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Product
Bench-top Test Jigs
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Robust, easily customised, standalone kits for testing a variety of PCB's. Basic hinged-top or cam operated pusher plate, advanced cam-operated gate with fully adjustable pusher-fingers.
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Product
Test Fixtures & Jigs
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A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Product
Compression Test Jig For Foam Rubber Specimens
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JIS-based compression testing of foam rubber used in seats can be performed. This machine comprises exclusive accessories added onto an Autograph precision universal testing machine.
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Product
Precision Metal Clad Shunt Resistor
IRHF
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Precision Metal Clad Resistors designed in four- terminal technique, are distinguished by high load capacity as well as excellent accuracy. Isolated voltage and current connections making them suitable for very precise current measurements. Easy current measurement is performed by attaching to current bus directly and connecting to voltage (ampere) metal through flexible wires. The ULH models are UL approved versions. Units have a low inductance, heavy copper terminals. The main application is battery manufacturing test jig.
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Product
Material Test Machines
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood Universal Test Machines, UTM, are widely use for different material testing, like semi-product & finished product made of rubber, plastic, metal, nylon, non-woven fabrics, textile, tape, polyfoam, waterproof materials, wire, cable, etc. With different test jigs or fixtures, the UTM can run the tensile, compression, shearing foce, adhesion, peeling force, tear strength, fatigue, etc test according to GB, CNS, ASTM, ISO, DIN, JIS, EN test standards.
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Product
Bench-top Test Jig
CMF Series
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Robust test jig, using a cam-operated horizontal probe plate - self customisation.
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Product
Printed Circuit Board Bending Test Jig
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Evaluation of Bending Strength of Electronic Components and Substrates
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Product
Ceramics Bending Test Jig
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These test jigs enable 3- and 4-point bending tests in accordance with various JIS, ISO and ASTM standards.
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Product
SRJ (for IBP sensors)
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The MEDTEQ SRJ is a test jig to measuring the step response of IBP sensors, which can assist in testing compliance with IEC 60601-2-34 frequency response. It is also suitable for manufacturers or test labs wanting to access the raw pressure waveforms via an oscilloscope.
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Product
Mechanical Bench-top Test Jigs
CGF Series
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Advanced test jig, using a cam-operated, fully adjustable gate - self customisation.
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Product
ESI Test Jig
MS 1543
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This Test System designed to test the analog, discrete, Ethernet, RS232, RS422, Synchro /Resolver and SPI Signals. It is standalone test equipment and has GUI ATP Software interface with laptop/PC through RS232/Ethernet Interface.
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Product
Energy Saving System
ECO-Vibe neo
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ECO-Vibe neo has been designed for an eco-friendly vibration test system. The test conditions with a vibration test system depends on a unit under test. Generally, the exciting force required for performing a vibration test can be calculated by the product of mass (e.g. test article, jig, table, etc.) and test acceleration. But, when the required exciting force is smaller than the maximum rated exciting force of the vibration test system, the field power supply that the constant current has to be continuously provided to produce the DC magnetic field constitutes a large part of power consumption compared with the drive power for the moving element. ECO-Vibe neo can reduce the power consumption by choosing the exciting force in this case. In addition, you can enjoy a reduction merit of the running cost from the first year when the system is introduced because initial cost is zero.
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Product
Engine Simulator
MS 1118
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Test Set-A calibration unit is a test jig is used to simulate parameters of Adour 804E and 811 engines of Jaguar aircrafts. It simulates current, voltage, speed, and turbine gas temperature. It performs NL Check, NH Check, TGT1 (Non T2 Compensated), TGT2 (T2 Compensated), Amp (Non T2 Compensated), Amp (T2 Compensated), Solenoid Volt, TGT Inject, NL Inject, and NL/TGT Redatum.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
Automatic Dielectric Constant Tan Delta And Resistivity
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No Balancing and Calculation required to calculate Volume / Surface Resistivityand Dielectric Constant.Complies IEC 60250, IS 4487, Test jig Conform to ASTMD 257Built in Thermal PrinterSerial port RS232 for data downloading.Can be used to check liquid sample with Three Terminal oil cell.Storage 100 Test reports
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Product
Customized Material Testing Machines
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Globally growing innovations result besides fulfillment of new testing standards in an ever increasing demand for customer-specific solutions regarding the testing technologies, jigs, measuring systems, software and the automation level of the testing machines.The core competencies of TIRA are customer-specific solutions.TIRA is able to realize individual customized solutions according to customer´s request and the simplest derivations like longer, wider, narrower, shorter material testing machines.
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Product
MCB Thermal Verification Test Bench
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The test system is a special version of the thermal test test system in the sense that the test jig is primarily designed to hold and connect multi pole MCBs for thermal verification so that each pole can be verified to trip within the IEC time band after the MCB has been riveted. This test ensures the trip verification of MCB so as to trip all the 4 poles at once when overload is detected in one single pole. In short, this is a verification-only bench.
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Imperial Test Executive
ITE
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The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
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The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Wireless Device Test
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New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Seno-Con Test System
PANTHER 2K QST
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Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
