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Standard Test Finger
SMT-1
It with Protection against electric shock device. It according to IEC60335, IEC60884, IEC61032, IEC60529, IEC60065, IEC60035, IEC60950, EN60529, EN60950, GB4706, GB7000, GB9706, UL507, VDE0470, etc.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Leakage Current Tester
TOS3200
The Leakage Current Tester TOS3200 is designed to perform leakage current (touch current and protective conductor current) tests on general electrical equipment but not medical electrical equipment.It enables you to conduct tests that conform to the requirements of the applicable IEC, UL, JIS, and other standards, as well as the Electrical Appliance and Material Safety Law. The memory in the main unit stores the 51 types of test conditions laid down in the IEC/JIS standards for information technology equipment, household electrical appliances, audio, video electronic apparatus, luminaires, motor-operated electric tools, and electrical equipment for measurement and control and in the Electrical Appliance and Material Safety Law, thereby enabling you to conduct standard tests with simple panel operation.
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Breakout Box
T1000-9
T1000-9 breakout box is our most compact breakout box, using dual 9 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 18 test points plus a ground jack. All test points use standard size 4mm banana jacks. Ideal for continuity testing, isolation testing or signal capture and monitoring.
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Oil Tan Delta Test Set
The Oil Tan Delta (OTD) is a laboratory instrument, which measures the Tan Delta, Resistivity and Relative Permittivity of insulating liquids. These tests give a wider picture of the overall quality of the insulating oil, and will indicate if there is any contamination. Megger has developed features of the OTD to ensure that productivity levels within laboratories are maximised. OTD test sets are supplied with sixteen standard test sequences pre-installed, to support a set of international standards.
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EMC Test System
An electric product might cause the malfunction to other electric appliances by discharging the emission noise from it, or is oppositely caused the malfuction by the emission noise from other electric appliances. The former is checked by the EMI test and the latter is checked by the EMS test. The international standard like the CISPR standard is provided so that such an accident should not happen, and the manufacturer must declare by themselves beforehand that their product meets the standard. The generic name of the EMI test (Electro-Magnetic Interference) of the emission measurement and the EMS test (Electro-Magnetic Susceptibility) of the immunity
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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NUV-PL SiC Defect Inspection System
VS6845E
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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6TL19 Off-Line Base Test Platform
H71001900
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Off-Line Testing Platform
6TL29
6TL29 Testing platforms are based on the modularity concept; its construction is completely modular and scalable, allowing the user to take advantage of a powerful and reliable platform with a minimum investment.The platform is compact and due to its reduced footprint can be integrated easily into any production line. It’s ideal for High-Mix Low-Mid Volume production environments.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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PLD ISP Feature, GTE 10.00p
K8220B
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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TestCentre
ARC has experience with complex, commercially available test executives that are available for high volume production needs. Often times, when you don’t need the horsepower of a full featured executive, you are left with creating a specifically defined test program or crafting your own test sequencer. Rather than go down this path and spending your time on architecture, TestCentre brings a simple, yet elegant solution to this all-common problem. Used in many of ARC’s standard test stations, the robust, sequence based architecture of TestCentre, allows you to focus on the testing task at hand. While having some of the more advanced features found in high-end test executives, TestCentre, when mixed with RF analyzers and PXI based test solutions are a great, low cost solution to help solve your everyday testing requirements. Along with TestCentre and an ARC supplied rack-based test platform, your test challenges can be solved in doing circuit card testing, assembly/module level testing, or depot repair troubleshooting tasks.
