- Applied Instruments, Inc.
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Portable RF Signal Generator
ACE 5400
The ACE 5400 portable RF signal generator has four carriers that can be activated individually or in any combination. Each frequency and amplitude is adjustable by the user. The ACE 5400's basic and straight forward performance is perfect for applications that require a precise, stable RF stimulus. Applications: Testing and aligning CATV return bands; Great for institutional networks.
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VXI Precision PLL Waveform Synthesizer
3152B
The Racal Instruments™ 3152B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3152B is a greatly improved version of a fi eld-proven instrument ideal for VXI test stimulus generation. It replaces the 3152A which is standard on many military and commercial test platforms
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VXI Single/Dual Channel Arbitrary Waveform Generator
3100M
The Astronics Test Systems 3100M Waveform Synthesizer Series combines 300 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3100M is a greatly improved version of a field-proven instrument ideal for VXI test stimulus generation. It replaces one or two of the popular 3152A Precision PLL Waveform Synthesizers, which are standard on many military and commercial test platforms.
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PMC Bus Analyzer / Exerciser
PMC650
The PMC650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
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Benchtop Wiring Analyzer
2115
The Model 2115's compact size makes it the ideal choice for many benchtop or portable test applications. The small size does not mean you sacrifice any functionality. The 2115 delivers a full 1500 volt isolation and 2 amp continuity test stimulus. With the optional AC breakdown test providing 1000 VAC test stimulus, you will meet all test requirements.
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Modulation Distortion Up To 50 GHz
S930705B
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Modulated Signal Creation Software
ArbIQ
The ArbiQ Software package allows wireless design and manufacturing engineers to use the most flexible signal generation tool, the Arbitrary Waveform Generator, to solve almost all their wireless test stimulus needs at baseband or IF/RF levels, no matter if the required signals of analog or digital.
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Stimulus Test Cell
HA7300
The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
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True-Mode Stimulus
S97460B
S97460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port P50xxA vector network analyzer configurations.
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Stimulus Test Cell
HA7200
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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NI-5741, 16-Bit, 1 MS/s, 16-Channel Signal Generator Adapter Module for FlexRIO
782864-01
The NI‑5741 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5741 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5741, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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Modular Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, programmable power module system providing DC, AC and electronic load assets all under control of a single controller. ReFlex Power™ (RFP™) provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test.
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6U VME D/S, S/D, I/O & Comm Board
64CS4
NAI’s 64CS4 is a 6U VME multifunction I/O board designed for applications requiring Digital-to-Synchro/Resolver (D/S) stimulus output, as well as I/O and communication functions. This board contains five intelligent, function module slots. The board can be configured for 10 D/S channels, or for D/S in combination with I/O and communication modules. Additional enhancements include FIFO data buffering for select modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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Optical Sensor Test
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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Manufacturing Defects Analyzer
406A
The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs. The precision Stimulus Measurement Unit provides AC/DC analog measurements that are accurate, stable, repeatable, and reliable.
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Wide FOV Target Projector
The Model 13792 is a broadband portable target projector used for characterizing the performance of a wide variety of infrared sensor systems. The system incorporates SBIR standard components to provide accurate and precise stimulus to sensors under test in laboratory, depot and production line environments. Testing can be automated with the use of IRWindows™ test system controller that reduces test times and cost, while improving the consistency and accuracy of test results.
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CXA-m PXIe Signal Analyzer
M9290A
Deploy a smaller microwave footprint, no trade-off in precision: Rely on fully specified performance up to 26.5 GHz in 4 slots Optimize your balance between speed, sensitivity and accuracy with the choice to operate in swept or FFT modes Perform fast calibrated stimulus response measurement with full-band tracking generator Smooth the transition between R&D, manufacturing, and maintenance: CXA-m is code compatible with benchtop X-Series signal analyzers and ESA spectrum analyzers
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JTAG Boundary-Scan I/O Modules
SCANIO Family
The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Thermal Sensitivity Tester
NTE-2A
The NTE-2A Thermal Probe is a sophisticated, non-invasive device for the clinical evaluation of neuropathy and the assessment of short fiber neurological function. Individual thresholds are compared to normals to statistical normals. These results provide an accurate means of tracking chronic changes in small fiber nerve function. It can be used for pain studies and in any application were a variable, accurately-controlled temperature stimulus is required. The NTE-2A is often used in conjunction with the Vibratron II to assess peripheral neuropathies.
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PCI D/S, S/D, I/O & Comm Board
76CS3
NAI’s 76CS3 is a PCI/PCIe multifunction I/O and communication board designed for applications requiring Digital-to-Synchro/Resolver (D/S) and Digital-to-LVDT/RVDT (DLV) stimulus output, as well as I/O and communication functions. This full-slot board contains five independent, function module slots. The board can be configured for 6 separate D/S channels, or for D/S in combination with I/O and communication modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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RF-Ready DC Fixture
The RF-Ready DC fixture provides space for mounting RF input and output matching circuits. Hence, it is possible to tune up the assembly at a remote test station, such as a network analyzer, to peak performance and then run the life test with DC stimulus. The matching structures also allow incorporation of more complex stabilization structures.
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Graphical Debugging for Verilog, VHDL, and C++ Simulators
BugHunter Pro
BugHunter uses the SynaptiCAD graphical environment and supports all major HDL simulators. It has the ability to launch the simulator, provide single step debugging, unit-level test bench generation, streaming of waveform data, project management, and a hierarchy tree. The unit-level test bench generation is unique in that it lets the user draw stimulus waveforms and then generates the stimulus model and wrapper code and launches the code. It is one of the fastest ways to test a model and make sure that everything is working correctly. The debugger also has exceptional support for VCD waveform files.
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ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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64-Channel 250kSa/s USB Modular Multifunction Data Acquisition
U2355A
The U2355A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or a...show more -
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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NI-5742, 16-Bit, 1 MS/s, 32-Channel Signal Generator Adapter Module for FlexRIO
782865-01
The NI‑5742 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5742 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5742, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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PMC and PMC-X Bus Analyzer / Exerciser
PMC850
The PMC850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Bus Analyzer / Exerciser
PCF850
The PCF850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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COTS VME Board Tester
*Developed for support of Virginia Class Submarine at the COATS Integration Facility.*Provides Stimulus and Measurement Subsystem (SMS) to control, monitor, and evaluate VME assets used in the Non-Propulsion Electronic System (NPES) of the submarine.*Provides Native Environment Subsystem (NES) that simulates the operational configuration of typical NPES installations, and permits the test and evaluation of several types of VME assets.
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Modular Power
RFP Chassis
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
