System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Electronic Primary Injection Test Set
eKAM
eKAM is the new fully automatic electronic primary injection test equipment. e KAM test system includes two portable units: one control unit with a large graphical display, that adjusts the output, and one current unit (up to 2000, 3000, 5000A). It can also perform Step and Touch tests and ground resistance tests.
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PCI Precision Resistor Card 9-Channel, 2Ω To 102kΩ
50-297-034
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Twin columns automated force test stand 36" travel - 2000lb
702SN
The advanced 702SN Series Universal Test Systems are ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials, products or ASTM standards. These variable speed testers have increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.
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Testing Electric Pump Motors
This Custom Motor Test System is designed for the testing of 5 different sized electric motors used in various sump, utility, sewage, well, pool and pond pumps. All of the components mentioned above are mounted on a versatile table that can be easily reconfigured and retrofitted to any Magtrol dynamometer.
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Scienlab Measurement & Control Module
SL1060A
The Measurement & Control Module SL1060A is a mobile measurement module for measuring voltage input ±10 V with 16 channels. The module can be used either as a stand-alone device or as extension for a Scienlab Battery Test System.
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Analog Measurement Unit
AMU05
The AMU05 (Analog Measurement Unit 05) is the core of all our test systems. It ensures that all the measurements are performed faster, more accurately and with even greater stability.
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Hipot Testers
Hypot® Series
The Hypot Series sets the standard for safety and efficiency in production line Hipot Testing. Whether your application requires AC Withstand tests, DC Withstand tests, or Insulation Resistance tests, The Hypot Series provides innovations that will allow you to begin achieving best practices for safety and efficiency without the need for an expensive automated test system or connection to a PC. You can even connect the Hypot Series with the HYAMP Series to form a seamless safety compliance system for Hipot and Ground Bond Testing.
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PXI Precision Resistor Module 3-Channel, 2.5 to 395k
40-297-142
This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Software
DIGITIZER
The Digitizer allows the recovery of design data of unknown assemblies by an electrical analysis with a Condor flying probe test system
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PCI High Density Pecision Resistor Card, 3-Channel, 4Ω To 11.4MΩ
50-298-153
The 50-298-153 is a high density programmable resistor card with 3 channels which can be set between 4Ω and 11.4MΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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3-Axis Motion Simulators
When a device under test needs to be stimulated with simultaneous movements around three axes, then a product from the ACUTRONIC three-axis motion simulator range is the right choice. Independent motion simulation in three axes makes them very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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Transformer Tester
MOTOMEA Distribution Transformer Test Systems: Routine Testing for Production (EOL) and Quality Assurance (QA). Type Testing at Laboratory (R&D)
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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Assay System (Rest System for Longevity)
New polymers are constantly being developed and component manufacturing techniques appear, allowing the gradual replacement of metallic materials by plastics or composites, in various fields of application, in different industries. In particular, in the air conditioning, heating and water supply sector, plastic components are subject to the aging process due to the temperature to which they are subjected or due to the amount of oxygen in the fluids. The Test System for Longevity and Accelerated Aging Tests developed by Controlar allows to foresee, in accelerated test, the wear throughout the life of the plastic components of the hydraulic systems, in order to prevent eventual failures during the useful life cycle of the DUT.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 6.97kΩ
40-251-024
The 40-251-024 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 6.97kΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test Tables / Test Consoles
Adaptronic test tables and test consoles are a decisive component of the adaptronic kit for the assembly of comfortable and high-quality test systems for the wiring test of manufactured cable harnesses of all types.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Satellite & Payload Check-Out Systems
Rovsing delivers systems for complete satellite or satellite subsystem testing. Rovsing has developed a modular test system architecture, based on S/W and H/W modules developed by Rovsing for most common space interfaces such as Power, TM/TC, MIL-STD-1553B and SpaceWire. A dedicated test system can then be composed by configuration of the modular architecture, installation of monitoring and control software, as well as test definition and scheduling software as required. Besides reduced development time, this has the advantage that the system to a large extent consists of elements that have been validated on previous missions.
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PXI Resistor Module 2-Channel 1.5R to 1.02k
40-293-021
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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NI-9213, 16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module
785185-02
16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module - The NI‑9213 is a high-density thermocouple input module that is designed for higher channel count systems. With this module, you can add thermocouples to mixed-signal test systems without taking up too many slots. The NI‑9213 includes anti-aliasing filters, open-thermocouple detection, and cold-junction compensation for high-accuracy thermocouple measurements. The NI‑9213 features NIST‑traceable calibration and a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range.
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PXIe-2541, 300 MHz, 8x12 PXI RF Matrix Switch Module
780587-41
PXIe, 300 MHz, 8x12 PXI RF Matrix Switch Module—The PXIe‑2541 is an RF signal switching matrix. With its non-blocking design, you can simultaneously connect any row or column within the switching matrix and maximize the flexibility of your test system. Isolation relays on the module disconnect unused parts of the switching matrix to maintain RF performance and high isolation. The density and bandwidth of the PXIe‑2541 is ideal for routing signals between digitizers, function generators, and other RF generators and analyzers. For higher channel count applications, you can connect multiple PXIe‑2541 modules together to create switching matrices of 8x24, 8x36, and larger.
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DC Power Supplies
Rohde & Schwarz offers a versatile portfolio of DC Power supplies that fit variety of test and measurement scenarios. Whether you are looking to equip an educational lab or integrate a power supply into a production test system, we have the right equipment for you.
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6-Slot LXI/USB Modular Chassis With Scan List Sequencing & Triggering
60-106-002
Pickering Interfaces’ 60-106-002 modular LXI/USB chassis occupies only a small, 1U rack-height form factor, making it suitable for portable and space-restricted rack-mount applications. It features remote control via USB or LXI Ethernet and this version of the chassis includes Scan List Sequencing & Triggering. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment.
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Bench top Dielectric Withstand tester
HYPOT III
RS-232 Interface available for automated controlPatented SmartGFI® functionPatented CAL-ALERT® functionComes complete with a test box for products terminated in a line cordPatented VERI-CHEK® functionStorage of up to 10 setups with 3 steps per setupBuilt-in security settingsDigitally controlled arc detection systemNo load setup of trip current and output voltageElectronic ramping (up & down)Built-in adjustable continuity testInterconnection to HYAMP® III to form complete test system
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DynEDGE Controller
The DynEDGE controller offers an integrated, multi-loop control and data acquisition system in an off-the-shelf solution for dynamometer applications, including system modernizations, new installations, turnkey systems, and complete test cell control and data acquisition systems. The controller provides both speed and torque control with four control channels that can be configured for ±100 mA, ±10 V, and ±20 mA.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Automotive Solutions
One of the most challenging applications in the field of automotive testing is manufacturing electronics. With each successive model year, the number of automated features increases. Every segment of the automotive electronics plays a role in the safety and reliability. These critical applications require high dependability and low maintenance and warranty costs. Our customers don’t have room for error, hardware test systems must perform as designed. Circuit Check provides Automated Test Systems that meet the stringent needs of this marketplace.
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Measurement & Test
Electronic test engineers use a variety of precision instruments for R&D, vendor verification, and production testing. ETPS can supply a number of general test instruments that can be used in stand alone mode or automated for high throughput testing. Dedicated battery test systems with automatic charge and discharge modes with data logging are available. The standard 16 and 32 channel systems have range up to 5VDC ensuring their suitability for a wide variety of cells.
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Phase Noise Test System
N5511A
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
