Control Systems
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High-Speed 4-TAP USB 2.0 JTAG Controller
USB-1149.1/4E
The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
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3U 7th Generation Intel® Core™ i5-7440EQ Processor-Based PXI Express Gen3 Controller
PXIe-3977
The ADLINK PXIe-3977 PXI Express embedded controller, based on the 7th gen Intel® Core™ i5 processor, is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications.
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LabVIEW Development Systems
Base--The instant productivity of graphical development for DAQ and instrument controlFull--A rich set of routines for mathematics, signal processing, and signal generationProfessional--The solution for professional developers who need code deployment or validationLabVIEW suites--LabVIEW Professional plus industry-specific add-on software
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Single or Dual DDC ACE 1553 Controller
CPCI-1553-DDC-2
Single or Dual DDC ACE 1553 Controller, Bus Controller, Remote Terminal, Bus Monitor Modes.
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JTAG Live Controller
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
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PCIe Mini CAN Controller
PCie-Mini-CAN-FD
The PCIe-Mini-CAN-FD is a PCI express controller with an integrated CAN FD transceiver supporting data rates up to 8Mbps. The CAN FD controller meets the specifications of the ISO11898-1:2015 high speed Controller Area Network (CAN) data link layer and meets the physical layer requirements of the ISO11898-2:2016 high speed CAN specification.
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VPX Processing System
CRS-D4I-3VB1
4-slot, SWaP-reduced, rugged VPX Intel base plate cooled data processing system that can be applied across various applications including civilian and military unmanned vehicles, manned commercial and military aircraft, helicopters, over- and underwater research vessels, ground vehicles, and locomotives.
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cRIO-9066, 667 MHz Dual-Core CPU, 256 MB DRAM, 512 MB Storage, Zynq-7020 FPGA, 8-Slot CompactRIO Controller
783169-01
667 MHz Dual-Core CPU, 256 MB DRAM, 512 MB Storage, Zynq-7020 FPGA, 8-Slot CompactRIO Controller - The cRIO-9066 is a rugged, fanless, embedded controller that you can use for advanced control and monitoring applications. This software-designed controller features an FPGA, a real-time processor running the NI Linux Real-Time OS, and embedded user interface capability. Additionally, the cRIO-9066 features an SDHC slot and a variety of connectivity ports, including one tri-speed RJ-45 Gigabit Ethernet, one USB host, one USB device, and one RS-232 serial. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
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LabVIEW Professional Development System
ntegrate hardware from a variety of measurement instruments and devicesIntuitive graphical programming syntax to simplify automationBuild custom user interfaces for engineering applicationsBuilt-in algorithms for signal processing, analysis, math, and PID controlSoftware engineering tools to debug, validate, and deploy codeOne-year SSP membership for technical support, online training, and software upgrades
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Mezzanine System
5658
ECM P/N 5658 provides eight channels of 16 bit current measurement in the 0 to 25 milli-amp range. Each channel allows independent common mode voltages from -100 volts to +100 volts. Current detection is accomplished with a precision 100 ohm current sense resistor, creating a voltage drop of 2V in the current loop at 20 milli-amps.
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Eddy Current Dynamometer
EC Series
Specifically designed for small displacement diesel engines, the Eddy Current (EC-Series) engine dynamometer features in-line eddy current absorption units in a robust, compact frame. The air-cooled eddy current absorbers eliminate the need for an expensive water recirculation system and most engines being tested can be cooled with a standard closed-circuit radiator system. This compact air-cooled design results in a minimal environmental impact and the ability to be easily relocated with no need for a permanent installation. When combined with PowerNet LT, our fully automated dynamometer control system, all of your testing needs can be performed at the touch of a button.
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Mezzanine System
3560
ECM P/N 3560 provides four independent I2C channels. For ease of development a PCA9564 interface IC converts parallel data to I2C serial communication. Additionally an LTC1694 I2C accelerator IC decreases the rise time of the passively pulled up I2C bus allowing for greater capacitive loading or higher bus speeds. Each channel is comprised of SCL, SDA and two Grounds.
