Incircuit
See Also: In-circuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers, In-circuit Test Systems
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Product
Digital Incircuit Test
PFL780/760
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The PFL780 and 760 use IC clips as a test interface. This makes them ideal for the service and maintenance of legacy systems. If you need to work on high density surface mount PCBs you should consider the GRS500 as a more suitable alternative.
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Product
Incircuit and Functional Test Systems
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REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Product
In-Circuit Test Fixture Design Services
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An integral part of board test is the test fixture. Innovations in board technology may manifest themselves as challenges in test fixture design. Utilizing a creative & systematic design philosophy, Acculogic consistently delivers state of the art solutions for the most complex test interface problems.
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Product
In-Circuit Testing and Test Engineering
GenRad 2287
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3560 Hybrid Test NodesWindows InterfaceTotal GenRad 227X Migration Capability20 Mhz Clock, Sync, and Trigger, 5 Mhz data ratesVector Test for VLSI, PLCC’s & ASICSTest Express Vectorless TestingMultiple Chain Boundary ScanAnalog Functional Test Module
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Product
In-Circuit Testers
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SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Product
Hardware Debug Interface & Stand Alone Programmer
Cyclone PRO
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P&E Microcomputer Systems' Cyclone PRO is an extremely flexible tool designed for in-circuit flash programming, debugging, and testing of Freescale HC08, HCS08, HC12, HC(S)12(X), and RS08 microcontrollers. Now featuring support for Freescale's ColdFire V1.
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Product
Active Probe
Sonic
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PMK Mess- und Kommunikationstechnik GmbH
The Sonic® 4000 active probe offers best-in-class performance and is easy to use to make in-circuit measurements. The DC to >4GHz bandwidth, high input impedance, low noise and ±8V dynamic range make the Sonic 4000 the ideal probe for use with any oscilloscope or other 50Ω measurement system. The Sonic® 4000's ±12V input offset capability extends the probe's input voltage range.
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Product
Test Handler
ETH
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The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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Product
Digital In-Circuit tester
MTS180/300
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Analog in-circuit inspection and function inspection are realized on this inspection equipment. IC pin float function is standard equipment. The MTS180 is a press type jig, and the MTS300 is a vacuum type jig. In the board mounting process at the production site, electrical inspection is performed on the mounted board after component mounting, and non-defective or defective products are automatically judged. The main inspection contents are short / open inspection, analog inspection of resistors, capacitors, coils, diodes, etc., lead floating voltage measurement of QFP and BGA, Digital IC inspection, frequency measurement.
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Product
Analog In-Circuit Tester
406C
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The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed. Internally dubbed as "Armadillo" the new architecture provides the user almost unlimited flexibility by combining the best of the VME buss and a dedicated ICT buss.
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Product
In-Circuit Debugger for RS08 Family of Microcontrollers
ICDRS08
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P&E's ICDRS08 is a powerful tool for debugging code. It uses the processor's background debug mode Module(BDM), via any of P&E's RS08 compatible interfaces (see product add-ons for more information), to give the user access to all on-chip resources.
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Product
In-Circuit Emulator
DS-XA
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* Emulates XA Derivatives * 2MByte Code and Data Memory * Memory With Mapping Capabilities * Real-Time Trace * Frequency Range up to 30MHz @ 5V * Source-Level Debugger For C And Assembler * MS-Windows Debugger Software for Windows NT and 95 or Later * 3.3V And 5V Emulation Support * Support for ROMless and ROM Microcontrollers * PLCC Emulation headers
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
Design for Test Service
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Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Product
In-Circuit Tester Integration
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The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Product
Automated Test Equipment
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Smart, swappable fixtures and flexible test bedsMulti-site setups, including multi-threadingLong-wire, short wire, and wirelessBed-of-nails for in-circuit testing (ICT)RF, high-speed digital, and thermal designsSolidWorks design expertise and global manufacturing (e.g., US, Mexico, China)Multiple options for mass interconnects (VPC, MAC Panel) and harnessesBuilt-in self-test (BIST) fixtures and calibration tools
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Product
In-Circuit Test Programming Services
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Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Product
In-Circuit Tester
Omega MTS888
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With the continuous and fast pace of development in the electronic manufacturing the time from design to production is a critical factor for success or failure of a product. The time from design to test is a major part of this process. The high performance tester from Digitaltest, the MTS888 Omega, has been designed to speed up this process.
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Product
In-Circuit Test Systems
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Keysight offers leading board test solutions for electronics manufacturers to tackle a wide range of PCBA test access and coverage issues for today's complex printed circuit assemblies.
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Product
Test Points
TestStation LX2
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TestStation LX2 is Teradyne's largest pin count in-circuit test system. Configurable up to 15,360 pins, TestStation LX2 utilizes the new UltraPin II 128HD pin card for testing large, complex, and heavily-integrated printed circuit board assemblies.
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Product
In-circuit Test
Medalist i1000 Systems
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Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Product
In-Circuit Test Fixture Design Services
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XJTAG offers consultancy services to design and build production test fixtures that integrate JTAG boundary scan with bed-of-nails testing.
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Product
Switching Matrix
MUX
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The Analog Signal Switch Unit serves as a 6-bus interconnect for 128 pins each to the Analog Measurement Unit (AMU05) for the In-Circuit test.
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Product
PinPoint IIR
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The PinPoint IIR provides industry-leading capability for the test and fault finding of the most challenging Circuit Card Assembly. With the ability to apply different test methods at the PCB edge connector or to each IC and device in-circuit through a test clip or Device Test Interface (DTI) you can achieve excellent test coverage and accurate and reliable fault finding.
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Product
In-Circuit Emulator
DS-51
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* Real-Time and Transparent In-Circuit Emulator * Supports Most of the 8051 Derivatives * Emulates 1.5V to 6V Microcontrollers * Maximum Frequency of 42MHz * 64K/512K of Internal Memory with Banking Support * 32K Trace Memory "on the Fly" * 64K Hardware and Conditional Breakpoints * MS-Windows and Keil ?Vision Debuggers * Source-Level Debugger for Assembler, PLM and C * On-Line Assembler and Disassembler * Performance Analyzer * Serially linked to IBM PC at 115 Kbaud
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Product
New Generation Vacuum Box for the 3070 Test Platform
Vortex Series
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The Vortex Series is a new generation vacuum box for the 3070 test platform that will easily revolutionize in-circuit test. The simplified and streamlined design allows for maximizing the usable testable board size of the Vortex 100 Performance Grade fixture. The rugged all aluminum design maximizes the opening angle of 85° ideal for Cobot usage, while eliminating the top plate and associated hardware and retaining our classic quick plate guided probe technology.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
TestStation Product Family
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TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide-range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Product
In-Circuit Test Fixtures
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Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
