Test Fixtures
UUT interconnect interchangeable with tester.
See Also: Fixtures, Mechanical Fixtures, Vacuum Fixtures, ATE Fixtures, PCB Test Fixtures, Board Test Fixtures, Bed of Nails, Spring Probes, Test Jigs, Test Probes
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Product
PCIe
M.2 Gen4 Socket3
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SCHILLER AUTOMATION GmbH & Co. KG
The PCIe Gen4 M.2 Socket 3 test adapter or test fixture kit facilitates Device and Host compliance testing for PCIe Gen4 M.2 Socket 3 Source and Sink devices.
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Product
Customized Test Fixtures
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Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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Product
High Temperature Component Test Fixture
16194A
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Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Product
Fixtures For Testing
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Columbia offers a wide range of different fixtures and test equipment that are possible to modify according to your needs of testing. Our range of different types of test fixtures goes from ICT, RF, General Purpose, CMP to CMK.
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Product
LCR Meter
SS10X Series
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LCR Meters are basic passive component testing equipment, can be used in quality management department or production process for quality inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, electric valve, contactor, cable, wire, etc. This series LCR meter, offering different kind of testing fixtures, can improve testing precision and reduce the difference value of error code, being an economical and useful basic testing instrument.
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Product
Bottom Electrode SMD Test Fixture
16198A
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Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
Boundary Scan Program Development Service
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No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Product
RF Functional Test Fixtures
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EMC Technologies’ design team has developed a variety of test adaptors and test stations for testing RF circuit assemblies and microwave sub-assemblies.
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Spring Clip Fixture
16092A
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Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Product
Standalone Test System
1000 Series ATE
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The Circuit Check 1000 Series ATE provides a configurable standard platform that can utilize multiple mass interconnect interfaces while providing ease of maintenance and the ability to accept a wide variety of test fixture solutions. With the 1000 Series ATE, test procedures become automatic, with test steps and go/no-go limits easily programmable.
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Test Fixture Kits
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More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Power Cord Bending Tester
SW-6
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SW-6 Power cord bending tester is fully designed according to the IEC standard, and can also be costumer-sized depends on the samples’ type and the costumer’s requirement. Specifications: • Power supply：AC220V 50/60HZ 12KVA • Control mode: PLC with touch screen and Servo motor. • Test Speed: 10~60times/min (Adjustable) • Test Degree: 0~540° (Adjustable) • Counter: 0~999999 (Can be pre-set) • Weight: 5N,10N,20N. 2Sets. (6Position type will have 6 Sets) • Position: 2/6 • Load Current: 0~20A (Adjustable) • Angle plate: Can check the test situation • Sample fixture: Can be costumer-sized. • Can do power line bending test (The User need prepare sample and power supply ), Can record the number of the sample’s work with load.
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EEE Component Testing and Screening Services
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DPACI performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability commercial, industrial, space, and U.S. military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications. Our engineering experience in electronic parts screening, qualification, and in-house test fixture fabrication allows us to provide value added components in a timely manner.
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In-Circuit Test Fixture Design Services
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An integral part of board test is the test fixture. Innovations in board technology may manifest themselves as challenges in test fixture design. Utilizing a creative & systematic design philosophy, Acculogic consistently delivers state of the art solutions for the most complex test interface problems.
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Dual Servo Electrical Test Fixture
TA-334001
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The TA-334001 is a Dual Servo Electrical Test Fixture made to be an equivalent substitute for the Honeywell test fixture T-334001. The test fixture front panel duplicates all the proper switch numbers and descriptions so the technician can follow by the book testing. The panel overlay text is reverse screened (backside) to insure that text quality will not degrade over time. All the appropriate test jacks are provided on the panel for servo pin and bracket breakouts. This fixture provides for the switching of motor direction, clutch, tach selection, synchro selection, limit switching and polarity relays. Panel meters are provided on the test fixture so that the technician can monitor the servomotor voltage as well as clutch voltage and current.
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Stand-Alone Test Fixture
MA 2012/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Exchangeable Test Fixture
MA 2109/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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Product
High Performance 50 MHz Dynamic Digital I/O PXI Subsystem
GX5960 Series
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The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.
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Product
Test Fixture
16047E
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Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Product
DC Current Bias Supply
DC1000A
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To guarantee the quality and performance of inductive components such as inductors, chokes and transformers they are tested at their real-life operating point. If the inductor is designed to carry a DC current, then its inductance must be measured with that DC current present. Until now, these measurements were made by an LCR meter connected via special interfacing to a DC bias supply available only from the manufacturer of the LCR meter. The unique NEW DC1000A can be used with any precision LCR meter and connects simply into existing test fixturing.
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System Level Test and Burn-in Solutions
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System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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2m BNC Test Cable
16048D
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The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
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Product
CAD / BOM Translation Software
ProntoTEST-FIXTURE
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In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Materials (BOM) files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is then used by Test Engineers to program their ATE (Agilent/Hewlett Packard "board & board x/y", Teradyne "ipl", Genrad ".ckt"), MDA, and flying probe test equipment and design the "Bed of Nails" test fixtures.
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Manual Test Fixture (MA)
MA 2013/D/H/VPC-G12x-18
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 25,00 kg
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Test Probes / Test Fixtures
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INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
Testing Services
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*Programmable Multipoint Tester*Over 8,000 programmable test points (DWV, Capacitance, Insulation Res., 2/4-Wire Resistance, etc.)*1500VDC / 1000 VAC Dielectric Withstanding Voltage (DWV)/ Hi-Pot (Programmable Dwell times)*Full Electronics laboratory complete with state of the art testing equipment*Custom Unit Testing (Designing of Specialized Test fixtures)*EMI Testing*Temperature and Humidity Testing*Shock Testing*Vibration Testing*Sand and Dust / Altitude Testing*Military Qualification Tests Performed
