielding effectiveness and increased durability?Consider Phase Master® 190E as your design-in option.Compared to similar phase stable cables, the Phase Master® 190E’s enhanced, multilayer shield construction yields:- A high level of phase stability vs. temperature- Reduced insertion loss & increased amplitude stability - Increased shielding effectiveness (120 dB @ 1 GHz, min)- Increased mechanical durability, especially torsion resistanceGreater connector retention (>40 lbs straight pull with SMA connectors)
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Long Life Seismic Energy Source
1900LLX-T
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Output volume of 10 cubic inches to 250 cubic inches. Light weight enough for shallow draught vesselsPowerful enough for blue water seismic surveys. Available with engineered seals for more robust performance.
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FEC Accelerator Based On Intel® VRAN Dedicated Accelerator ACC100
PCIe-ACC100
Interface Card
ADLINK’s PCIe-ACC100 is a PCIe interface accelerator adapter developed based on Intel's vRAN Dedicated Accelerator ACC100 eASIC chip. It supports 4G and 5G codec acceleration, checksum rate matching, onboard 4G ECC memory, and hybrid automatic repeat request technology (HARQ). The PCIe form factor HHHL (half-height, half-length) can meet the needs of most application scenarios.
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Highly Sensitive Magnetization Switching Evaluation system
FMSS
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The necessity of evaluation for media by thin film and high speed magnetic recording increases as high density of magnetic recording media. This equipment is newly-developed one which applies any time-range and pulse magnetic field to test sample, and detect magnetization after applied with highly sensitive resonating sample magnetometer.
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Accelerated Aging
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The purpose of accelerated aging testing is to speed up the effects of time on a product. This is done to predict the long-term durability and to support shelf-life and expiration dating claims. This is often used in the medical device packaging industry. The relationship between temperature and product life is utilized to determine the test duration of accelerated aging.
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BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Highly Accelerated Stress Screening (HASS) Test
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HASS consists of high and low temperature and 3 axis vibration testing performed either individually or in combination.Highly accelerated stress screening is a technique for identifying process flaws in equipment during production. HASS subjects equipment to overstress conditions but at a level which does not affect design life.For assistance in designing a HASS test program contact the laboratory.
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Acceleration and Gyro Sensors
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Acceleration and gyro sensors specifically for the motorsports industry.
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In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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UV Accelerated Weathering Testers
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Weice Testing Instrument Co.,Ltd.
UV accelerated weathering testers utilize fluorescent lamp to simulate the UV spectrum of sun shine, combined with temperature control, humidity system.
