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- Virginia Panel Corporation
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ITA, ICon, With Protective Cover
410123101
The iCon ITAs small width and inboard handle allow for easy side-to-side stackability. The u-shaped cable clamp allows modules to be pre-wired before assembly and offers a maximum cable bundle diameter of 1.21". The slide-off cover allows easy access to wiring for maintenance and probing.
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Lab Assistant
The SemiProbe Lab Assistant family of probe stations is specifically designed to address the requirements of universities and research personnel. Lab Assistant probe stations provide simplicity, ease of operation, portability, affordability and modularity. Lab Assistant probe stations can be configured for DC or HF/Microwave testing configurations, including an array of sophisticated accessories that are usually only found on much larger, more expensive probing stations.
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WaveMaster Oscilloscope, 8 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 808Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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Static and dynamic analysis
MEMS
Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
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WaveMaster Oscilloscope, 16 GHz Bandwidth, 4 Input Channels, 80 GS/s Max Sample Rate
WaveMaster 816Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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Grypper
Grypper
*Package-size PCB footprint: Since the PCB footprint of Grypper is identical to or smaller than the IC package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Continuity Tester
TE6-0711
Hangzhou Tonny Electric & Tools Co., Ltd.
*Designed to test circuits while power is off*2 AAA batteries included*Durable ABS housing*36" Test lead with insulated alligator clip*Sharp tip for probing circuits
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Passive Probe, 10:1, 200 MHz, 1.3 M
N2871A
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Cryogenic Probe Station
CPX-VF
The Lake Shore CPX-VF probe station enhances the standard probe station capabilities with the addition of a ±2.5 T vertical field superconducting magnet. It can do all the standard C-V, I-V, microwave, and electro-optical probing of the CPX, plus out-of-plane vertical field superconducting magnetic measurements. Researchers can use it to perform Hall effect measurements and test magneto-transport parameters. The CPX-VF is one of Lake Shore’s premium probe stations for combining microwave measurements with magnetic field.
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Video Sensing Device
VideoStik VSS1
VideoStik is the latest addition to the successful Ranger series of CCTV test equipment from NG systems. This low-cost, battery-operated video sensing device will detect the presence of standard 1v p to p video by simply probing the BNC terminated cable.
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2.92mm to ProBus Probe Adapter
L2.92A-PBUS
The Teledyne LeCroy LabMaster 10 Zi oscilloscope utilizes precision 2.92mm input connectors to achieve up to 36GHz of input bandwidth. But some applications may require the use of lower-bandwidth probes for performance and cost reasons.The L2.92A-PBUS adapter converts the 2.92mm interface to a ProBus interface. This brings the benefits of a wider selection of probes to the LabMaster 10 Zi from high-impedance ZS active probes to the high-bandwidth WaveLink differential probing system. Full probe power and control is provided through a built-in LEMO interface.
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ITA, I1, With Protective Cover
410128101
The i1 ITA's small width and inboard handle increase the side to side stackability. The U-shaped cable clamp allows modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 1.07 in. The removable cover allows easy access to wiring for maintenance and probing. Protective Cover included.
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Inline Micropositioner
SP-150
Signatone's most stable and precise micropositioner for sub-micron probing.
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DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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RF/High Frequency Probes
Everbeing is proud to distribute GGB Industries line of PicoProbes for customers everyday RF probing needs. The popular model 40A has been serving the needs of many high frequency researchers in the sub-40 GHz range. For more information on their products, visit www.ggb.com. If a product they sell is not shown here, we are still able to acquire for you. Please contact us for more details.
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Auxiliary Equipment For Probing Machines
We have a lineup of products that support the probing process.
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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Microwave Testing
50A
The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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Reverse Engineering Software Module
Verisurf Reverse
Verisurf REVERSE is a complete reverse engineering solution offering innovative tools to create CAD models from points, clouds, and meshes.REVERSE optimizes the performance of probing and scanning technologies such as portable arms, laser trackers, structured light, laser scanners, and many others.
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High Voltage Passive Probes
The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
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Active Voltage Probes
Engineers must commonly probe high-frequency signals with high signal fidelity. Typical passive probes with high input R and C provide good response at lower frequencies, but inappropriately load the circuit, and distort signals, at higher frequencies. Active voltage probes feature both high input R and low input C to reduce circuit loading across the entire probe/oscilloscope bandwidth. With low circuit loading, and a form factor that allows probing in confined areas, the active voltage probe becomes the everyday probe for all different types of signals and connection points.
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DDR3 MSO Probes
The DDR3 DIMM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR3 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR3signals for convenient analog probing.
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Manual Probearm for HBM and Flex-Pitch Applications
TPA-GFM
High Power Pulse Instruments GmbH
*Electrically isolated probearm for GND needle contact or general purpose DC, twin-wire HBM or flexible pitch VF-TLP/TLP/HMM/HBM force/sense probing based on the HPPI GF-A flexible pitch setup.*Suitable to mount the GF-A ground fixture needle for flexible pitch measurements. In addition a cable (e.g. for HBM) can be directly connected to the contact pin.*High stability
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Automated Multi-Functional Tester
QTouch 1408 C
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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DDR5 Protocol Debug And Analysis Solution
U4970A
The DDR5 solution bundle provides a systemized hardware, probing, and software solution for DDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Topside Probing for Functional Test Fixtures
Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.
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Probe Card
VersaTile™
Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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Passive Probe, 20:1, 500 MHz, 1.3 M
N2875A
A compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
