Breaker Test Systems
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Product
Blackbody System
IR-140/301
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Infrared Systems Development Corp.
Our extended area sources are flat plate emitters with special high emissivity coating providing 0.96 average emissivity. Extended area sources provide large target with high radiant intensity for application where a cavity blackbody is too small.
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Product
Collaboration Systems
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Solutions for small meeting, huddle, or collaboration spaces that foster group sharing using technology.
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Product
Telecom Test Systems
4301 Series
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The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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Product
Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Product
Brake Hydraulic Pressure and Electric Parking Brake Systems Test Bench
Model BHP/EPB™
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The new Model BHP/EPB™ Brake Hydraulic Pressure (BHP) and Electric Parking Brake (EPB) Systems test bench from MB Dynamics accurately measures and controls the hydraulic pressure and EPB power levels applied to brake calipers during automotive buzz, squeak and rattle (BSR) testing, as well as brake durability, stability, functional or performance testing. Varied brake pressures are applied according to timing diagrams, as well as automated or manually program-controlled repeat cycles, as required to assess brake caliper/rotor assembly noise, useful service life, and other critical performance metrics.
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Training Systems
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TESCO’s Training Systems are built to your specifications to simulate various field conditions and aid in the training of field personnel in a full range of conditions and faults.
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Vibration Test Systems
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HIACC Engineering & Services Pvt. Ltd.
Designed to simulate real-world vibration, shock, and environmental stresses for product reliability testing.
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Product
Photosynthesis System
LCpro-SD
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The LCpro-SD offers laboratory grade experimental performance in a truly portable device. Featuring ADC's highly accurate miniaturized infrared gas analyzer, the LCpro-SD is, at 4.5kg or 10lbs., less than half the weight and half the size of conventional systems offering full environmental control. Ideal for A/Ci curves, and A/Q curves, measuring step sequences are full programmable.
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Product
Custom Systems
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No two products or processing challenges are exactly alike. That’s why a specially-configured MAC® Custom System can help you address unique testing requirements…as well as the demands of your own internal standards
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Product
Power Systems
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Astronics serves global customers as the aircraft industry’s electrical power experts, offering a breadth of power and motion solutions for commercial transport, business, VIP, rotorcraft, military aircraft, and other airborne platforms. Whatever your program, you’ll find a proven, certified solution with Astronics.
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Product
Arc System
ACQUITY
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The ACQUITY Arc System is a quaternary-based, modern LC system for scientists working with established methods who are looking for the versatility and robustness required to bridge the gap between HPLC and UHPLC while continuing to support validated assays.
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Product
Embedded System Test Automation Software
ECU-TEST
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ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
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Product
System Solutions
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The modular and flexibly expandable system solutions from aixACCT Systems ensure that you always measure the characteristics of your samples independently of the operator and according to the specifications of the entire system.
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Product
In Vivo Systems
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To achieve low minimum detectable activities with count times as fast as one minute.
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Product
Analysis System
Pegasus (EDS-EBSD)
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The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Product
Leak Test System
NorCom 2020
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The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
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High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Product
ADAS System
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Is the precise physical alignment, testing, and electronic aiming of sensors that collect data to inform your vehicle’s advanced driver assistance systems (ADAS).
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Product
Transportation Simulation Test System
KRD50 series
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KRD50 series transportation simulation test system is to simulate the actual road conditions such as shocks and vibrations during the transportation of various items of a specific load, and to evaluate the effect of the actual working conditions on the loading, unloading, transportation, packaging, sealing or internal structure of the goods. In order to assess or confirm the products and packaging.
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Product
Manufacturing Test Only System
MTO
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The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Product
Test Adapters / Aeroflex Test System
52xx / 5300
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We develop and manufacture test adapters for your existing interface including documentation and test program
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Product
Immersion Systems
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Immersion systems are the workhorses of the industry. Our latest NXT machines have shown the ability to run in excess of 6,000 wafers per day, with an average five percent productivity increase over 12 months, supporting our customers' value requirements. We continue to innovate our immersion systems to meet the requirements of future nodes, benefiting from commonalities in R&D with our EUV program, while ensuring the platform’s extendibility through System Node Enhancement Package upgrades. Thanks to these packages, any NXT system can be upgraded to the latest technology.
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Product
Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Standalone with Drop-In Test Systems
800 Series ATE
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The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
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Pneumatic Vertical Shock Test System
KRD11 series
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KRD11 series pneumatic vertical shock test system is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and bump test, can perform conventional half-sine wave, post-peak sawtooth wave, trapezoid wave and other waveform shock tests.
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Product
Development System
FE-51CC01
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* Emulates Atmel T89C51CC01/2 and T89C51AC2, T89C5115 * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Dynamic Component Test Systems
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RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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Product
Bipolar/FET/Diode Dual Head Production Test System
36XX
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Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Product
OPTICAL PHASE NOISE TEST AND MEASUREMENT SYSTEM
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OEwaves’ HI-Q® Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
