- Applied Instruments, Inc.
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Forward Path NPRT 2200 Noise Power Ratio Test Set
NPRT 2200-F
The NPRT 2200 measures the NPR of a device across a range of power levels. This test quantifies intermodulation distortion and determines the dynamic range of optical transmitters, amplifiers and other active HFC network devices. The included PC software uses predefined test setups to run a "Power Sweep" series of NPR measurements and graph the results.
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GPP-95-2 Test System Interface Probe
GPP-95-2
Overall Length (mil): 375Overall Length (mm): 9.53Rec. Mounting Hole Size (mil): 85Rec. Mounting Hole Size (mm): 2.15Recommended Drill Size: #44 or 2.15 mm
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Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T156
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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MEMS Spring Probe
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
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MPI SiPH Probe Systems
MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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AWS Probes For Ultrasonic Weld Seam Testing (ASTM)
SONOSCAN R
The robust ultrasonic probes with BNC connector allow a fast scanning over comparatively large areas with high precision and repeatability. Both our own and third-party wedges can be attached to our probes. . Thanks to the different types of wedges various material tests can be performed.
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30A, 50MHz High Sensitivity Current Probe
CP030A
Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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Adapter/Stainless Steel
WADP-SFSF-01
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Oscilloscope Probe
An oscilloscope probe establishes a physical and electrical connection between a test point or source and an oscilloscope; in fact, an oscilloscope probe is a type of device or network that connects a signal source to an oscilloscope input.
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Clamp Meter
ST-3347W
Standard Instruments Co., LTD.
This clamp meter provides accurate AC, AC/DC current and voltage readings regardless of the waveforms. This meter can use in most industrial and commercial applications where non-linear loads distort the current or voltage waveform. Reliable operation. Features accessories such as test leads, carrying case and temperature probe.
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Adapter/Stainless Steel
WADP-29F29F
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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DC Power Analyzer, Modular, 600 W, 4 Slots
N6705C
The N6705C DC Power Analyzer provides unrivaled productivity gains for sourcing and measuring DC voltage and current into the DUT by integrating up to 4 advanced power supplies with DMM, Scope, Arb, and Data Logger features. The N6705C eliminates the need to gather multiple pieces of equipment and create complex test setups including transducers (such as current probes and shunts) to measure current into your DUT. The DC Power Analyzer also eliminates the need to develop and debug programs to co...show more -
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12.5 mm Test Sphere Probe
CX-12.5
Shenzhen Chuangxin Instruments Co., Ltd.
The rigid sphere (12.5 mm) from Autostrong is designed and manufactured to perform the test specified in many standards (IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950) to prove the degree of protection for the first characteristic numerals 2 (IP2X) .Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.
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Rogowski AC Current Probe,30 MHz, 600 A
N7041A
The Keysight N7041A Rogowski coil current probe measures AC currents up to 600 A, with bandwidth ranging from 12 Hz to 30 MHz. The probe has a thin, lightweight, flexible, and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult-to-reach parts and confined spaces of a circuit under test. It can also measure large AC current without an increase in transducer size.
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Adapter/Nickel
WADP-NFSF
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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AUTOMATED TEST STAND DESIGN
Automated test systems may be as simple as a laptop with a DAQ module or a stand-alone controller, but they typically require a mix of off-the-shelf and custom hardware. All that hardware is integrated and wired into a test stand. Portable or mobile test stands are ideal for in-the-field research and development and servicing of multiple laboratories or manufacturing lines. Test stand access to the front panels of hardware and subcomponents allows manual configuration of non-automated settings. ...show more -
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LANTRACKER
PH-100/120
The Lantracker is a network tester, pin-by-pin cable tester, and tone generator all in one. As a network tester, it detects whether a network is active or inactive and displays network speed (10/100/1000 Mbps) in either case. It also flashes the network hub or NIC’s port light corresponding to the cable it is connected to, to show the cable’s port number. As a cable tester, it performs loop-back or remote tests of network, data, voice, and coaxial cables, displaying the results on a pin-by-pin L...show more -
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Adapter/Gold
WADP-SFSF
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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GSP-2B Test System Interface Probe
GSP-2B
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46
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RSP-2T Test System Interface Probe
RSP-2T
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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Logic Analyzer Probe
FS2510AB
The FS2510AB is a logic analyzer probe used to test DDR4 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154A/B/64A logic analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR4 DIMMs.
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High Current Calibrator
MC151
MC151 Current calibrator is an accurate current source capable of 120 A. Typical uses include calibration of current sensors, current probes, current transformers, shunts, ammeters, DMMs or as stable current source for test and development applications. The calibrator is equipped with a built-in multimeter that can be used for simulation of programmable transconductance or current amplifier.
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Crack Testing
STATOGRAPH® Product Family
Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
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Adapter/Stainless Steel
WADP-24M24F
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Phasing Meters
A unique tool in that it may be used as a conventional phasing meter, or the meter probe may be used as a stand-alone voltage detector on primary or secondary voltages or capacitive test points.
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Exchangeable Test Fixture
MA 2109/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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Differential Probes (4-6 GHz)
Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point. Dx10/Dx20/Dx00A-AT 4-6 GHz differential probes are a general purpose probing solution with high input dynamic range and offset.
