Showing results: 721 - 735 of 787 items found.
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Hanatek Instruments
Coefficient of friction is also known as COF testing. The Hanatek Advanced Friction Tester is the most comprehensive tool available for measuring the coefficient of friction of plastic film, printed cartons, packaging substrates or paper. This flexible instrument can also be used to measure and display the frictional values of any flat surface including plastics textile, coated metals and leather. In addition to providing static and dynamic slip values for a surface, the instrument allows the full friction force output to be displayed, stored and compared. This unique ability helps a manufacturer to relate the feeding and running speeds of a product to its surface characteristics.
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PCE Instruments
The hardness tester products you will find at PCE Instruments (PCE) are used for determining surface hardness. Each hardness tester uses a standard method of measurement. The measuring principles of most hardness tester devices are based on either the penetration of a diamond indentor into the material being tested or a calculation related to the force of the rebound after striking the tested material. However, material hardness can also be measured accurately through ultrasonic testing. Each hardness testing method has its benefits and will allow for the precise measurement of material hardness in accordance with the technical specifications of the hardness testing instrument.
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EPS Series -
Jinan Testing Equipment IE Corporation
EPS series Electro Fatigue testing machine are fast acting table-top testers ideally suitable for performing static and dynamic fatigue tests on a variety of materials and components. These electro-dynamic machines use a linear electric motor with an adjustable upper cross-head of a stiff dual column frame. The electro-dynamic actuator is connected to single phase power, which resulting in a clean low maintenance solution. With dynamic force capacities, the Electro Fatigue testing machines are used to evaluate the mechanical properties of biologic materials, composites, orthopedic fixation devices, prostheses, spinal constructs, stents, dental implants, elastomeric materials and others.
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NESTOR -
Rohde & Schwarz GmbH & Co. KG
R&S®NESTOR is a Windows 10 based platform for analyzing cellular networks via the air interface. It is deployed by law enforcement agencies, intelligence services, armed forces and regulatory authorities. R&S®NESTOR is used together with R&S®TSMX mobile network scanners and QualiPoc smartphones, which offer the most advanced technology worldwide. The software supports all relevant applications that public authorities and security organizations need to gather information about cellular networks. R&S®NESTOR is used in vehicles, trains, aircraft, drones, on ships and on foot.
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32-76 -
Testing Machines, Inc.
Testing Machines Inc., is globally recognized as the leading supplier of Coefficient of friction instrumentation. Our NEW 32-76 coefficient of friction tester uses advanced digital force signaling and high speed data acquisition software providing unmatched precision and repeatability in COF testing. Improved features include a color touchscreen display and intuitive software user interface for easy navigation and test method storage. Based on the horizontal plane method, coefficient of friction and Slip properties aid in the evaluation of chemicals and additives used to create, monitor or minimize the degree of friction between two contacting test specimens or surfaces.
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W5643A -
Keysight Technologies
The W5643A DDR5 2-wing BGA interposer for DDR5 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W5643A is the smallest BGA interposers for DDR5 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding up to 5GT/s for protocol analysis and up to 4Gb/s for DQ capture. U4208A and U4209A probe/cables connect any W5643A DDR5 BGA interposer directly into the U4164A logic analyzer module using 61-pin high density zero insertion force (ZIF) connectors that attach to the W5643A BGA interposer wings.
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KRD60 series -
CME Technology Co. Ltd.
KRD60 Series 3 DOF simulation table simulates various mechanical, electrical, and electronic products installed on ships, seaplanes, and other equipment to perform sway and tilt tests to determine the ability and structural integrity of the product to withstand severe sway and tilt requirements. The tilt test is mainly applicable to large-angle tilt caused by ship damage, manipulation, imbalance in loading and unloading, and wind. The sway test is mainly applicable to long-term swaying of the ship due to external forces such as wind and waves, which must be maintained normally or products that work reliably, and products that have a significant impact on their performance in a rocking environment.
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GAO Tek Inc.
