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Stimulus
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MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Portable Functional Near-Infrared Spectroscopy System For Research
LIGHTNIRS
Shimadzu Portable functional Near-Infrared Spectroscopy (fNIRS) System for Research* Near infrared light, which readily diffuses easily through biological tissue, can be used to measure localized blood oxygenation levels of the brain to monitor where activity occurs in response to a task of stimulus. The portability of LIGHTNIRS allows visualizing brain function activity in real time in a more natural state than other methods. Consequently, it is being used in a wide range of applications including medical research, developmental psychology, education, cognitive science and engineering.
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Protocol Analyzer and Exerciser
Keysight's protocol test solutions for each technology typically consists of both protocol analyzer application as well as a stimulus solution, such as an exerciser or traffic generator. Keysight's protocol test solutions combine multi-protocol analysis, traffic generation, performance and conformance verification to debug, validate and optimize your designs using high speed protocol standards.
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DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
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MEMS Optical Sensor Test
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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Nodal Impedance Analyser
QT-Hi1
Qmax Test Technologies Pvt. Ltd.
QT-Hi1 is an innovative Nodal Impedance Analyzer, which uses the industry’s proven V-I trace techniques of learn and compare of nodal impedances which are represented as VI Curves. It uses innovative Auto Best Curve fit technique an intelligent software alogorithm which enables automatic selection of the best fit value of Voltage, Source Impedance and Frequency of the stimulus waveform. The compact size with re-chargeable battery makes it an ideal companion for on-field applications. The wide 8” touch screen graphical display makes this tool more valuable in test and repair industry at all times.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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VXI Precision PLL Waveform Synthesizer
3152B
The Racal Instruments™ 3152B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3152B is a greatly improved version of a fi eld-proven instrument ideal for VXI test stimulus generation. It replaces the 3152A which is standard on many military and commercial test platforms
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PCI and PCI-X Bus Analyzer / Exerciser
PCI850
The PCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Stimulus Test Cell
HA7300
The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
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Graphical Debugging for Verilog, VHDL, and C++ Simulators
BugHunter Pro
BugHunter uses the SynaptiCAD graphical environment and supports all major HDL simulators. It has the ability to launch the simulator, provide single step debugging, unit-level test bench generation, streaming of waveform data, project management, and a hierarchy tree. The unit-level test bench generation is unique in that it lets the user draw stimulus waveforms and then generates the stimulus model and wrapper code and launches the code. It is one of the fastest ways to test a model and make sure that everything is working correctly. The debugger also has exceptional support for VCD waveform files.
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MEMS Inertial Test
Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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Advanced Circuit Card Automated Test
ACCAT
The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Signal Generator
Tektronix signal generators cover a wide range of applications, from replicating sensor signals to creating RF and the fastest high speed serial data signals. Each versatile signal generator can create a virtually unlimited number of signals - analog or digital, ideal or distorted, standard or custom. From the world's only direct synthesis of high-speed serial data waveforms for simplified receiver testing, to the world's most versatile arbitrary function generator for common stimulus signals, Tektronix has a signal generator to meet your debug challenge.
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200 MS/s Waveform Generator & Dual 50 MHz Pulse/ Timing Generator
3172
The Racal Instruments™ 3172, a 200 MS/s Waveform Generator and Dual 50 MHz Pulse and Timing Generator, combines multi-instrument density and highfrequency performance in a single-slot, C-sized VXIbus format.Waveform output in the range of 100 μHz to 30 MHz with 16-bit vertical resolution (12-bit vertical for 3171 emulation) and pulse output to 50 MHz make the 3172 a powerful solution to a variety of test stimulus requirements.
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VXI Precision Waveform Synthesizer
3151B
The Racal Instruments™ 3151B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a singleslot VXIbus format. The 3151B is a greatly improved version of a field-proveninstrument ideal for VXI test stimulus generation. It replaces the 3151A+ and other similar units which were standard on many military and commercial test platforms.
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PMC Bus Analyzer / Exerciser
PMC650
The PMC650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
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RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Digital Wideband Transceiver Analysis
S94610B
Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Stimulus Test Cell
HA7200
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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True-Mode Stimulus
S96460B
S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
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ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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CompactPCI & CompactPCI-X Bus Analyzer / Exerciser
CPCI850
The CPCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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ARINC HSI / ADI Test Fixture
TA-2000
The TA-2000 test fixture is a combination panel that incorporates all the standard capabilities of the legacy CTS-11(ADI) and CTS-12(HSI) panels and much more. This panel is married to our model TA-1001 dual synchro transmitter/API panel thus allowing for local stimulus and alignment of the instruments synchros and resolvers. The panel provides for testing of both superflag(28v) and low level meters through a matrix of switching that will allow testing of all meters simultaneously or just individually. The low level meter drive circuit also incorporates an automatic mode that will continuously oscillate the L/R and Up/Dn pointers.
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Arbitrary Waveform Generator
AWG70000B
The AWG70000B Series Arbitrary Waveform Generator represents the cutting edge in sample rate, signal fidelity and waveform memory, making it ideal for design, testing and operations of complex components, systems and experiments. With up to sample rate of 50 GS/s and 10-bit vertical resolution, it delivers the industry's best signal stimulus solution for easy generation of ideal, distorted and “real-life” signals.
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Digital Pattern Generator
Wave Gen Xpress
A digital pattern generator is an essential stimulus source for almost every type of digital device: digital and mixed-signal ASIC, FPGA, microprocessors and microcontrollers. The digital pattern generator can be used early in the design cycle to substitute for system components that are not yet available.
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Electromagnetic Environment Simulators
A2PATS® Products
Our A2PATS Family of Products are electromagnetic environment simulators built upon Textron Systems' open-architecture direct digital synthesizer technology, coupled with our proven user interface. Our easily programmable, plug-and-play modular architecture uses identical, phase-coherent, direct digital Synthetic Stimulus Instruments (SSIs) as the radio frequency (RF) source for all signals. These modular commercial RF Sources are easily configured in our commercial cabinets. Four standard configurations are available including single-cabinet, multi-cabinet, mini-A2PATS, and A2DSG™.The A2PATS Family consists of numerous commercial products including but not limited to A2PATS, A2DRI™, A2DSG and A2EOSTIM.
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Engineering/Development System
ULTRA L
The ULTRA L is a high performance “Lab” system that provides thermal conditioning, mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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High Volume Manufacturing Handling, Stimulus
ULTRA P
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
