- Kreon Technologies
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Scanners
Our 3D scanners are equipped with a probe, which means that there is no need to disconnect your scanner when changing from scanning to probing and vace versa. the flexability of our scanners saves time and ensures reliable 3D measurements.
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Surface Mount Package Emulation
SMT Adapters
Ironwood’s SMT package emulation adapters are often called “surface mount feet” or “emulator bases”. These adapters provide access and interconnections to surface mount lands. Typically, the adapters are soldered to the target board in place of the IC device and provide a pluggable array of pins interface for sockets, probing adapters, package converters, and even board-to-board connections. These adapters are often utilized as a base for many of our probing adapter products. We constantly innov...show more -
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Active Voltage Probes
Engineers must commonly probe high-frequency signals with high signal fidelity. Typical passive probes with high input R and C provide good response at lower frequencies, but inappropriately load the circuit, and distort signals, at higher frequencies. Active voltage probes feature both high input R and low input C to reduce circuit loading across the entire probe/oscilloscope bandwidth. With low circuit loading, and a form factor that allows probing in confined areas, the active voltage probe becomes the everyday probe for all different types of signals and connection points.
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Automotive Back Probe Pins
142-5
Flexible 1.5 inch silicon pins provide easy back probing connections for DMM and Scope measurements
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system...show more -
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4 Channels DC Power Data Acquisition Device
NuDC-4U
NuDC-4U is an innovative product that provides better solution for power probing. Common DC power statistics including voltage, ampere and even the watt can be read instantly via NuDC-4U. Moreover, up to 4 sets of individual powers can be monitored simultaneously and the LCD screen can also display the maximum and minimum value of the current power during the test.
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Portable CMM Arm
Master3DGage®
Master3DGage® is a complete CMM hardware and software solution for inspection and reverse engineering. The multi-axis portable CMM features absolute encoders for quick start-up and highly accurate and precise measurements. Its lightweight, wireless design and battery-powered capability enable the Master3DGage® to be placed right into your CNC machine for in-process inspection.Optional 3D scanner and hot-swappable probes make it easy to switch from scanning complex profiles to probing primitive features in seconds.
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Wafer Test Solutions
Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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Automotive Test Lead Kit
143
Test Lead Kit includes our basic set of interchangeable specialty test probes designed for automotive use. The flexible back probing pins are great for sliding into automotive connectors like those on fuel injectors and MAP sensors. The large Crocodile Clips are good for clipping to grounds and battery terminals. Roll up storage pouch keeps your leads organized.
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High Voltage Passive Probes
The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
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Device Parameter Analysis
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrade...show more -
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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CMM Contact Measurement (Probing)
A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
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iSeries XL
XL-sized backshells offer larger cable exits & increased bend radius. Accommodates larger wire bundles, including high speed and twisted pair. Mating face remains compatible with standard receivers. Slide-off backshells allow easy access to wiring for maintenance and probing.
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DH Series QuickLink Adapter Kit with 3 x QL-SI Tips
DH-QL-3SI
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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DDR4 X4/x8 BGA Interposer For Logic Analyzer, Connects To 61-pin ZIF
W4643A
The W4643A DDR4 2-wing BGA interposer for DDR4 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W4643A is the smallest BGA interposers for DDR4 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding 3.2 Gb/s. U4208A and U4209A probe/cables connect any W4640A Series DDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W4640A Series BGA interposer wings.
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Vibration Isolation Tables
Probing Solutions offers Vibration isolation tables made by Kinetics and TMC. To order a table, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
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Solid Tungsten Probe Tips
ST Series
The ST SERIESof probe tips, available from GGB Industries, Inc., are precision crafted from a 0.020 inch (0.51mm) diameter solid tungsten shaft that is electrochemically sharpened to a specified point. These durable, 1.5 inch long solid tungsten shaft probe tips are for use in most standard micropositioners when probing an integrated circuit, pad, or line. A variety of radius point sizes from 0.5 microns to 10 microns are available to accommodate any probing need.
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Cryogenic Probe Station
FWPX
Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Portable Manual Probing Station
Model W4.0 x L6.5
This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.
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Infiniium UXR-Series Oscilloscope: 10 GHz, 4 Channels, 3.5 Mm
UXR0104A
The UXR0104AA is the 10 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope with the most comprehensive set of probing, analysis applications, and measurements for advanced technologies. EVM performance for wideband mmWave measurements that rivals even the best signal analyzers. UXR-Series scopes have flexible upgrades: Bandwidth up to 110GHz, Memory up to 2Gpts, DDC up to 2.16GHz, and configurable frequency extensions up to 10GHz.
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WaveMaster Oscilloscope, 4 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 804Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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2.92mm to ProBus Probe Adapter
L2.92A-PBUS
The Teledyne LeCroy LabMaster 10 Zi oscilloscope utilizes precision 2.92mm input connectors to achieve up to 36GHz of input bandwidth. But some applications may require the use of lower-bandwidth probes for performance and cost reasons.The L2.92A-PBUS adapter converts the 2.92mm interface to a ProBus interface. This brings the benefits of a wider selection of probes to the LabMaster 10 Zi from high-impedance ZS active probes to the high-bandwidth WaveLink differential probing system. Full probe power and control is provided through a built-in LEMO interface.
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PORTABLE COORDINATE MEASURING MACHINE
CMM
The HandyPROBE arm-free probing system generates high-accuracy measurements (accuracy of up to 22 µm), and outperforms traditional portable CMMs on the shop floor. The HandyPROBE portable CMM is currently used on the production lines of major players from the automotive, aerospace and manufacturing industries.
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CAM/GATE Test Kits
Series 45
The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operati...show more -
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Magnetic Probing Systems
MPS-C-300 and MPS-C-350
MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Reverse Engineering Software Module
Verisurf Reverse
Verisurf REVERSE is a complete reverse engineering solution offering innovative tools to create CAD models from points, clouds, and meshes.REVERSE optimizes the performance of probing and scanning technologies such as portable arms, laser trackers, structured light, laser scanners, and many others.
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DH Series High-Temperature Solder-In Tip, 16 GHz BW, 3.5 Vpp Range
DH-HITEMP
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
