Breaker Test Systems
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The Compact AI GigE Vision Systems for the Edge with Intel Movidius Myriad VPU
EOS-i6000-M Series
The ADLINK AI Plug-and-Play (PnP) Solution is a set of ADLINK AI edge hardware and data connectivity platforms that help our partners build and deploy AI solutions faster and simpler. With ADLINK Data River™ enabled at AI edge platforms, devices, AI inferences, and data integrations, the AI PnP Solution offers a crossplatform, flexible, scalable solution that delivers business value.
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Active Alignment Assembly & Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Functional Test System
TS-5040
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Circuit Breaker Testing Equipment
HISAC Ultima
HISAC Ultima – new generation Circuit Breaker Dynamic Test Set from SCOPE …. The ultimate solution for testing Circuit Breakers of all types. HISAC Ultima is the most complete analyser for checking the dynamic performance of CBs in live EHV switchyards upto 765 kV. HISAC Ultima can carry out Dynamic Contact Resistance Measurement on SIX breaks of THREE poles in one operation thereby significantly reducing stress on CB & testing downtime.
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Battery Cell Formation System
17000 series
Chroma 17000 series is specifically designed for the formation of Lithium Ion and Lithium Polymer secondary batteries. The 17000 series is a complete turn-key system, including carrier trays, robust battery probe contacts, high quality charge/discharge modules and intuitive software all under computer control. Patented Battery Voltage Tracking (BVT) DC-DC conversion power modules minimize power consumption in battery charging, and Energy Recycle Modules (ERM) recycle the discharged energy directly back to the DC power system for increased power efficiency. These power saving designs provide a planet friendly solution along with cost savings by reducing energy consumption. The intuitive software provides a flexible selection in the charge/ discharge channel, current rating, and modules under test. These features allow the Series 17000 to be used for final cell development, pilot line production, high volume production and ongoing reliability monitoring/quality control.
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Test Bench For Circuit Breaker
SCR ELEKTRONIKS have developed Test Bench for Circuit Breaker to test 2, 5 & 10 at a time. Panel is provided with constant DC current source.
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Flying Prober Test System
QTOUCH1404C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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True Concurrent Test
TestStation Duo
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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6TL29 Semi-Automated Test Platform
AQ377
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Headlamp Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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System Test
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Test System
USB Explorer 280
The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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IFEC Embedded System Hardware
State-of-the-art system components serve as building blocks for you to create the ideal IFEC system.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Circuit Breakers
As the premier supplier of power system components, Interpower has what you need to complete your projects, including circuit breakers. Interpower has no minimum order requirements, plus same day shipping is available on in-stock Interpower products.
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Circuit Breaker Testing Equipment
HISAC Swift
HISAC Swift - Circuit Breaker Operational Analyser is meant for checking the performance of the MV Circuit Breakers. The Analyser contains various intelligent measuring modules designed for measuring parameters such as contact timings of Main/PIR & Auxiliary contacts, Close/Trip Coil Current characteristics and Static Contact Resistance of R, Y & B poles simultaneously. The results can be directly viewed on the TFT touch screen display in graphical as well as numerical form. It is possible to print the graph on a built-in thermal printer or download record to PC for further analysis on CPLOT software. This all in one instrument is best suited for gang operated CBs.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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HTOL Test Systems
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Test System for Circuit Breakers
Spitzenberger & Spies GmbH & Co. KG
Thermal testing with long-time currents up to 550 A. Magnetic testing with short-time currents up to 2000 A. Control software. Customer specifically adapted. 4 candidate records with pneumatic adapting.
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Listed Circuit Breakers
Mitsubishi Electric Automation, Inc
To meet the demands of the U.S. and Canadian markets, the UL listed MCCB and ELCB products are compliant to UL489 and CSA C22.2 No.5-02 This range of breakers series offers a standard and high performance protection up to 630 amps and are easily installed in the field accesories.
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Configurable Functional Test System
ATS-5000
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Circuit Breaker Identifiers
188 FFF
Standard Electric Works Co., Ltd
● The 188FFF doesn't have the function of the sensitivity adjustment. If the customers need the sensitivity adjustment function, plase refer to other models.● The 188FFF is a Fuse and Fault Finder which comprises of two parts : The Receiver and the Transmitter.● The Transmitter, draws a current from the mains supply circuit to which it is connected to. The Signal● Current from the Tx is at about 10kHz. The Transmitter is powered by the mains and requires no batteries.● The 10kHz signal current generated by the Transmitter is then searched(sniffed) by the Receiver to detect the Fuse, Circuit Breaker or the faulty circuit.● The Receiver is a tuned circuit which has it's center frequency tuned to about 10kHz. The sensor is located in the tip of the Receiver.● The amplitude of the received signal is shown on a bar-graph type Leds.● The more Leds ON, the stronger the signal.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
