Dynamic Test Systems

H3TRB | HTGB (HTGS) | RTGB (RTGS) - SET GmbH (Steiner Elektronik Technologie)

Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.