Test System Mainframe

ITC59000 - Integrated Technology Corp. (ITC)

The ITC59000 Test Platform is a desktop Dynamic
Parametric Test System mainframe. The ITC59000
Test Platform accepts up to four Test Measurement
Units (TMUs) that perform transient measurements on
semiconductor devices such as power MOSFETs,
IGBTs, and diodes.

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Test Equipment

Integrated Technology Corp.

Test Equipment

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Test System

ITC57300 - Integrated Technology Corp.

The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.

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Unclamped Inductive Load Tester

ITC55300C - Integrated Technology Corp.

Model ITC55300C performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.

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Unclamped Inductive Load Tester

ITC55100STD - Integrated Technology Corp.

Model ITC55100STD performs ruggedness testing of power MOSFETs and IGBTs. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.

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Unclamped Inductive Load Tester

ITC75100 - Integrated Technology Corp.

The ITC75100 is an enhanced unclamped inductive load (UIL) test system that builds on the success of ITC’s industry leading ITC55 series of testers by adding additional test and measurement capability.

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Unclamped Inductive Load Tester

ITC55100C - Integrated Technology Corp.

The system has been designed around a very powerful micro-controller that gives it a timing resolution of 40ns, twenty times faster than the previous model. Its response time to the peak and zero current is improved ten times. Combined this gives greater accuracy for the charging and avalanche times and for the reported peak drain current.

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Unclamped Inductive Load Tester

ITC75300 - Integrated Technology Corp.

The ITC75300 is a 400 amp version of the ITC75100 which performs ruggedness testing of power MOSFET’s, IGBT’s and diodes that conforms to MIL-STD-750 method 3470 by stressing them to controlled energy levels, accomplished by the devices driving an unclamped inductive load. Improved Test Specifications allow complete control of test parameters.

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Unclamped Inductive Load Tester

ITC55600C - Integrated Technology Corp.

Model ITC55350 is the high current (600A) version of theITC55100 tester. The ITC55350 performs the same testsas the ITC55100 and includes many features that improvetesting accuracy, test results collection, test resultsviewing, and multiple tester networking

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Wafer Level Multi-Die Test System

ITC55WLMD - Integrated Technology Corp.

The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller

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test measurement unit

ITC59100 Rg/Qg - Integrated Technology Corp.

The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.

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Power Cycling Semiconductor Life Test System

ITC52300 - Integrated Technology Corp.

The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)

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