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Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Test & Development
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Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Rapid Test Development
TestEZ® Development Suite
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Count on the Test EZ® Development Suite for complete, efficient, cost-effective test development and execution for electronic test systems.
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Flying Probe Programming & Test Development
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Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.
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Test development service
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Test development may be a complex task, because each emulated session must be unique and consistent. Unless the website consists of exclusively static pages, there is no testing tool that can fully automate the test design process. In many cases the implementation may require considerable research of the client-server communication scheme.
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Compliance Test, Development and Test Service
DinoStor
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With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
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Test & Development
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Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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IC Tester
ICE1
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The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Multi Protocol Analyzer
LE-8200A
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The LE-8200A is the top-level model of battery-powered communications protocol analyzer. The LE-8200A has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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Waveform Function Generators
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Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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Integrated Test Environment
ITE
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The Integrated Test Environment (ITE) is our solution to handle complex hardware or software test projects.ITE provides features to define and manage requirements and test cases in different documents, link them with each other as well as plan tests and test campaigns. Moreover the tests can be developed, executed and evaluated by considering the linked requirements. Test results can additionally be recorded and finally reported in different, adaptable and configurable reports.
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Radio Frequency, Communications, & Navigation Test Systems
Test System
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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SoC Tester
UltraFLEXplus
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The UltraFLEXplus combines new instrument and software capability with a revolutionary tester infrastructure that provides a step-function improvement in throughput and engineering efficiency – all while leveraging the cumulative test IP developed over the UltraFLEX’s 15 year history .
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MIMIC® MQTT Simulator
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MIMIC MQTT Simulator is a scalable, customizable, programmable, predictable, dynamic simulation platform designed to enable rapid development / testing / deployment / tuning / training / demonstration of large-scale Internet of Things applications.
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EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Type 39, E-Frame with a 4-slot 6U P&G VPX BP, 600 watt PSU
39E04ASXC8Y2VCF0
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The Type 39 E-Frame test platform supports 4-slot test & development platform for 6U VPX and OpenVPX™ boards.
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Open Top BGA Sockets
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Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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CloudShell Pro
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Quali’s Cloud Sandbox Software allows you to create and publish sandboxes that are replicas of infrastructure and application configurations and use them for development, testing, demos, training and support. CloudShell works by letting you model, orchestrate, and deploy on-prem, cloud, and hybrid environments so that all teams in the DevOps lifecycle have consistent access to production ready environments.
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Software Test Framework for LabVIEW
VI Tester
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VI Tester is a software test framework for LabVIEW that allows software developers to test their LabVIEW code (VIs). Software testing is a critical component of agile development and test driven development processes and is also critical for validating software functionality. VI Tester is based on the industry standard xUnit software test architecture that is used in many other programming languages. This architecture is very flexible and powerful, but also very easy for beginners to learn.
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ISDN Chip Set
Emutel Symphony
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Emutel Symphony is a convenient and flexible Basic Rate ISDN, Primary Rate ISDN and Analog PSTN network simulator. With support for S, U, E1, T1 and PSTN analog interfaces you can use the Emutel Symphony to test and develop a full range of ISDN(E1/T BRIS BRIU) and PSTN analog (FXS) equipment.
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Rugged Data Acquisition Systems
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Our team of engineers have decades of experience in performing structural testing in the aerospace, off highway, automotive, construction equipment, pulp & paper, and utility markets. We have used our testing expertise to develop a line of Rugged Data Acquisition (RAC) Systems that perform under harsh testing conditions.
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Air Tightness Detector
FQ
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Fuzhou Fuguang Electronics Co., Ltd.
FQ series air tightness tester is the latest high-precision non-destructive testing equipment developed by Fuguang Electronics. The equipment mainly uses compressed air as the medium to apply a certain pressure to the inner cavity or surface of the product to be tested, and then uses a high-sensitivity sensor to detect changes in pressure to determine the tightness of the product to be tested.
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R + D Testing of Electric Motors
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Highly dynamic development test bench for synchronous and asynchronous motors*Comfortable concept with changeable test angles for handling various load machines and test pieces*Freely configurable test runs - ie suitable for endurance tests and long-term examinations*Equipped for environmental simulations (temperature)*Examination of complete drive systems (motor and inverter)
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Digital I/O Vector Development Software
DIOEasy
Digital I/O
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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Analysis and Visualization of Arbitrary Test Reports and Result Data
TEST-GUIDE
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Test execution in development projects leads to the accumulation of various reports and data. Test automation intensifies this, producing very high numbers of test executions, which are distributed over several users and test environments. This multitude of test results from different sources can be efficiently managed and analysed using TEST-GUIDE.
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TestExec SL Software
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This off-the-shelf test executive empowers test developers with a fully customizable operator interface, open architecture for multiple instrument integration, flexible test sequencing, easy debugging tools and provisions for line integration in most manufacturing test environments.
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Boundary-Scan DIMM Socket Tester
ScanDIMM
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Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228A
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The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Steady State Solar Simulator
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Our steady state solar simulators enable you to test and develop solar thermal collectors independent of weather and season, faster, more efficiently and more comprehensively than ever before. Both simulators are turnkey products, delivered 100 % ready to go!
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Test & Test Development for Circuit Card Assembly
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Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
