Showing results: 46 - 60 of 110 items found.
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NetUSB-1149.1/E -
Corelis, Inc.
The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
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ScanWorks Embedded Diagnostics -
ASSET InterTech, Inc.
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.
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42-784B-101 -
Pickering Interfaces Ltd.
The single slot remote multiplexer versions occupy less PXI panel space and allow the microwave relays to be placed closer to the UUT and other RF test equipment. In some applications it can shorten the length of RF cable runs and improve system performance. The remote multiplexers are supplied complete with a 1.5 m interface cable.
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42-784B-001 -
Pickering Interfaces Ltd.
The single slot remote multiplexer versions occupy less PXI panel space and allow the microwave relays to be placed closer to the UUT and other RF test equipment. In some applications it can shorten the length of RF cable runs and improve system performance. The remote multiplexers are supplied complete with a 1.5 m interface cable.
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FO-1553 -
Avionics Interface Technologies
Extends MIL-STD-1553 bus access to over 1 mile for remote access - Dual redundant, single and dual stream options available - Both Transformer and Direct coupling modes supported - Uses fiber optic 1.0625 Gbps data rates for low latency over long distances - Optical signaling is not affected by electrical noise and interference - Simple and easy to use solution, no software setup or configuration required - Ideal for applications where test equipment is separated from UUT
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JGB Consulting, Inc.
This tester was built for our client with the specific requirement that specific UUTs can be added to the system by our client. We handled developing test software for the first 2 UUTs utilizing an open programming structure that allowed programming modules to be strung together to create test programs for any additional UUT that our client wants to add in the future.
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Flightline/Ramp Air Data Test Sets -
D.Marchiori s.r.l.
The test sets are all digitally controlled through a local or remote keypad and display. The intuitive user interface allows test set functions to be easily controlled with a minimum of key strokes, with all test parameters displayed, and is suitable for both first time and more advanced users. Optionally many of the ADTS can be remotely controlled by a PDA Pocket PC with wireless Bluetooth connection. The intelligent user interface provides protection to both the test set and the UUT. The software rejects entered command values that exceed the pre-selected limit ranges.
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VX405C -
Astronics Corporation
The VX405C carrier provides the mechanical and electrical interfaces between the VXIbus and up to six (6) VITA 12-1996 standard M/MA-Modules. The carrier provides VXI register configuration and access to the M/MA-Module I/O space and memory (if present). Each M/MA-Module is controlled separately and appears as a different logical address in the VXI environment. Over 100 M/MA-Modules are available that can provide custom interfacing to the unit under test (UUT). Up to six (6) unique interfaces may be provided in a single VXI slot.
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JGB Consulting, Inc.
The Automatic Test Equipment is designed to provide R&D and the Production floor with a high quality, reliable and easy to use Test Station comprised of COTS equipment from industry leading instrument manufactures. The measurement switching has low thermal offset allowing for micro volt measurements. The switching also accommodates both stimulus and measurement up to 5 Amps. Also to provide High Speed and Static Digital Stimulus and Response that covers LVDS, 3.3V, TTL, CMOS and Industrial logic families. For Serial communications there are SPI, I2C, RS232/485, USB and Ethernet. The system has nine programmable DC power supplies that are capable of powering both the UUT and the UUT interface separately. The system can interface with a variety of UUT’s via an ITA. Each system comes with the Imperial Test Executive, National Instruments TestStand, CVI, LabView and .NET Runtime.
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XJQuad -
XJTAG Ltd.
XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
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Corelis, Inc.
Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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63800 series -
Chroma ATE Inc.
The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing thereby giving reliable and unbiased test results. The 63800's state of the art design uses DSP technology to simulate non-linear rectified loads with its unique RLC operation mode. This mode improves stability by detecting the impedance of the UUT and dynamically adjusting the load's control bandwidth to ensure system stability. Comprehensive measurements allow users to monitor the output performance of the UUT. Additionally, voltage & current signals can be routed to an oscilloscope through analog outputs. The instrument's GPIB/RS232 interface options provide remote control & monitor for system integration. Built-in digital outputs may also be used to control external relays for short circuit (crowbar) testing.
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AMETEK VTI Instruments
The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
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40-480-221 -
Pickering Interfaces Ltd.
The 40-480 is designed to simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. It allows automotive I/O devices to be tested for correct operation under adverse conditions. The design includes protection circuits that ensure module damage cannot be caused by wiring faults or UUT failures. Each module can support up to 32 channels and is suitable for both 12V and 24V automotive applications.
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FLIR -
CI Systems Inc.
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