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Laser Diode Characterization System
58620
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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6U CompactPCI Rear Transition Module with Intel® Ethernet Controller I350-AM2
cPCI-R6100 Series
- Intel® Ethernet Controller I350-AM2- Up to four Ethernet GbE ports- Dual display, DVI and VGA- CompactFlash and SD card slots for onboard storage
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NI-7931 , Xilinx Kintex-7 K325T FPGA, Controller for FlexRIO
783763-01
The NI-7931 features a programmable FPGA and embedded processor optimized for deployment in the field for reliable, extended operation for applications requiring advanced I/O capability with embedded signal processing. It includes a Xilinx Kintex-7 325T FPGA, 2 GB of onboard DDR3 DRAM, and a dual‐core ARM Cortex‐A9 processor running NI Linux Real‐Time.
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Mezzanine System
5174
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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Low Temperature Retraction Tester
EKT-100TRB
EKT-100TRB-Low Temperature Retraction Tester is designed in accordance with ASTM D1329, ISO 2921 with fully automatic and computerized controlling system.
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cRIO-9058, 1.33 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Artix-7 A100T FPGA, Extended Temperature, 8-Slot CompactRIO Controller
787880-01
1.33 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -40 °C to 70 °C, Artix-7 A100T FPGA, Extended Temperature, 8-Slot CompactRIO Controller - The cRIO-9058 is a rugged, deployable controller for data acquisition and control applications. It offers Intel Atom dual-core processing, an Artix-7 FPGA, and eight slots for C Series modules. It runs the NI Linux Real-Time operating system with access to the I/O through NI-DAQmx drivers or with LabVIEW. The controller provides precise, synchronized timing and deterministic communications over the network using TSN, ideal for distributed measurements and control. This controller offers two Gigabit Ethernet ports, one USB 3.1 host port, one USB 2.0 device port, a trigger line, and a μSD card slot for storing data locally. The registered trademark Linux® is used pursuant to a sublicense from LMI, the exclusive licensee of Linus Torvalds, owner of the mark on a worldwide basis.
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Single or Dual Summit Controller
CPCI-1553
• Operating temperatureCommercial: 0 to +55 °COptional: -25°C to +80°C• Non-operating: -40°C to 85 °C• Airflow requirement: .5 CFM• Humidity: 5 to 90% (non-cond.)• Altitude: 0 to 10’000 ft
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JTAG USB Controller
NetUSB-1149.1/E
The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.
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EMS Test System
TS9982
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Positioning Test System
TS-LBS
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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PCIe-Mini Module
PCIe-Mini-1553
• Controller of dual redundant (A/B channel) 1553 communications• PCIexpress x1 Lane Interface• DDC 1553 E• SRAM 64KX16• Programmable bus controller, remote terminal, or monitor terminal modes• Multiprotocol Support of MIL-STD01553A/B Notice 2 and STANAG 3838• +3.3V Operation and Logic• On-chip transceivers/transformer• Selectable 10,12,16 or 20 MHz Systems Clocks
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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PCIe-Mini Module
PCIe-Mini-1553-2
The ALPHI PCIe-Mini-1553-2 uses DDC Total-Ace communication device as its 1553 bus controller, or remote terminal with concurrent Bus monitor terminal. Dual controller has a Dual redundant channel with built in transceivers and transformer. The controller has the capability to emulate up to 31 RT addresses simultaneously. The PCIe-Mini-1553-2in RT mode can filter on RT address, T/R, Subaddress. The PCie-Mini-1553-2 is offered is extended temperature. The board format is a full PCIexpress Mini board.
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PXIe8862, 2.6 GHz 8-Core PXI Controller
787987-01
The PXIe8862 is an Intel Core i7 8Core embedded controller for PXI Express systems. You use the PXIe8862 for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe8862 includes two 10/100/1000/2500BASET (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, two Thunderbolt 4 ports, and other peripheral I/O.
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PXI Resistor Module 2-Channel 2R to 65.5k with SPDT
40-293-133
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
