Parametric (WAT) Probe Card
STAr's strong R&D with its high-quality manufacturing line enables the development of advanced parametric and reliability probe cards for low-leakage current tests, high temperature probing, and small pad contacts.
STAr's strong R&D with its high-quality manufacturing line enables the development of advanced parametric and reliability probe cards for low-leakage current tests, high temperature probing, and small pad contacts.
