Showing recent results 1 - 15 of 3916 products found.
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Hitex GmbH
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Ball Systems, Inc.
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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MxDSRC™ - Danlaw, Inc.
The MxDSRC Test System simulates systems in the vehicle that interact with the DSRC radio module to create tests closely replicating real-world scenarios. Its integrated approach allows the DSRC components, such as RF quality and protocol conformance, to be exercised with multiple system components. MxDSRC provides a powerful and easy-to-use framework for testing your DSRC system.
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NFC Xplorer - CISC Semiconductor GmbH
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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ENGMATEC GmbH
We offer complete systems with ICT and functional test, handling system and transport system.An efficient module system allows flexible combination of series equipment and thereby the realization of customer-specific solutions.
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ETS-800 - Teradyne, Inc.
The ETS-800 test system is a next-gen automotive test platform with the industy's highest throughput and fastest time to market. The platform covers a broad range of analog, digital, and mixed-signal applications such as Automotive SOCs, Power Management ICs, and general purpose analog and mixed-signal devices. The system provides an air-cooled test head containing four sectors of instrument slots. Each sector contains 10 slots for a total of 40 test head slots to accommodate a robust suite of instruments.
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ETS-88RF - Teradyne, Inc.
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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USB Explorer 280 - Ellisys Sàrl
The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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J750 - Teradyne, Inc.
Teradyne’s J750 platform is the industry standard for cost-effective test of a broad set of diverse microcontroller, FPGA and digital audio/baseband devices. The system is widely available at more than 50 OSAT locations and is supported by a complete set of production interface solutions for wafer sort and final test.
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Controlar Innovating Industry
As new products emerge and change, the requirements for the industry also increase becoming more and more challenging. Complex products require demanding and versatile test systems, capable of performing complex test cycles. The ultimate goal is to ensure the validation of the final product during the different stages of the production process.
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ETS-200T / ETS-200T-FT - Teradyne, Inc.
The ETS-200T / ETS-200T-FT discrete test platform is built on proven ETS technology and provides true index-parallel testing specifically for turret and rotary handlers. These test systems maximize throughput with pattern-based test techniques based on Eagle SmartPin™ technology coupled with the use of dynamic Cbits for enhanced user control. Both the ETS-200T and the ETS-200T/FT provides a complete test solution from wafer sort to final test for MOSFETs, including integrated control and datalogging for UIL, dVSD, Qg and LCR meter. Raptor™ software reduces program generation by providing a graphical user interface that does not require any programming experience combined with a robust set of test libraries and proven test techniques to increase test volumes and reduce cost of test.
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microFLEX / FLEX - Teradyne, Inc.
The microFLEX and FLEX test systems deliver cost-efficient multisite production test for devices operating under 200 MHz digital speed. Choose microFLEX / FLEX for testing mid-range devices for power management, automotive, audio and video. With microFLEX / FLEX, you optimize capital investment while achieving superior performance and throughput.
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4012 VFTLP+ - Barth Electronics, Inc
The Model 4012 VFTLP+ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.
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4002 TLP+ - Barth Electronics, Inc
The Model 4002 TLP+ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989.
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Griffin III - Hilevel Technology, Inc.
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