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Performance Audio Analyzer
U8903B
Measure your most demanding audio devices with higher accuracy and a low residual distortion of -110 dB See the real performance of your devices with the highest resolution audio measurements available Automate testing with built-in test sequences Meet standards more easily with pre-configured POLQA and PESQ measurements Simultaneously measure/view up to eight channels on a single screen in real time Configure for specific applications with digital audio interface (AES3/SPDIF and DSI) and Bluetooth audio measurements options
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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DC Power Supply With Scope, Arbitrary Waveform Generator, And Automotive Application Features Bundle
E36154AGVX
The Keysight E36154AGVX consists of a Keysight E36154A DC power supply, a Keysight E36150ADVU Scope View and arbitrary waveform generation (AWG) capabilities, and a Keysight E36150ATMU Automotive Standards Testing Capabilities with Enhanced Programming Speed, ISO Preset Library, Playback Simulation and E-Logging features. The E36154A includes single-output and auto-range capabilities, 30V, 80 A, 800 W, and LAN and USB interfaces.
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Modular Functional Testing Platform
OTP2
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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ESD - Simulator
SESD 216
The test generator SESD 216 simulates electrostatic discharge as defined in the standard IEC / EN 61000-4-2. Depend on the Equipment Under Test (EUT) and the test set-up for laboratory tests the IEC standard shows two test methods
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STANAG3910/EFEX Test And Simulation Module for Standard Ethernet
ANET3910
STANAG3910/EFEX Test and Simulation module for Standard Ethernet. The ANET embedded Linux Operating System gives the unique capability to run the optional PBA.pro Engine right in the box. Another option is the ANET-ADK onboard software development kit where users create run-time applications (e.g. STANAG3910/EFEX to Ethernet Converter, STANAG3910/EFEX to Ethernet Gateway) to execute right in the box. For wireless applications, an ANET compatible USB Wifi dongle is optionally available.The capability to execute Python scripts in the ANET is a standard feature. For applications with multiple ANET devices AIM offers the ADock ANET Docking Station to host up to 4 ANET modules.
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Electric Vehicle Test Solution
As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.
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Standard Current Transformers
Measurements International Ltd.
Single Range, Highest Permeability, Wide Measurement Range, Negligible Current Errors, High Accuracy.
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NF-Series Standard Models
The E-DRIV® NF-Series standard models feature an adjustable RPM setting on the tool and a selectable Soft Start mode. Engineered for high volume manufacturing applications the brushless motor design ensures durability and reduces the standard maintenance costs associated with brush type electric screwdrivers. The NF power tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management assures product quality, cost savings and a reduction in overall ESD failures.
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Standard Climatic Test Chamber(Environmental Chamber)
Guangdong Test EQ Equipment co., Ltd.
Primarily used for accelerated damp heat testing, alternating damp heat testing, constant humidity testing, as well as high/low temperature routine testing, cold resistance testing, low-temperature storage, and adaptability testing under rapid or gradual temperature changes in industries such as aviation, aerospace, electronics, instrumentation, electrical products, materials, components, equipment, and complete machines. It is particularly suitable for Environmental Stress Screening (ESS) testing of electrical and electronic products or for enhancing production efficiency. It enables analysis and evaluation of performance and behavior under simulated environmental conditions.
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Attribute Testing
Critical attribute testing during manual or automated processing is essential to any manufacturing success. Tech Group has developed many testing solutions both standard and custom-made for mainly electronics and mechanical industry. Our modular designs give the advantage to offer short lead-time, cost efficient solutions according to your exact needs.
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Standard RF Fixture
The standard RF fixture supports both pulsed and non-pulsed operation. It employs SMA input/output connections. For RF output powers over 10W, an N-type connector may be used to replaces the SMA connector because of its power-handling capability.
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Standard Loggers
Our standard loggers can measure up to 13 parameters. Numerous configuration options allow for maximum customization for your measurement needs. In addition to our conductivity, temperature and depth sensors, many others, including third-party sensors, can be used with our recorders. Measure salinity. Measure tide and waves. Altitude & Attitude Logger.
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Working Standard Shunts
CSW
CSW shunts are rated to 100 % continuous current with no loss of accuracy. They are largely immune from connection errors common to many shunts. All CSW shunts include ISO17025 accredited calibration through full current range.
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Satellite ATE
MS 1123
Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
