Constant Distance SECM

VS-STYLUS - Ametek Scientific Instruments (Ametek SI)

In collaboration with SENSàSION, we are pleased to offer the Soft Stylus Probe contact mode technique developed by Professor Hubert Girault and co-workers of the Laboratory of Physical and Analytical Electrochemistry (LEPA) at the École Polytechnique Fédérale de Lausanne (EPFL) for constant distance SECM. The probe technology offers the following benefits:

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Scanning Electrochemical Systems

Ametek Scientific Instruments

The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements. Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments. VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.

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Scanning Electrochemical Microscope

VS-SECM (DC And AC) - Ametek Scientific Instruments

The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.

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Scanning Vibrating Electrode Technique

VS-SVET - Ametek Scientific Instruments

The Scanning Vibrating Electrode Technique uses a single wire to measures voltage drop in solution. This voltage drop is a result of local current at the surface of a sample. Measuring this voltage in solution images the current at the sample surface. Current can be naturally occurring from a corrosion or biological process, or the current can be externally controlled using a galvanostat.

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Localized Electrochemical Impedance Spectroscopy

VS-LEIS - Ametek Scientific Instruments

The VersaSTAT 3F applies an AC voltage to the sample emerged in electrolyte. This "global" voltage generates AC current to flow at the electrode / electrolyte interface. A dual-element probe is positioned in solution close to the surface of the sample. The electrometer measures a differential voltage measure between the two measurement elements as a measure of local voltage-drop in solution. This voltage-drop exists in solution because of current flow from local reactions at the sample, the resistance of the electrolyte and the spatial separation of the dual measurement elements.

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Scanning Kelvin Probe Microscope

VS-SKP - Ametek Scientific Instruments

The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.

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Scanning Droplet Cell

VS-SDC - Ametek Scientific Instruments

Scanning Droplet System (SDC) uses a compact peristaltic pump to force electrolyte through a small diameter tube and into a specifically designed head. This PTFE-based SDC head is machined to allow electrolyte to flow past an installed Reference Electrode and then to a port at the base of the head.

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Non-contact Optical Surface Profiler

VS-OSP - Ametek Scientific Instruments

The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.

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Constant Distance SECM

Topics

Scanning Electrochemical Systems

Scanning Electrochemical Microscope

Scanning Vibrating Electrode Technique

Localized Electrochemical Impedance Spectroscopy

Scanning Kelvin Probe Microscope

Scanning Droplet Cell

Non-contact Optical Surface Profiler