Test System Integration
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EW System Test Set
MS 1107
PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
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±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Vibration Test Systems
G-0 Series
The G-0 Series Vibration Test Systems consist of all-round, rugged, high quality vibration generators energy-efficient solid-state PWM power amplifiers, ideally suited to any vibration tests requiring high reliability such as MIL, IEC and JIS standardized tests for aircraft, automobiles, electronic components, electric apparatus and aerospace equipment.
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Fully Automatic Rubber Tensile Testing System
Compactly Integrating Functions Required for Quality Control of Rubber Shimadzu Fully-Automatic Tensile Testing System This system provides full automation, from measurement of specimen dimensions, supply to the testing machine, and fixing of chucks to measurement of extension between standard lines and data processing. The system can be used for continuous nighttime testing, which helps save labor costs.
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SMD Array Type LCR Test Fixture
16034H
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Battery (EV) Automatic Test System
Landrex Technologies Co., Ltd.
Battery (EV) Automatic Test System
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Engine Test Systems
Today''s engines and components require testing in a repeatable manner over a wide variety of conditions, ensuring that the final manufactured product consistently meets customer demands for performance and durability. The need for engines to be both economical and - above all - environmentally friendly, places fresh challenges on developers.
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Battery & Electrical System Testing
12-0200
Vehicle Battery Systems fitted to modern cars require a complex system to control and maintain the best charge and discharge rates which not only ensures the longest in service life but also that systems such as Stop/Start operate correctly. The 12-0200 gives the operator access to all the functions complicated and time-consuming manufacturer scan tools have to perform the same function but in a fraction of the time. On average the total time required by the technician to reset a system will be 30 seconds.
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Advanced Burn-in and Test System for packaged parts
ABTS-Li
High power logic individual temperature control
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Conducted Immunity Test System
Conducted RF immunity tests acc. to IEC/EN61000-4-6 and BCI tests acc. to ISO 11452-4 and MIL-STD 461 CS 114 Signal generator,RF-power amplifier, RF-power meter and directional coupler (optional) in one 19”-caseStand-alone operation possible with optional available netbookControl-software includedMost important parameters are shown on an integrated displayAutomatic EUT-monitoringOperation via USB port of a PC or NotebookComplete range of CDNs available
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Signal Integrity Evaluation up to 26.5 GHz
N5222BT
The N5222BT provides the N5222B 26.5 GHz PNA, application software including PLTS and enhanced TDR, and accessories for signal integrity evaluation of cables, backplanes and BGA packages.
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Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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Industrial-quality chambers for combination testing with vibration systems
AGREE Series
For years AGREE chambers have been the workhorses of the environmental test chamber industry. Originally created to meet military test standards, their flexible design has made them suitable for a wide variety of applications. Fast temperature changes of 5 to 25°C/m. are possible, even with significant loads. The chambers have a removable floor, allowing integration with vibration test systems.
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Mixed Signal Test Systems
MTS1010i
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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RSP-2T Test System Interface Probe
RSP-2T
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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OLED Life Time Test System
A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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In-Line Full Automatic Testing System
ALMAX
Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
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Wafer Auto Line Integration
The line is used for semiconductor wafer grinding. It carries out material matching and distribution, automatic loading and unloading, auto focusing and positioning and many other functions. The grinding precision is 2μm(3-sigma). It is also capable of collecting and analyzing real-time production data and interfacing with MES system.
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Cable/Harness Test System with Rack-Mounted Switching
CKT1175-20
The CKT1175-20 is a high-voltage wiring analysis system that features rack-mounted switching matrices. This system is expandable in 100 test point increments to 96,000 test points, and available with a wide variety of adapter cable interface connectors, with the standard interface being the CKT MAC interface system.
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Automated Test System
Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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Annual testing of Automatic Identification System
AIS
The purpose of an annual testing is to determine that AIS is operational as defined in appropriate performance standards - the International Maritime Organization (IMO) Performance Standard (MSC 74(69)) and IEC standard, IEC 61993-2: Maritime Navigation and Radio Communications Equipment and Standards Automatic Identification Systems (AIS).
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DAQStream - Integrated Rack Systems
DAQStream rack systems deliver unmatched high-density, scalable, processing intensive solutions for the aerospace and defense industry. Supported applications include: scene generation, digital simulation, and hardware in the loop testing.
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GC System
Agilent's Gas Chromatography systems provide modern laboratories with new performance expectations by increasing analytical performance, reducing cost of ownership, and saving capital expenditure investing. These benchtop, on-line, and portable GC systems (available for in-lab and field analysis) are all supported with Agilent's 10-year Value Promise Guarantee demonstrating our commitment to long-term reliability.
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PLD Systems
Pulsed Laser Deposition
Is a versatile thin film deposition technique. A pulsed laser (~20 ns pulse width) rapidly evaporates a target material forming a thin film that retains target composition. This unique ability of stoichiometeric transfer of target composition into the film was realized first by the research team led by Dr. Venkatesan at Bell Communications Research, NJ, USA, nearly 30 years ago while depositing high temperature superconducting (YBa2Cu3O7) thin films. Since then, PLD has become the preferred deposition technique where ever thin films of complex material compositions are considered. Another unique feature of PLD is its ability for rapid prototyping of materials. The energy source (pulsed laser) being outside the deposition chamber, facilitates a large dynamic range of operating pressures (10-10 Torr to 500 Torr) during material synthesis. By controlling the deposition pressure and substrate temperature and using relatively small target sizes, a variety of atomically controlled nano-structures and interfaces can be prepared with unique functionalities.
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Optics Test Systems
Mobile Wedge Angle Sensor With Positioning System
Optik Elektronik Gerätetechnik GmbH
Mobile wedge angle sensor for determining the wedge angle and the radius of curvature of glass panes, eg windshields of automobiles, helicopters, airplanes or rail vehicles.
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Test Solutions For Integrators
Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