GAOTek proudly presents an extensive and wide range of Leeb hardness testers for sale to the United States, Canada and globally. A Leeb hardness tester is used mainly in the manufacturing industry to test the structural integrity of a metal object by applying a definite amount of force on the object. Structural integrity is crucial information as in some cases it is treated as a specification or standard that companies must meet in order to release a product. It may also be used to set a limitation or restriction for a specific device or item. Our testers are designed to ensure standards are met by providing users with a variety of features to make the process of testing and monitoring results efficient and convenient.
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Smartech Inc.
• Automatic wake-up by moving the measuring spindle (system S.I.S)• Sleeping mode after 20 min. of no use (system S.I.S)• Position memorized in sleeping mode (system S.I.S), absolute system*• Water protected for heavy-duty work with coolants and lubricants, protection rating IP67 according toIEC 60529, even connected• Measuring range 0-161 mm covered with 5 instruments only• Set of 3 micrometers 0-102 mm available• Quick displacement of the measuring spindle 12 mm / rotation• Adjustable measuring force 5N / 10N (versions 903.030X)• Repeatability and reproducibility never reached before• Thimble in polyacetal-copolymer
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CX-112 -
Shenzhen Chuangxin Instruments Co., Ltd.
1. Jointed test finger probe (Figure 2 / Test Probe B / IEC 61032)This is a precision probe made in accordance with all IEC standards. Examples are IEC 61032, 60950, 61010 and 60601; and it is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is Delrin®. Handle is designed to accept either a banana jack or a force gauge.It is no longer necessary to have a separate probe for the medical safety standard. This one probe will meet all the different requirements that are in the IEC standards.
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imc Test & Measurement GmbH
Whether it’s in a vehicle, on a test stand or monitoring equipment and machinery - imc data acquisition systems are easy to operate and will help you become more productive and profitable. Our products are suited for work in mechanical and mechatronic applications. They handle up to 100 kHz per channel, are compatible with almost all signal sources and sensors, and can measure nearly all physical quantities such as pressure, force, speed, vibration, noise, temperature, voltage and current. The spectrum of imc data acquisition systems ranges from simple data acquisition via integrated real-time calculations, to the integration of models and complete automation of test stands.
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imc Test & Measurement GmbH
Whether it’s in a vehicle, on a test stand or monitoring equipment and machinery - imc data acquisition systems are easy to operate and will help you become more productive and profitable. Our products are suited for work in mechanical and mechatronic applications. They handle up to 100 kHz per channel, are compatible with almost all signal sources and sensors, and can measure nearly all physical quantities such as pressure, force, speed, vibration, noise, temperature, voltage and current. The spectrum of imc data acquisition systems ranges from simple data acquisition via integrated real-time calculations, to the integration of models and complete automation of test stands.
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MANAGER -
Beijert Engineering BV
Today more complex probe cards are being used. More pins,higher density and larger array requires a new approach inprobe card analysis. With the soaring cost of new generationprobe cards, repair of defective cards becomes an necessity.BE Precision Technology offers all capabilities with the newMANAGER V. Future proof, up to 450 mm full wafer contactprobe cards can be analyzed with up to 88.000 test channels.High-end materials are used to stand extra tough requirements—such as 500 mm diameter diamante viewing window,ultra stiff carbon flip-table, high power Z–stage to generate 600Kg of contact force
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Tenmars Electronics Co., Ltd.
1. Can measure DC and AC(40-500Hz) magnetic field.2. DC N/S polarity of magnetic field display.3. After machine component are processed, remain the magnetism to measurement.4. Magnetic application products, the intensity of magnetic field measurement.5. After processing the stress with stainless steel material, remain the measurement of the magnetism6. Magnetic force measurement of the magnetisable material.7. Various steel products brought magnetic measurement naturally.8. Electrical home appliances products, the magnetic field intensity measurement of the motor9. Magnetic field intensity measurement of the permanent magnet.10. Exceed the leakage magnetic field of conducting the magnetite to measure
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IDPS750 -
Salland Engineering
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
