Showing results 1 - 15 of 58 products found.
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B1542A - Keysight Technologies
Pulsed IV parametric testing is becoming an increasingly common requirement for the development of semiconductor process and the evaluation of semiconductor devices. In recent years, the need for very accurate Pulsed IV measurement has increased due to the development of more advanced processes. To meet these needs Keysight offers a variety of Pulsed IV parametric test solutions that supply the widest range of pulse widths, voltage/current output, and performance available in the industry.The Keysight B1542A 10 ns Pulsed IV parametric test solution has a pulse width range from 10 ns to 1 ms. It is the best choice for characterizing MOSFETs utilizing high-k gate dielectrics and MOSFETs fabricated on SOI wafers. This pulsed IV solution allows you to apply a 10 ns pulse with 2 ns rise and fall times (the fastest in the industry) that also has minimal overshoot and undershoot.
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U2941A - Keysight Technologies
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Keysight Technologies
Reduce your cost-of-test up to 20% with our ultra-fast CPUOvercome your process test challengesBoost measurement throughput and lower costs with our synchronous/asynchronous parallel test capabilityBetter low-level measurement performanceCreate customized waveformsReduce transition costs
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4082A - Keysight Technologies
Notice for European Union Customers: A modified version of this non-RoHS compliant product has been made available to the European Union market, please contact your local Keysight Sales office for details. Keysight will maintain worldwide service and support of any 4080 test system throughout its support lifetime.
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Keysight Technologies
Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
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P9001A - Keysight Technologies
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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4082F - Keysight Technologies
Notice for European Union Customers: A modified version of this non-RoHS compliant product has been made available to the European Union market, please contact your local Keysight Sales office for details. Keysight will maintain worldwide service and support of any 4080 test system throughout its support lifetime.
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Acery Technologies
If you are in the development and manufacture of MEMS (microelectromechanical systems) wafer, then you need a test system to measure whether the chip wafer reaches your design requirements. In addition to the test system used to connect the chip pin probe station outside, still need a variety of instruments used to measure the dynamic parameters and static parameters of the wafer. In addition to these hardware devices, for volume manufacturing, the automation of the measurement is also very important aspect.
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MPI Corp.
Cantilever Probe Card: LCD Driver IC, Logic IC, Parametric Test.
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Parametric Series - Cascade Microtech, Inc.
The Parametric series Pyramid probe cards are the high performance, low-cost alternative to the existing solutions, compatible with all major parametric tester platforms, and designed to enable the accurate monitoring of 65 nm and 45 nm parametric test structures. Cascade Microtech's innovative PyramidPlus manufacturing process ensures a substantially lower cost of ownership, while delivering superior signal integrity and faster settling time, compared to traditional probe technologies. The Parametric series Pyramid Probe card is ideal for applications such as final process development, DC-only parametric volume production (in-line and end-of-line), and Wafer-Acceptance Testing (WAT).
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TS9xx - LXinstruments GmbH
The test system is used for testing of digital and mixed signal semiconductors as part of the design verification, the specialized manufacturing and quality assurance. The system allows not only the static and functional testing and parametric testing of DC and AC characteristics of semiconductor. The system provides for DC parametric measurements a PMU (parametric measurement unit) per pin available. For the parametric test of AC characteristics, the system has a digital subsystem with flexible dynamic timing and a "timing per pin" architecture with a resolution of <1 ns. The implementation of the system as a PXI-based solution is an extension to custom instrumentation for verification example of modulated RF signals easily. The open system software enables the integration of corresponding driver and measurement functions.
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MI-ATE - GMA Industries, Inc.
MI-ATE integrates multiple complementary test modes to detect fault signatures with electronic and mechanical systems: * Functional and Parametric Test * Electromagnetic Emission Analysis * Micron-resolution X-Ray Imaging * Chemical off-gassing Analysis
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STAr Technologies, Inc.
The use of wafer probing for parametric and reliability test plays an important role in assuring the quality of manufacturing processes and reliability of devices and interconnects. STAr's strong R&D with its high quality manufacturing line has enabled the development of advanced parametric and reliability probe cards for low-leakage current tests, high temperature probing, and small pad contacts.
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PXI-2515 / 778572-15 - National Instruments
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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PXIe-2515 / 780587-15 - National Instruments
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
