LitePoint RF Test System

The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.

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Digital and Mixed-Signal Test Solutions

Teradyne, Inc.

A digital device processes electronic signals that represent either a one (on) or a zero (off). The ‘ones’ and ‘zeros’ represent data. Each one or zero is referred to as a bit and a group of 8 bits equals a byte

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Image Sensor Testing

IP750Ex-HD Family - Teradyne, Inc.

The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.

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SoC Tester

UltraFLEXplus - Teradyne, Inc.

The UltraFLEXplus combines new instrument and software capability with a revolutionary tester infrastructure that provides a step-function improvement in throughput and engineering efficiency – all while leveraging the cumulative test IP developed over the UltraFLEX’s 15 year history .

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High Efficiency, Low-Cost Test for Less Complex Signal Devices

J750Ex-HD Family - Teradyne, Inc.

Microcontroller Units (MCUs) are used in automobiles, mobile electronics and robotics. As you go through your day, dozens of MCUs are in your electronic devices working to provide unique features and Teradyne’s J750 family most likely tested them. With a growing installed base of over 6,000 test systems and widely available at more than 50 Outsourced Assembly and Test (OSAT) locations, Teradyne’s J750 is the industry standard for high volume test of low-cost devices.

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LitePoint RF Test System

Topics

Digital and Mixed-Signal Test Solutions

Image Sensor Testing

SoC Tester

High Efficiency, Low-Cost Test for Less Complex Signal Devices