In-circuit Test Systems
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers
-
Product
Enhanced Vision Systems for Aviation
-
Astronics offers the world’s most widely deployed enhanced vision systems for airframe OEMs and general aviation pilots. Used in search and rescue, firefighting, police, construction, and other critical missions, our EVS units are improving visibility and safety every day on fixed-wing and rotorcraft worldwide.
-
Product
Dual Sensor Enhanced Vision Systems
EVS
-
Enhance your safety and situational awareness while flying with Max-Viz dual sensor enhanced vision systems (EVS) from Astronics. These multi-spectral imagers include a long wave infrared sensor, a visible light + near infrared sensor, and patented blending and dynamic range management image processing to enable pilots to see clearly during day and night.
-
Product
JTAG Functional Test
JFT
-
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
-
Product
VIP IFEC & CMS Systems
-
Astronics is the smart choice for inflight connectivity, entertainment, and cabin management solutions for VIP, VVIP, and business aircraft. From the highest-performing global SATCOM connectivity for optimum productivity and entertainment, to our Avenir IFE/CMS line that incorporates the latest technologies to deliver native 4K video distribution through the highest bandwidth Ethernet network system in the industry, Astronics is ready with a cutting-edge solution that delivers the ultimate VIP experience.
-
Product
Environmental Control System Test Platform
-
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
-
Product
Emergency Systems
-
Safety and survival products which aid in on-board emergencies, aircraft evacuation, and search and rescue operations.
-
Product
NI Real-Time Test Cell Reference System
778820-35
-
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
-
Product
VIP Cabin Management Systems
-
Where elegance meets powerful functions, add a new level of electronic sophistication to your cabin.
-
Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
-
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
-
Product
Data Acquisition and Control System
DAQ 7000
-
data acquisition and control system that provides connectivity, signal conditioning and modular I/O for variety of sensors or signals, and it is an ideal DAQ for field deployment.
-
Product
In-Circuit Test (ICT)
-
Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
-
Product
Modular Breakout System 78-Pin D-type Plugin Module for 40-525A
95-525A-001
-
The 95-525A-001 Plugin Breakout Module is designed to be fitted to a PXI 40-525A Signal Insertion & Monitor Matrix Module as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
-
Product
Mezzanine System
5081
-
The 5081 provides four channels of 12 bit digital to analog voltage output, with multiple single ended output ranges. Each channel is software selectable for 0 to +5V, 0 to +10V, +/-2.5V, +/-5V, +/-10V or -2.5 to 7.5V ranges. The outputs reset to 0.0 volts on power up.
-
Product
In-Circuit Programmer/Loader
SKU-018-01
-
The In-Circuit Programmer/Loader (“EasyLoader” or “eLoader”) is a standalone device that was designed to provide a flexible and cost-effective solution for electronic device manufacturers, as well as for hardware design companies and their customers. It allows you to upgrade code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash, etc.) or Microcontrollers at any time of development, testing or production.
-
Product
In-circuit Test
Medalist i1000 Systems
-
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
-
Product
LabVIEW Professional Development System
-
ntegrate hardware from a variety of measurement instruments and devicesIntuitive graphical programming syntax to simplify automationBuild custom user interfaces for engineering applicationsBuilt-in algorithms for signal processing, analysis, math, and PID controlSoftware engineering tools to debug, validate, and deploy codeOne-year SSP membership for technical support, online training, and software upgrades
-
Product
Wireless Device Functional Test Reference Solution
-
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
-
Product
Drop-In In-Circuit Test Fixtures
The Chameleon
-
The Circuit Check kit called the Chameleon allows easy re-use of a majority of an ICT fixture’s major components. The Chameleon includes a full size probe plate and interface alignment plate so all valuable tester resources are available. The probe plate assembly is held in place with twelve (12) screws and the vacuum box’s interchangeable push plate is easily replaced by removing four (4) shoulder screws.
-
Product
Test Port Cable, 1 Mm
11500K
-
Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
-
Product
In-Circuit Testers
-
Whether you’re choosing from our stand-alone manually loaded ICT tester all the way to our fully automatic In-line test system, Acculogic has the solution for you!Acculogic’s Scorpion family of automated test equipment and in-circuit fixture-based testers were created with one underlining theme in mind: “Cost-effective Testing”.
-
Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
-
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
-
-
Product
In-Circuit Tester
Sigma MTS300
-
The system is designed for high throughput; with up to 1,000 analog measurements per second it is one of the fastest test systems available on the market. Sigma test systems provide analog and digital In-Circuit Test capabilities, Vectorless Testing, Functional Test, Boundary Scan and On-Board Programming.
-
Product
Hybrid Single Site Test Handler
3110
-
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
-
Product
Test Port Adapter Set, 2.4 Mm To 3.5 Mm
85130F
-
The Keysight 85130F test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector designed for connecting to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. The set contains a 2.4 mm to PSC-3.5 mm male adapter and a 2.4 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 26 dB or better.
-
Product
FPD Tester Model
27014
-
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
-
Product
Test System
Tessy
-
TESSY automates the whole unit test cycle including regression testing for your embedded software in C/C++ on different target systems. As an easy-to-install and easy to operate testing tool TESSY guides you through the unit test workflow from the project setup through the test design and execution to the result analysis and reporting. TESSY takes additionally care of the complete test organization as well as the test management, including requirements, coverage measurement, and traceability.
-
Product
Modular In-Circuit & Functional Test System
-
Our testing systems are based on established industry standards and can be individually configured to meet your requirements. In addition, our systems can be easily and efficiently adapted to changing and new challenges.
-
Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
-
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
-
Product
In-Circuit Testing and Test Engineering
Teradyne Z1820
-
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
