System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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System Test Fixture
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Chassis Level Test Fixture, Set Box Test Fixture, and more by IST Engineering
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Embedded System Test Automation Software
ECU-TEST
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ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
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System Level Test
SLT
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As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
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HSI System Test Panel
TA-500
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This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
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TURBO AIR SYSTEM TEST KIT WITH SMOKE ADAPTER
TPT69700A
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*Helps locate air leaks in turbo system components by plugging the output side of the turbo and the intake inlet*Air is applied through one adapter to show the presence of leaks within the system*Six pairs of stepped adapters to fit most turbo systems on cars and light trucks
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Missile Warning System Test Set
Baringa™ IR/UV
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Baringa™ is a handheld, ruggedized aircraft survivability test set used to stimulate the electro-optic sensor suites on various aircraft platforms. Available in ultraviolet (UV) as well as one-color or two-color infrared (IR), Baringa simulates dynamic multi-engagement profiles and is easily reprogrammable to meet user testing needs.
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Weapon Control System Test Set
MS 1102
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- Provides serviceability checks on armament system- Portable instrument- Check the Bomb release sequence, practice bomb release sequence, rocket release sequence, fuzing, and jettison of aircraft stores- Helps to identify faults of conventional armament- Microprocessor based design
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Environmental Control System Test Platform
Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Validation System
FLEX BMS
System
The FLEX BMS™ Validation System is a quick-connecting, highly flexible test system for rapid evaluation of centralized, single-board and distributed battery management systems. Utilizing Bloomy’s industry-leading battery cell simulators, COTS instrumentation, industry-standard connectors, and models that run in real-time, the FLEX BMS™ Validation System can easily be reconfigured to test a wide variety of BMSs. The FLEX BMS™ Validation System is used by national and regional safety and standards labs for certifying the BMS for a wide array of e-mobility products and applications.
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Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
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Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
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Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Test System
LB302
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Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Function Test System
Focus-FX
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This is general function test system. User can change board model easily by replacing a test fixture and changing inspection program. We have variety of measurement instruments such as FX modules which can control commercial instruments. It is possible to add required modules into existing units as they are connected by USB port. User can expand as per desired inspection specification.
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Test Automation
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PrimeTest Automation delivers custom test, measurement, and data acquisition systems that include the best hardware and software available. Drawing on vast resources from multiple disciplines, each system is carefully designed and constructed to provide the most accurate and repeatable results. Test systems can be deployed as standalone or as part of an automated line such as a rotary index dial or conveyor.
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Code Test Optimizer
Clover
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Clover provides the metrics you need to better balance the effort between writing code that does stuff, and code that tests stuff. Clover runs in your IDE or your continuous integration system, and includes test optimization to make your tests run faster, and fail more quickly.
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Spectrophotometer & Integrating Sphere Test System
LPCE-1
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This Test System is suitable for photometric and colorimetric measurement of luminaries such as Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps), CCFL and LED. The measured data meets the requirements of CIE and IES LM-79 for the measurement of photometry and colorimetry.
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Small Device Noise Emission Test System
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The Small Device Noise Emission Test System from VIacoustics is a turnkey solution for the measurement of noise emissions of small devices typically used in computers, consumer electronics, appliances and automobiles. The system includes all hardware and software necessary (see the components tab) for the determinations of sound power levels (1/3 octave band and A-weighted), emission sound pressure levels (normalized 1/3 OB, A-weighted and high resolution FFT) and *ISO 532B loudness. The system is designed to be operated by a technician for production level testing or to be used by an engineer in the product development process.
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Integrating Sphere Spectroradiometer System for LED
LPCE-2(LMS-8000)
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LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, MCX
40-878-212
Multiplexer Module
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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SoftTest Design Testing Services
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We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.
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PXIe Very High Density Versatile 2 A Multiplexer
42-612B-002
Multiplexer Module
The 40-612B (PXI) and 42-612B (PXIe) Very High Density Versatile Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves.
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AUTOMATED TEST STAND DESIGN
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Automated test systems may be as simple as a laptop with a DAQ module or a stand-alone controller, but they typically require a mix of off-the-shelf and custom hardware. All that hardware is integrated and wired into a test stand. Portable or mobile test stands are ideal for in-the-field research and development and servicing of multiple laboratories or manufacturing lines. Test stand access to the front panels of hardware and subcomponents allows manual configuration of non-automated settings. Quick disconnects, cable harnesses, and easy access to probes provides efficient setup and tear-down. Expandable or modular rack mount and card base systems facilitate future needs. Ergonomic considerations include keyboard and display placement, along with number of monintors. Safety is always crucial with proper E-stop placement and keeping dangerous elements away from users.
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Datacom Analyzers
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Wuhan Sunma Technology Co., Ltd.
SunmaFiber provide E1/2M Transmission Analyzer is one multi-functional and full- featured digital transmission system test device, designed for the installation test, engineering check and acceptance, daily maintenance of digital networks, mainly performing channel test, alarm analysis, fault finding and signal analysis. In addition, this instrument further provides various protocol converters with one-way and bi-directional bit error test function. These capabilities make it ideal for field use.
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ARTES Automatic Relay Test Systems
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The purpose of power system protection is to use accurate and reliable protection devices to detect faults promptly and without fail and to minimize impairments to the power supply by selectively switching off faulted sections of the system.The use of suitable protection devices can significantly improve the safety and reliability of complex electrical power systems and installations. Regular testing is the only way to ensure that these protection devices function correctly throughout their operational life.More than 20 years of experience in developing and manufacturing automatic relay test systems have gone into creating the third generation of ARTES test instruments. Back in 1996, KoCoS was the first company to present Windowsbased testing software for controlling and operating test equipment and the company continues to play a pioneering role in the design of clearly structured and ergonomic user interfaces today.
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Modulation Distortion Up To 13.5 GHz
S930701B
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S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PXI High Density Precision Resistor Module, 4-Channel, 2.5Ω to 1.81kΩ
40-298-122
Programmable Resistor Module
The 40-298-122 is a high density programmable resistor module with 4 channels which can be set between 2.5Ω and 1.81kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Pogos
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AMETEK Sensors, Test & Calibration
The pogo system uses test frames fitted below the machine base to allow testing of very large samples up to 2 x 2 m (78.7 x 78.7 in) in size, with the added benefit of optional elevated and low temperature testing capacity.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 2Ω to 26.7kΩ
40-251-032
Programmable Resistor Module
The 40-251-032 is a programmable resistor module with 4 channels which can be set between 2Ω and 26.7kΩ with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 2.5Ω to 773kΩ
40-251-143
Programmable Resistor Module
The 40-251-143 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 773kΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
