Showing results 1 - 15 of 47 products found
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Company: Integrated Technology
The ITC5730 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices. Included in the mainframe are all test equipment and software necessary to analyze and perform switching time, switching loses, gate charge, Trr/Qrr, and other transient tests.
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Company: Keysight Technologies
Existing and new wafer fabs face ever-greater parametric testing challenges. Out of necessity, parametric test has expanded beyond pure DC measurement and now spans a variety of different measurement types, including parallel test, Flash cell write/erase testing. Anticipating these needs, Keysight has developed the versatile and flexible 4080 parametric test platform.
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Company: Keysight Technologies
Keysight provides intuitive, flexible, powerful software solutions to simplify the measurement, collection, analysis, and management of parametric test data.
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Company: Acery Technologies
If you are in the development and manufacture of MEMS (microelectromechanical systems) wafer, then you need a test system to measure whether the chip wafer reaches your design requirements. In addition to the test system used to connect the chip pin probe station outside, still need a variety of instruments used to measure the dynamic parameters and static parameters of the wafer. In addition to these hardware devices, for volume manufacturing, the automation of the measurement is also very important aspect.
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Company: MPI
Cantilever Probe Card: LCD Driver IC, Logic IC, Parametric Test.
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Company: Cascade Microtech
The Parametric series Pyramid probe cards are the high performance, low-cost alternative to the existing solutions, compatible with all major parametric tester platforms, and designed to enable the accurate monitoring of 65 nm and 45 nm parametric test structures. Cascade Microtech's innovative PyramidPlus manufacturing process ensures a substantially lower cost of ownership, while delivering superior signal integrity and faster settling time, compared to traditional probe technologies. The Parametric series Pyramid Probe card is ideal for applications such as final process development, DC-only parametric volume production (in-line and end-of-line), and Wafer-Acceptance Testing (WAT).
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Company: LXinstruments GmbH
The test system is used for testing of digital and mixed signal semiconductors as part of the design verification, the specialized manufacturing and quality assurance. The system allows not only the static and functional testing and parametric testing of DC and AC characteristics of semiconductor. The system provides for DC parametric measurements a PMU (parametric measurement unit) per pin available. For the parametric test of AC characteristics, the system has a digital subsystem with flexible dynamic timing and a "timing per pin" architecture with a resolution of <1 ns. The implementation of the system as a PXI-based solution is an extension to custom instrumentation for verification example of modulated RF signals easily. The open system software enables the integration of corresponding driver and measurement functions.
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Company: Keithley
The 540 Parametric Test System is a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV. Optimized for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high voltage, low voltage, and capacitance tests in a single probe touch-down. S530 Parametric Test Systems are designed for production and lab environments that must handle a broad range of devices and technologies, offering industry-leading test plan flexibility, automation, probe station integration, and test data management capabilities. Keithley has brought more than 30 years of expertise in delivering a wide range of standard and custom parametric testers to customers around the world to the design of these test solutions.
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Company: IST Information Scan
THE IST-7500 is a programmable parametric tester that provides parameter measurements or parametric Go/No Go tests for a wide variety of Operational Amplifiers, Voltage Comparators, Voltage Regulators, Digital-to-Analog and Analog-to-Digital Converters. The IST-7500 can be interfaced to an automatic handler for high speed production testing and is also equipped with a RS-232 port for PC interface.
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Company: Aehr Test Systems
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Company: Applied Relay Testing
When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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Company: Applied Relay Testing
Pneumatically actuated Kelvin connection to custom manufactured device inserts either to complement ART's wide range of precision parametric test equipment or for use with third party measurement hardware.
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Company: Keysight Technologies
The Keysight T4010S LTE RF tester is the most comprehensive tool for LTE UE RF parametric verification and characterization. This top-of-the-line test system meets the needs of early development, R&D, conformance and certification testing.
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Company: Circuit Check
With over thirty years of experience in the test business and hundreds of satisfied customers, Circuit Check supplies all types of test automation, from automating small bench tests to supplying turn-key manufacturing end-of-line ATE systems to developing custom robotic and conveyorized ATE and parametric measurement systems.
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Company: Keysight Technologies
The E6621A PXT instrument represents a significant breakthrough in LTE UE testing. It incorporates flexible base station/network emulation and RF parametric tests into one integrated unit and extends Keysight’s unmatched portfolio of LTE test solutions for development and verification. The E6621A PXT hardware is configurable with a number of advanced test and analysis software options.
