Showing results: 151 - 165 of 785 items found.
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K-series -
IMV Corporation
K-series, high excitation force water cooled vibration simulating test systems fully developed by IMV.Advanced performance from the K-series will significantly improve the test environment.
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Mark-10 Corp.
Mark-10 offers a wide and unique range of motorized force measurement and torque measurement test stands. Motorized stands offer a significant advantage over manual test stands by providing constant test speed. Some models can be programmed for advanced test sequences to accommodate demanding applications. All motorized test stands carry the CE mark. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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Sigma HF -
Xyztec
- For high force and large area- Typically for IGBT, power modules and batteries up to 1000 kgf- High axis speed- Deep access up to 80 mm- SEMI S2 safety cabinet with visual feedback- Flexible positioning of multiple work holders
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EMT Series -
Shimadzu Corp.
High-speed repeated load tests can be carried out with a maximum velocity of 2 m/s, and maximum stroke of ±50 mm, using clean and quiet electromagnetic force as the driving power, without the use of oil. The test space is large so environmental tests can also be carried out using the constant temperature tank (option).
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TBS SERIES -
Transducer Techniques, Inc
The TBS Series thin beam force sensors many different parameters found in medical instrumentation, home appliances, process control, robotics, and automotive are exceptionally suited for small load measurements. They are designed to measure and many other high volume applications. A specially developed integrated strain gage includes all balancing, compensating and conductive elements and is laminated to the beam to provide excellent stability and reliability.
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PHD-HMM-48-1 -
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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HORIBA, Ltd.
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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NK-20 -
Shenzhen Chuangxin Instruments Co., Ltd.
*Easy to be operated and can be installed with all kinds of test stands and clamps.*Peak holding function and continuous.*One year free maintenance.*Compact and artistic packing, easy to transit and stock.*Two kind of unit dual show at the same time,*don't need unit conversion. *NK Series: Newton and Kilogram dual unit; *NLB Series: Newton and Pound dual unit; *ALB: Pound and Kilogram dual unit.*Needle indicates, easy to read, high accuracy.
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Shenzhen Chuangxin Instruments Co., Ltd.
*Easy to be operated and can be installed with all kinds of test stands and clamps. *Peak holding function and continuous. *One year free maintenance. *Compact and artistic packing, easy to transit and stock. *Two kind of unit dual show at the same time, *don't need unit conversion. *NK Series: Newton and Kilogram dual unit; *NLB Series: Newton and Pound dual unit; *ALB: Pound and Kilogram dual unit. *Needle indicates, easy to read, high accuracy.
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CNR CT -
Com-Ten Industries
Functionality, accuracy, and precision formerly reserved for expensive and complex material testing equipment are now available with Andilog Force Gauges. The functionality of material testers previously reserved for research or development applications are now available to the production floor with the introduction of the Centor Touch Force Gauge.
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Series 526 -
Aries
LO-PRO file Zero Insertion Force Socket. A choice of 24, 28, or 40 pin count devices can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. A metal cam provides strong, smooth action as it moves to a positive stop, compressing the double-sided contacts, ensuring a gas-tight seal.
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Series 547 -
Aries
Universal SOIC Zero Insertion Force Test Socket. Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. Accepts SOIC gull-wing and J-lead devices, up to 44 pins on .050 [1.27] lead pitch, body widths from .150 to .600 [3.81 to 15.24].
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90061-XH Series -
HITEC Sensor Solutions Inc.
This system is ideal for field measurement and data logging of forces between the tips of resistance spot welders. The system consists of a handheld sensor and portable readout/ data logger (PMAC 2000).
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Series 537 -
Aries
Universal PLCC ZIF Test Socket Live Bug Type. This Universal PLCC ZIF (zero insertion force) Test Socket will take seven sizes of PLCC footprints with Aries insert plate, Part No. XX-537-20. Data Sheet No. 10012, available seperately.
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Series X55X -
Aries
Universal Zero Insertion Force DIP Test Socket. All pin count sockets go into PCB with either .300 or .600 [7.62 to 15.24] centers. Sockets can be soldered into PCBs or plugged into any socket. Socket fits into Aries or any competitive test socket receptacle.