Showing results: 91 - 105 of 785 items found.
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Flex-Mount -
Nanosurf
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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FlexAFM -
Nanosurf
For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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AFM Heron -
Del Mar Photonics, Inc.
New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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NX-Hivac -
Park Systems Corp.
Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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NX10 -
Park Systems Corp.
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
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Wafer Series -
Park Systems Corp.
Park's Smart ADR provides fully automated defect review and identification, enabling a critical inline process to classify defect types and source their origin through high resolution 3D imaging.Designed specifically for the semiconductor industry, Smart ADR is the most advanced defect review solution available, featuring automatic target positioning without the need for labor intensive reference marks that often damage the sample. The Smart ADR process improves productivity by up to 1,000% compared to traditional defect review methods. Additionally, the new ADR capability offers up to 20x longer tip life thanks to Park's groundbreaking True Non-Contact™ Mode AFM technology.
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Lloyd Material Testing
The ergonomic gauges from Chatillon are ideal for functional capacity evaluations and basic muscle strength measurements where economy and ease-of-use are essential. Simplicity is a key design criterion for these ergonomic gauges. They are an excellent, low cost solution for tensile or compression testing.
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DMA+ Series -
Metravib
*The new DMA+ series instruments are dynamic testing machines based on a innovative concept of one-piece high rigidity test frame.*They are dedicated to the accurate analysis of the viscoelastic properties of most advanced materials.
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DMA 3200 -
TA Instruments
The DMA 3200 combines decades of cutting-edge fatigue and world-leading Dynamic Mechanical Analysis technologies into a unique and highly versatile testing platform. The patented, frictionless Electroforce® motor technology, superior mechanical design, efficient environmental control, and wide variety of clamping systems deliver superior data accuracy for the broadest range of applications.
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3DM Serirs -
Park Systems Corp.
Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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XE7 -
Park Systems Corp.
Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
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XE-PTR -
Park Systems Corp.
Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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925 -
TRICOR Systems Inc.
The Model 925 is a low cost force-distance tester. It communicates with a Windows™-based PC to send data into an Excel format. The data can then be viewed and analyzed in tabular or graphical format. Once in the Excel format, the data can be transferred or used in any of the multiple Excel operations. This line of displacement-force test stations has a positional resolution of 0.0025 mm (0.0001 inches). Your test department will appreciate the high accuracy readings provided over the complete travel range.
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IMADA, Incorporated
SW-1X data acquisition software is for force gauges with RS-232 output.SW-2X data acquisition software is for collecting force and displacement data from RS-232 output force gauges, with a -s test stand.Force Recorder data acquisition software is for ZTS & ZTA force gauges with USB output. Force Recorder Pro collects both force and displacement data with ZTA gauge and FA test stand.