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UUT

assures a constituent's interoperability in a system.

See Also: Unit Under Test, DUT, System Under Test


Showing results: 106 - 110 of 110 items found.

  • Display Color Analyzer

    Model 7123 - Chroma ATE Inc.

    Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station

  • LED Power Driver ATS

    8491 - Chroma ATE Inc.

    1. DC Electronic Load : Chroma 6310A/6330A Series2. Transducer Unit/Module*1 : Chroma A849101/A849102, A849103, A8491043. Time/Noise Analyzer : Chroma 80611 & 80611N card4. Sytem Controller*2 : Industrial PC5. DC Source: Chroma 62000P Series6. Digital Power Meter : Chroma 66200 Series7. OVP/Short Circuit Tester : Chroma 806128. ON/OFF Controller : Chroma 80613*1 : A849101 transfers UUT output signal to voltage signal, and measure by 84911 LED power driver measurement card (200kHz). The optional 80611N Noise card is required for 20MHz ripplecurrent measurement.*2 : The controller includes both 84911 LED Power Driver measurement card and 84903 control card.- 84911: Measure rms current, dimming current/frequency/duty, timing, power & ripple current (200kHz)- 84903 : Provide BL control signal(DC level, PWM, SM bus), and enable ON/OFF signal.C Source : Chroma 6500/61500/61600 Series

  • Cost-Effective ATE System

    PRO RACK ATE - Qmax Test Technologies Pvt. Ltd.

    Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.

  • Combination Board Tester

    ATE QT2256-640 PXI - Qmax Test Technologies Pvt. Ltd.

    Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.

  • Surge Tester with Performance Tests

    MEA MSU100 - MOTOMEA

    *MEA MSU100 Series – Fully automatic SURGE testing of 3 phase and single phase stators, armatures, transformers, and motors, ranging from 10 W to 500 kW, and patented Stator/Rotor performance testing.*MEA MSU101 Series – Customized, fully automatic production line testing system with SURGE testing of 3 phase or single phase stators, armatures, transformers, and motors, ranging from 10 W to 500 kW. The system can be also equipped with automatic testing of H.V. and 4-wire resistance, temperature, and patented Stator/Rotor performance testing.*PERFORMANCE TESTING – MEA patented tests – MEA patented performance testing provides fully automatic Stator/Rotor performance tests, showing the UUT performance as it will be after assembled as motor.*Integrated database.*200 V up to 5 kV programmable impulse.*Option for Partial/Low-Energy Discharge.*Go/No Go tests with comparison detection of: Area Size, Diff Zone, Corona Amount, and Corona Number.*Performances tests comparison at cold and hot state (temperature tests via up to 8 thermocouples).*Interfaces: RS-232, USB, Ethernet (for remote control).*Can be controlled via I/O for OEM applications and easy integration for automatic lines.*Special self-calibration function. No need to send back for the vendor's calibration, saving time and costs.*MSU101 integrated and operated with PC having user-friendly Windows 7 interface, with large database for storing test programs and test results.*Barcode reader, individual print-out of test protocols and labels, of H.V. and 4-wire resistance, and temperature measurement can be integrated into the system.

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