Showing results: 61 - 75 of 110 items found.
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40-480-121 -
Pickering Interfaces Ltd.
The 40-480 is designed to simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. It allows automotive I/O devices to be tested for correct operation under adverse conditions. The design includes protection circuits that ensure module damage cannot be caused by wiring faults or UUT failures. Each module can support up to 32 channels and is suitable for both 12V and 24V automotive applications.
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MG Products
Because of the miniaturization of modern electronics , it is important to ensure quality and care with electrical testing. Reliable electrical contact between the test equipment and the testobject (UUT , Unit Under Test) is essential. Specifically for these tests MG Products has developed a series of linear test adapters ( textfixtures ) the MG series. The reliability and accuracy of a contact test adapter is strongly determined by the mechanical construction. Therefore MG Products uses solid aluminum parts.
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In-Phase Technologies, Inc.
Our analog and digital automated test system experience covers a wide variety of applicationsfrom multiple path resistance, capacitance, and inductance testing using various Interface Test Adapters (ITA)to inter-connect multiple customer units under test (UUT). Other systems have included: equipment to monitor and record telemetry, digital data streams, and systems that evaluate packet data using a variety of VME, VXI, PXI, and LXI equipment.
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XJIO -
XJTAG Ltd.
The XJIO boards are expansion units that enable you to improve the test coverage for a Unit Under Test (UUT) by verifying the signals right through to the external connections. They will integrate with your XJTAG test system to provide access to otherwise inaccessible areas of your circuit. With a range of digital and analogue I/O pins on the board, you can improve fault isolation, verify power rail levels, and dispense with costly custom test jigs - even for non-JTAG boards.
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midUTS -
Bloomy Controls, Inc.
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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IFDIS -
Copernicus Technology Ltd
The IFDIS™ uses patented Intermittent Fault Detector technology that simultaneously and continuously monitors every circuit path within a Unit Under Test (UUT) - such as a Line Replaceable Unit (LRU) chassis' interconnects - for intermittent continuity failures that occur for as short as 50 nanoseconds. This state of the art technology is combined with an environmental chamber and vibration table, which simulate the UUT’s operational environment and cause intermittent faults to manifest, creating a system that is unsurpassed in intermittent fault detection.
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Reston Software, llc
We specialize in the development of advanced automatic test applications based on NI TestStand.- Development of NI Test Stand test programs, with code modules in LabVIEW, LabWindows/CVI, Measurement Studio/.NET, C/C++, and ActiveX/COM- Integration of test and measurement instrumentation, switching, and UUT bus interfaces- Customization of step types, process models, operator interfaces, reports, and databases- Integration in the enterprise software infrastructure (XML data formats, databases, web applications, etc.)- Integration of the NI TestStand ATML Toolkit
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CAPture FRA -
Captronic Systems Pvt Ltd
A Frequency Response Analyzer (FRA) is a high precision measurement instrument used to analyse dynamic behavior of circuits & components of control systems in the frequency domain. An FRA generates a sinusoidal signal and inserted it into a unit under test. This signal is measured at the point of insertion using one of the input channels on the FRA The inserted signal travels through the UUT and the same signal is measured simultaneously by the FRA at other input channel. The technique measures the magnitude and phase relationship between output and input waveform as a function of frequency.
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9220 -
NH Research, Inc.
NHR’s Battery Cycler (9220) has low voltage and high current, designed for testing all battery chemistries including lead-acid, lead-cadmium, and other low voltage, high current, large format batteries (LFB) typically used in energy storage systems (ESS). This battery cycler is bi-directional requiring no additional equipment to charge or discharge the unit-under-test (UUT). Additionally, the built-in measurement system eliminates external measurement devices by providing time-stamped digital readings for voltage, current, power as well as Ah and kWh.
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TA-3000 -
Tech-Aid Products
This panel was designed to give the avionics shop the capability to test and troubleshoot many of the GPS, GPS/COMM and FMS units on the market today. Breakout jacks are provided for both analog and digital signals that need to be monitored or simulated. A data port update jack is provided as well as Arinc 429 and RS232 loopback switches. Switches for Gillham altitude are provided as well as fuel flow adjustments. An array of annunciators and configuration switches are also provided to verify those outputs and inputs. Optional UUT configuration overlays also availabl
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GX3500 -
Terotest Systems Ltd.
The GX3500 is a user configurable 3U FPGA PXI card which offers 160 digital I/O signals for specific application needs. The card employs the Altera Cyclone III FPGA which can support clock rates up to 150 MHz and features over 55,000 logic elements and 2.34 Mb of memory. The 3U PXI FPGA card GX3500 can also accept an expansion card assembly which can be used to customize the interface to the UUT – eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system.
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DP-cPCI-4113 -
Data Patterns Pvt. Ltd.
A matrix is the most versatile switch topology. It is made up of rows and columns that connect any input to any output. With matrix switching system, it is easy to connect a number of instruments or sources to various test points of the UUT. The benefit of matrix switching is simplified wiring with which the overall test system can easily and dramatically change the internal connection paths without any manual intervention.DP-cPCI-4113 offers switching matrix in a single slot 6U sized cPCI module with flexibility to configure for 48 cross-points or 72 cross-points on factory selectable basis.
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ScanExpress Runner Gang -
Corelis, Inc.
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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DtifEasy Series -
Marvin Test Solutions, Inc.
DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports MTS' 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
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Corelis, Inc.
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
