Breaker Test Systems
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131C
Test Port Cable
The Keysight 85131C is an 81 cm (32 in) long1 semi-rigid cable with a 3.5 mm female2-to-PSC-3.5 mm female connector. Cable frequency range is DC to 26.5 GHz with a return loss of 17 dB or better. Insertion loss is 0.43 * sqrt(f) + 0.3, where f is frequency in gigahertz, for the test port connector and 2.5 dB at maximum frequency for the device connector. Phase stability of the semi-rigid / flexible cables is specified with a 90-degree bend using a 4 to 3-inch radius. Stability1 of the 85131C is less than 0.06 dB, and phase is 0.16 * f + 0.5, where f is frequency in gigahertz.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Automated Testing System
PV-LIT
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Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Product
Test System
MFTS500
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Computer Gesteuerte Systeme GmbH
The MFTS500-System is specially designed for the testing of electronic control units (ECUs). It can be configured to be used as a development or as a production tester. Every effort has been made during development and design to ensure that the system is flexible and cost effective.
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Product
BMS Manufacturing Test System
Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
Alpha Particle Counting System
UltraLo-1800
Particle Counting System
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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Product
LabVIEW Development Systems
System
Base--The instant productivity of graphical development for DAQ and instrument controlFull--A rich set of routines for mathematics, signal processing, and signal generationProfessional--The solution for professional developers who need code deployment or validationLabVIEW suites--LabVIEW Professional plus industry-specific add-on software
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Product
Vibration Test System
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Vibration Test System is a simulation of the various environments encountered in the manufacturing, assembly, transportation and use phases of execution. It is primarily used to identify the ability of a product to withstand environmental vibrations.
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Product
Hybrid Single Site Test Handler
3110
Test Handler
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Product
Shock Test System
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Labtone Test Equipment Co., LTD
Products are inevitably affected by impact, bump, free fall, tumbling etc. during production, transportation, loading and unloading as well as during the use of the products. All of these are transient excitation on the object, causing the object to produce mechanical characteristics of high speed, acceleration, strain rate instantly. These kind of characteristics are completely different from that in static load, and may cause problems to the object in terms of structural strength and stability and sometimes the object may fail. Therefore, it's necessary to study the effect of impact and reproduce the shock environment, to assess the structural strenghth and performance of the object under shock environment.
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Product
Battery Testing System
C8000
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The Cadex C8000 stands in a class by itself in flexibility and affordable price. Test SMBus batteries, monitor cell balance and capture load signatures to observe batteries with a unique load protocol. Add a thermal chamber, an external load bank, a safety circuit and alarm to form a command center and you begin realizing the unique qualities of this fine battery testing system.
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Product
Shock Test Systems
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Accurately measure the fragility of products and evaluate how they respond to specific shock inputs.
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Product
Electroluminescence Test Systems
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The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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Product
System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Product
Circuit Breaker Analyzers & Timers
CAT Advanced Series
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DV Power circuit breaker analyzer and timer utilizes the latest technological enhancements for safe and fast testing of circuit breakers. The sophisticated design ensures efficient and reliable operations in high-voltage substations and industrial environments.The CAT Advanced series are stand-alone or PC-controlled digital instruments for a circuit breaker testing. The timing channels record closing and an opening of the arcing, resistor, and auxiliary contacts. Also, the main contact channels can measure the resistance value of the pre-insertion resistors (if present in the circuit breaker).With CAT Advanced series instruments, it is possible to record graphs of open and close coil currents. Furthermore, it records displacements of the HV and MV circuit breaker moving parts. Test results can be saved via USB, PC or be printed via 112 mm (4.4 inches) thermal printer (optional accessory) in tabular and graphical form.A circuit breaker test consists of different operational modes and CAT Advanced series supports:Open (O)Close (C)Reclose (O-0,3s-C)Trip free (CO)O-0,3s-COOpen-Close (O-C)Close-Open (C-O)Open-Close-Open (O-C-O)First trip (O)Multiple operations, such as Open-Close and Open-Close-Open, can be initiated by using a predefined delay time or by sensing a breaker’s contact position.The auxiliary inputs are used to monitor dry and wet auxiliary contacts. The six coil control analog channels measure and record coil currents simultaneously (OPEN and CLOSE), up to 35 A AC/DC.The additional six voltage analog channels have four selectable voltage ranges available (±1 V, ±5 V, ±60 V and ±300 V AC/DC).A built-in micro-ohmmeter generates up to 500A true DC ripple-free current with an automatically regulated test ramp that provides performing static and dynamic contact resistance measurement.Three transducer channels provide a measuring displacement of the circuit breaker moving parts, contact wipe, over-travel, rebound, damping time and average velocity. Also, a user can connect either an analog or a digital transducer to these universal channels.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others. Combined with the most comprehensive suite of hybrid characterization techniques, the TI 990 TriboIndenter, TI 980 TriboIndenter, TI Premier Series, and TS 77 Select nanoindenters will keep your materials development at the forefront of technology.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
Telecom Test Systems
4301 Series
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The 4301 is designed to work with a standard arbitrary wave form generator or signal source that can be triggered. The system can be ordered with an optional Fluke 281 arbitrary waveform generator, which comes pre-programmed and integrated into the 4301 system. When equipped with the Fluke 281 option, the 4301 provides a complete solution for GR-1089 Section 10/ATIS-0600315.2007 testing.
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Product
Circuit Breaker Testing Equipment (SCOT Series)
SCOT MXP+
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SCOT MXP+ measures, displays and prints CLOSE, OPEN and CLOSE-OPEN time of 2 Main + 2 PIR contacts per pole, 3 poles simultaneously, ensuring measurement of 6 Main + 6 PIR contacts simultaneously. Ideally suitable for CBs having PIR contacts & multiple breaks per pole
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Product
First Trip Testing of Circuit Breakers
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Significance of Circuit Breaker "First Trip Time"A circuit breaker may not be called upon to operate and clear a fault for years, but when a fault occurs, it is expected to operate within it's published time-current characteristics. Unfortunately, frequently this does not happen... environmental contaminants, hardened grease, vibration and other factors can adversely affect the operating time of the circuit breaker.
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Product
Cleanliness Test Systems
CM Series
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The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.
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Product
RFID Test System
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RFID test system of Peritec is making FPGA board (IF-RIO) the processing of the IF band. This reading of the code, called (Electronic Product Code) EPC is required for RFID tag ISO18000-6 TYPEC of (EPC C1 G2). However, it did not provide treatment too late in the traditional instruments.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
Test System
Tessy
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TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
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Product
Automated Test System
VIPER/T
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The VIPER/T is the United States Marine Corps’ current automated test system. Based on the previous generation Third Echelon Test System, the VIPER/T is designed to test and diagnose electronic, electro-mechanical and electro-optical (EO) equipment, assemblies and circuit cards from weapons and radar systems.
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Product
Systems Integration & Test
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Watring Technologies, Inc. is an experienced, diversified high technology company proficient in total system integration services including test & evaluation, custom tooling design, and automated hardware validation and verification. We give customers access to a sole- source, multi-disciplinary staff of specialists offering turn-key solutions.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
