System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Benchtop/Portable Cable/Harness Wiring Test System
CKT1175-10
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Designed for wiring testing requirements requiring up to 2,000 test points, the CKT1175-10 is ideal as a benchtop or portable test system. The system is packaged in an enclosure specifically designed to be used in rugged environments. The basic 500 test point system is 20.5 in. (521 mm) wide X 12.0 in. (305 mm) high X 16.05 in. (408 mm) deep; the 500 test point expansion units are 20.5 in. (521 mm) wide X 6.00 in. (153 mm) high X 16.05 in. (408 mm) deep.
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Benchtop Communication Test System
ATS3000A
Test System
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Optical tables
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The primary goal of a well designed optical table is to eliminate relative motion between components of test system located on the surface of the optical table because such motion can generate measurement errors.
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PXI Precision Resistor Module 3-Channel, 2.5 to 773k
40-297-143
Programmable Resistor Modules
This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Engine Performance/Endurance Test System
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Various types of test system as follows can be built up in combination with measurement control equipment and peripheral instruments (fuel flow meters, actuators, temperature control device, combustion analysis system, ECU monitor, OBD, sound and vibration measurement instruments, emission analyzer, smoke meter etc.)·Traveling fuel economy test·Gas emission test·Output performance test·Deterioration/endurance test·Combustion analysis·Sound source probing
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Semiconductor Test Platform
Diamondx DxV
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The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop:
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High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Stator & Coil Testing
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Electronic Systems of Wisconsin, Inc.
ESW Stator Test Systems come fully equipped with the latest industry features. The on-screen display in our testers allows the operator to visually see the part lead hook-up to the tooling connections. Our software makes it easier to read, track, and record your stator test information. While performing tests, you can watch the testing throughout the process in real time. You can view various wave-forms for surge or magnetic field, which can be displayed real-time and printed if desired. The software logs all test results, so that you do not have to worry about losing important information. ESW designs the tooling to be simple to connect the part. We work closely with you to define and implement your customized testing needs. The videos and slideshow below show some of our Stator Testers.
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Multifunctional Immunity Test System For Automotive Electronics
EMS-ISO7637
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EMS-ISO7637 automotive multifunctional immunity test system meet newest ISO7637-2 requirement of
. This standard was issued by international organization for standardization, and this system included all of ISO-7637 required test waveform and meet most of automotive manufacturer’s requirement for automotive electronic immunity test. -
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CT/VT Test System
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Fully pre-wired comprehensive turn test system. *Suitable for CTs up to 6000A & VTs up to 132kV. * Precision to (0.005 class) internal multi-ratio standard CT. * Internal 4KA current source. * State-of-the-art Instrument Transformer Test Set AITTS-98 with computer & printer interfaces. * Electronic potential divider facilitates testing any VT ratio upto 132kV. * Current & potential burdens.
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Calibration
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We also help to fulfil the recommended calibration cycles of the other measurement instruments within your test system. In case you can not go without the whole system we will find another solution like a change or loan of single devices.We also offer whole test system calibrations on-site as part of our preventive maintenance concept.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
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The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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Obsolete ATE, Replacement Systems
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No one likes saying goodbye to a faithful old friend but now that the economy is on the up, has the time finally come to replace your ageing Automatic Test Equipment (ATE) or Special to Type test system?
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P-GW Functional Tester
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The LTE PGW Functional Tester provides a wrap-around test solution for the Packet Date Network Gateway by emulating all the LTE network elements surrounding the PDN-GW (System Under Test). The P-GW Functional Tester emulates LTE Core Network entities such as the S-GW, PCRF, OCS and OFCS. It tests the S5/S8, S7/Gx, Gy and Gz interfaces of the P-GW.
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Product
PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-03
Digital Waveform
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 239Ω
50-298-013
Programmable Resistor Modules
The 50-298-013 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 239Ω with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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SAE AS4111/4112 Protocol Validation Software
AltaRTVal
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AltaRTVal provides the most advanced MIL-STD-1553 COTS protocol validation tool in the industry, and helps prepare for Test Systems Inc Full SAE 4111 Validation. The software implements protocol tests for both the SAE AS4111 RT Validation Test Plan and the SAE AS4112 RT Production Test Plan. Ideal for testing new software revisions of current designs or manufacturing production units.
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Dynamic and Fatigue Testing Systems
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Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
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FPGA PXIe High-Performance Digital I/O Card
GX3700e
Digital I/O
The GX3700e is a user configurable, FPGA–based, 3U PXI Express card offering 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3700e is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera’s free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded directly into the FPGA or via an on-board EEPROM.
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Network Impairment Simulator
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Testing system performance under realistic network conditions requires the introduction of impairments that could be expected to be seen on networks, especially public networks which are uncontrolled. There are a number of ways to do this. A basic method is to use network simulation devices that can emulate conditions expected to be encountered.
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Diving Technology Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
The imaging ultrasonic testing systems of the USPC 30XX series are optimized for testing a wide variety of materials and provide high-resolution findings in the form of A, B, C, D and F images. The hardware consists of an industrial PC, in which a motor controller and an ADC card are installed, as well as a HILL-SCAN pulser/receiver unit. An overview of the available systems is given in Table 1.
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Compact Functional Test System
E2230C / TS-5040
Functional Test
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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PXIe-2540, 350 MHz, 8x9 PXI RF Matrix Switch Module
780587-40
Matrix Switch Module
PXIe, 350 MHz, 8x9 PXI RF Matrix Switch Module—The PXIe‑2540 is an RF signal switching matrix. With its non-blocking design, you can simultaneously connect any row or column within the switching matrix and maximize the flexibility of your test system. Isolation relays on the module disconnect unused parts of the switching matrix to maintain RF performance and high isolation. The density and bandwidth of the PXIe‑2540 is ideal for routing signals between digitizers, function generators, and other RF generators and analyzers.
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Product
PXI 2.5W Programmable Resistor Module, 2-Channel, 2.5Ω to 102kΩ
40-251-040
Programmable Resistor Modules
The 40-251-040 is a programmable resistor module with 2 channels which can be set between 2.5Ω and 102kΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Flying Probe Tester
FA1817
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Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Multi-Channel Modular Isolated Power Supply
N6700 MPS
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N6700 MPS has 16 different DC power supply modules, so test system designers can use these modules according to their specific test requirements to establish 1 to 4 channel DC power supply system. In the requirements of speed and accuracy of the occasion to invest in high-performance output, and for the general requirements of the DC power supply to buy basic performance output.
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Multi Channel Optical Fibre Verification
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The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
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BNC To BNC Cable, 50 Ohm, 0.9 M
781887-01
Coax Patchcord
Connects measurement and signal generation devices. Model options include industry-standard coaxial connector types including BNC, SMA, SMB, and MCX. Long cables can act as antennae picking up extra noise that can affect measurements, so ensure you select only the length required for your test system. Also look at the impedance of your test system and consider buying a cable with the same impedance. Matched impedance can maximize the power transfer or minimize signal reflection from the load of your system.
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Maxirack - 200 x 60 x 80 cm
OTP2 module no003
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The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 200 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
