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System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
- Advanced Telemetrics International
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Rotating Telemetry Systems
2100B Series
Advanced Telemetrics International
Are ideal for transmitting coupled data signals from sensors, which are mounted on rotating shafts or machinery to a stationary receiver.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Battery Management Systems Testing
A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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Aircraft Data Systems
Aircraft data systems for commercial and military applications, including Aircraft Interface Devices (AID), avionics I/O computers, avionics test & simulation interfaces, and Embedded avionics interfaces.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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C-Mic Auto Test System
BK9010B
Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.
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Low Voltage Test System
CKT T1
The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Non-Destructive Test Resonant Inspection System
RAM-AUTO
Resonant Acoustic Method is designed to help deliver fully inspected parts, economically and on time. Every component has a unique resonant signature or pattern that reflects its composition.
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Chloride Test System
C-CL-2000
The C-CL-2000 produces results on-site, within minutes that are accurate and comparable to expensive laboratory tests. It measures the electrochemical reaction of a weighted sample placed in an extraction liquid. It automatically shows a temperature compensated reading of percent of chlorides on its digital display. A wide range - from 0.002 to 2% chloride by weight - is covered.
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Supercapacitor Test
The CT3001A/C battery test systems are upgraded from CT2001A/C with higher precision and data logging rate. The tester can be used to run precision tests for coin cells, pouch cells, prismatic cells, and especially supercapacitors (ultra-capacitors). Each tester has 8 independent channel which can be programmed to run constant current charge/discharge, constant voltage charge, constant power discharge, constant resistant discharge, and direct current internal resistance (DCIR) tests.
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Cable Test Instruments
Do you have systems that include a large number of coaxial devices? Our best-selling ATE product line includes a cable test instrument that automates the task of precision testing of coaxial devices. These series of cable test instruments include both a scalar and a vector model. They offer fast precision measurements in a rugged and small portable package. Programming options allow instant test set-up and measurement recall from a potential database of thousands of test devices. Using a user interface that includes clear instructions with picture prompts, anyone can successfully make precision microwave measurements with a simple click of a button.
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Test Development Solution
Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete "turn-key" service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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Central Test Stand Control System for LPS3000 Product Family
LPS 3000 DESK | VP 186010
Maschinenbau Haldenwang GmbH & Co. KG.
The LPS 3000 communication desk has a robust and multifunctional metal housing with an integrated control cabinet to house the electrical components. A lockable drawer for keyboard and PC mouse as well as a storage compartment for other small items is also part of the unit as well as an integrated holder according to VESA standard for holding an all-in-one PC or PC monitor. As an option, it is possible to add side shelves or a PC storage compartment.
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Microcomputer Three-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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CCD Spectroradiometer
LMS-8000A/LMS-8000
LMS-8000A/LMS-8000 LED Measurement System is an automated measurement system for identifying the performance of individual LED. It is designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.
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Three Phase Phantom Load Test Bench
Supreme Instrument Laboratories
Supreme make Phantom Load Test Set is a portable testing accessory designed for field service. It simulates various load conditions usually prevailing in power supply system. The unit offers a practical solution by providing artificial load unaltered by the variation in the power supply mains and adjustable to the complete meter testing requirements.
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Audio Analyzer
BK2110
The BaKo BK2110 Audio Analyzer is a 2 channel Digital Signal Processing (DSP) based system so you can analyze a stereo signal from an acoustic device. And because it is DSP based, it can quickly and accurately test high quality digital audio devices. All test items can be measured simultaneously and you can see them in real time or, using the LAN interface, send them to a computer system to analyze.
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Automated Thermostat Test System
*Transport mechanism moves thermostats to various temperature controlled locations.*Continuously monitored process status*PC controlled transport and measurements*Operator is shielded from 200 - 210 degree F hot water insertion baths*LabVIEW® test/process language
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Carbon Dioxide Sensor, CO2
ENVIROMUX-CO2
CO2 room sensor for periodically unoccupied areas. Measures CO2 in a range of 0 to 2,000 ppm. 0 to 5 VDC output. Continuous automatic air pressure compensation. LED indicators for operation status and system test. Maximum cable length: 1000 ft (305m). Powered by ENVIROMUX-2D/5D/16D. Regulatory approvals: RoHS.
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Multifunction Substation Test Set
STS 5000
STS 5000 is a multifunction substation maintenance & commissioning test system for current, voltage and power transformers designed to perform primary tests requested in substations commissioning. It allows to perform accurate tests on CTs, VTs, PTs and ground grid.
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SoftTest Design Testing Services
We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.
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9-Slot 3U PXI Express Chassis with AC - Up to 8GB/s, All Hybrid
PXES-2590
The ADLINK PXES-2590 is a 9-slot PXI Express chassis equipped with advanced features and functions. Compliant with PXI Express and cPCI Express specifications, the PXES-2590 offers one system slot, one system timing slot, and seven hybrid peripheral slots for versatile test and measurement applications requiring enhanced bandwidth. The hybrid-slot design accepts installation of CompactPCI, PXI, CompactPCI Express, and PXI Express modules into any peripheral slots in PXES-2590, maximizing flexibility. The PXES-2590 is built on a four-link PXI express chassis with 8 GB/s system bandwidth, and 2 GB/s slot bandwidth for all peripheral slots.
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PCI High Density Resistor Card 10-Channel, 8-Bit, 0 To 255 Ohm
50-295A-021-10/8
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
