In-circuit Test Systems
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers
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Cable Test And Fault Location Systems
Power outages can cause serious financial and social damage, as they disrupt the normal operation of security and life support systems, destabilise the operation of industrial facilities, transport network, and utilities. Reliable power distribution is ensured by an effective prevention and prompt elimination of cable faults and electrical equipment failures. KharkovEnergoPribor Ltd. offers a range of integrated solutions designed for testing power cables and electrical substation equipment, as well as locating various types of faults in underground utilities.
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SoC Test System
T2000
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Eddy Current Testing /ET System
Xiamen IDEA Electronic Technology Co., Ltd.
Eddy current testing system uses the most advanced digital electronic technology, photovoltaic technology and microprocessor technology. With beautiful design automatic transmission, complete electromechanical integration system, which is the only company that have a complete system of automatic machine.
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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Mezzanine System
3564
The 3564 is a four channel comparator board with a common mode range of -150V to 150V on the two differential inputs and a DAC per channel to set trigger levels. The high common mode range and DC coupling provides a robust solution to level detection and triggering.
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Cell, Battery, And Module Test Systems
Maximize your testing capabilities with Maccor's hardware and software. Our comprehensive turn-key systems come bundled with all the essentials to jumpstart your testing process. Select from multiple options and configurations to match your requirements.
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Primary Injection Test Systems
Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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Test Gas Generation Systems
TU Series
The test gas generation systems in the TU Series include a test gas generation system for evaluating the performance of various kinds of gas sensors, as well as systems for generating simulated gases for evaluating catalysts. These systems are personally tailored to customers’ intended uses.Among the systems we offer some utilise multiple mass flow controllers to mobilize functions (e.g. to generate gases of any concentration, to add moisture, to control supplied gas pressure and to heat gases) thereby allowing for comprehensive control via a PC or PLC.A common use of this product within the biotechnology field is as an atmosphere gas supply system inside fermenters.
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Rail Traction Inverter Test System
The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
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Stationary Circuit Breaker Test System
ACTAS C160
Stationary test system for carrying out fully automatic final factory tests, type and function tests on all kinds of switchgear devices, such as circuit breakers, disconnectors or earthing switches, regardless of the type of drive unit. All the electrical and mechanical parameters needed for the assessment of switching performance are measured in real time and evaluated without either the main contact chambers or the drive unit having to be opened. The system has analog and incremental input channels for the acquisition of analog quantities.
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Radiated Immunity Test System
Beijing KeHuan Century EMC Technology Co,.LTD
Radiation Immunity Test System.
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All-In-One Battery Testing System
Integrating charge-discharge and temperature testing into one.
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Automatic Transformer Test System
TH2829LX
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 20 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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4U 8-Slot CompactPCI® System with Redundant Power Supplies
cPCIS-6418U
The cPCIS-6418U Series Subsystem is designed for maximum density and has 8 horizontal slots for 6U cPCI boards with 80mm RTMs. The chassis is 4U in height and standard 19" rack mount width.
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Telephone Headset and Handset Test System
THT
TE2000 Headset Tester for audio testing headsets and handsets using computer generated test sounds.
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High Temperature Test System
129620A
Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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microLED Testing System
OmniPix-ML1000
The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Systems Integration & Test
Watring Technologies, Inc. is an experienced, diversified high technology company proficient in total system integration services including test & evaluation, custom tooling design, and automated hardware validation and verification. We give customers access to a sole- source, multi-disciplinary staff of specialists offering turn-key solutions.
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Stator Testing System for EV Motor
EVT531
Shanghai Dean Electrical Co., Ltd
To meet the standard test projects requirement of the international companiesTo control and analysis the programs will reduce the human careless and misjudgmentEasy to edit environment and easy to learnIt can test multiple sets of DUTs simultaneouslyWhen there are several DUTs are tested, it could identify the undesirable sets individuallyThe Impulse/Surge with waveform comparison is a non-destructive analysisPolarity testMaximum saved files will be up to 100 setsIt provides the password functionSpeeding test could save time and improve efficiencyChinese and English pages can be arbitrarily switched
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200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
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Air Data Test Set System
B511
The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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High Voltage Cable/Harness Test System
CKT1175-50
The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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AC Resonant Test System for CVT
XZB-H / 110
Wuhan Huatian Electric Power Automation Co., Ltd.
Adjustable resonance device for field calibration of capacitive voltage transformers up to 500kV.
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Test Analysis for Land Seismic Systems
Testif-i Land
Testif-i Land is an independent, powerful and cost effective software suite that allows you independently process instruments, source and receiver tests to confirm that the equipment is performing correctly and within specification. The software includes modules to perform comprehensive analysis of vibrator wireline similarity test data. Analysis includes a harmonic intensity plot which can highlight problems such as sub-harmonics which may not be seen on numerical results. Geophone pulse tests can be analysed using the receiver response module and test data from third party geophone testers can be graphed and statistics produced for ease of interpretation.
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Portable Test Systems
We refer to test meters with an integrated source as test systems. Test systems are particularly useful when you need custom current and voltage values when testing meter installations, but only want to use a single device.
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Digital In-Circuit tester
MTS180/300
Analog in-circuit inspection and function inspection are realized on this inspection equipment. IC pin float function is standard equipment. The MTS180 is a press type jig, and the MTS300 is a vacuum type jig. In the board mounting process at the production site, electrical inspection is performed on the mounted board after component mounting, and non-defective or defective products are automatically judged. The main inspection contents are short / open inspection, analog inspection of resistors, capacitors, coils, diodes, etc., lead floating voltage measurement of QFP and BGA, Digital IC inspection, frequency measurement.
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Test Systems Integration
Highly flexible test solutions that are cost effective offering basic tests that easily adapts to high product volumes and complicated tests. Mobile computer based test stations provide a wide variety of test solutions at efficient costs.
