Memory Test Systems
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Product
Shared Memory Network PCI & PCIx Interface
PCI-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Compatible with PCI & PCIx Host System Slots - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
High Current Test System
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HIGHVOLT Prüftechnik Dresden GmbH
High current test systems are used to test the thermal stability of equipment and components. The test system induces a current in the test object causing it to heat up. Therefore, the test object is designed as a shorted circuit. The high current test system measures the temperature of the test object at various points, in addition to the current. As a special feature, the temperature that the test object should reach can be specified and the amount of the current can be automatically calculated by the HIGHVOLT test system.
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Product
High Voltage Isolation Test Systems
HT 9460 and 9464
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Accurate and non-destructive production testing of ac Isolation Voltage and Partial Discharge. With over 450 systems installed worldwide the 946X series of test systems are the standard and system of choice used by the majority of semiconductor manufacturers that produce optically isolated devices.
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Product
Immunity Testing Systems
CIS Series
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The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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Product
Three-phase Fully Automatic Test System
TS41
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Calmet Smart Calibration Devices
The Calmet TS41 test system consists of a three-phase reference meter of accuracy class 0.02% (or 0.04%) and an integrated three-phase current and voltage source up to 3x120A/600V. It makes possible automatic testing of electricity meters in meter test stations
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Product
Test System
NFC Xplorer
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The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Product
Memory Recorder
MR8847A
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High-speed 20MS/s, 16-channel, Fully Isolated Memory Recorder for On-site Jobs and R&D
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Product
AVL Battery Test Systems
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In modern electrified powertrains (xEVs), huge demands are placed on batteries. These electrochemical energy storage and conversion devices must meet market requirements such as long-lasting high power and energy performance, and dynamic charge and discharge processes.
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Product
Automatic Test Equipment for Electronic Systems
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BAE Systems has designed and manufactured comprehensive test solutions for both military and commercial applications for more than 40 years. During this time, we have kept pace with the rapidly evolving market to deliver integrated, commercial-off-the-shelf solutions to our customers. Our test equipment consists of an open architecture, adaptable core that can easily integrate with additional instrumentation. This enables the development of unique configurations that support the full spectrum of avionics and electronics in use today.
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Product
4 Quadrant Dynamometer Test System
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Magtrol’s 4 quadrant motorized dynamometers provides expanded testing flexibility over a typical braking dynamometer. With the ability to bring the motor under test (MUT) to synchronous RPM before beginning a test, repeatability is improved. Since the motor windings are at ambient temperature before starting a ramp test, wattage is more consistent.
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Product
Meter Testing System
ASTel
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Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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Product
Bipolar/FET/Diode Dual Head Production Test System
36XX
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Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Product
Vision System
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Axiomtek's vision system series is designed to focus on vision inspection, guidance, measurement and identification applications. The products have already gone through a complete set of compatibility experiments to eliminate potential integration problems, significantly helping users reduce development and staffing costs as well as accelerate system deployment in factory automation environment.
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
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Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Product
Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
Memory And Storage
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Intel provides technically advanced products that support every level of computing—from data center workloads to enthusiast usage. Intel® Optane™ memory creates an accelerated bridge between memory and storage. Intel® Solid State Drives (Intel® SSDs) provide storage flexibility, stability, and efficiency.
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Product
Blackbody System
IR-2106/301
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Infrared Systems Development Corp.
Infrared Systems Development introduces a NEW Low-Cost 6” x 6” Thermo-Electrically cooled / Heated blackbody source with a temperature range of 5ºC to 150ºC. The solid Copper Emitter plate provides superior uniformity and energy emission. Our Proprietary High Emissivity Black Coating provides >0.95 uniform Emissivity from 0.8 to 30 um.
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Product
Closed-Loop Servohydraulic Test Bench Control System
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Closed-loop servohydraulic test bench control system is based on digital devices of ZETSENSOR series with CAN interface. This system has fast response characteristics, high precision, and compact dimensions. The system enables comprehensive control of the servo drive in automated mode in compliance with the set test parameters such as pressure (force), displacement, along with the parallel control of other system parameters such as temperature, pressure, filter plugging, oil pressure, etc.
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Product
Blackbody System
IR-518/301
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Infrared Systems Development Corp.
The IR-518 Radiation Source provides an accurate, stable source of infrared radiation of known flux and spectral distribution. It can be used as a standard radiation source for the calibration of other laboratory sources, detectors, or other infrared devices requiring calibration against a standard.
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Product
Characterization System
System 7700
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
EV Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
5V cell equipment adopts Sinexcel innovative circuit design + high-speed DSP complex algorithm, the detection process supports multi-gear switching; The equipment integrates voltage, temperature, pressure and other auxiliary channels, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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Product
MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Product
Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
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ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
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Product
Industrial Flash & Memory Solutions DDR4 Memory
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SQRAM DDR4 memory modules perform at superior speeds of up to 3200 MT/s, a 20% reduction in power consumption, and higher capacity than DDR3.
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Product
Micropositioning Systems
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Mad City Labs micropositioning stages are designed to complement our high precision nanopositioning systems. Our micropositioning stages provide extended range of motion and are designed to provide a stable platform for our nanopositioners. Our product line includes high precision manual stages and fully automated, programmable stages for use with optical microscopes or stand-alone instruments.
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Product
Measuring System
K-5201MA
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To solve this problem, the following composition of the complex was chosen in the test stand conditions:laptop in a protected version PanasonicTBCF-53;measuring block - NIUSB-4431 with a set of vibroaccelerometers AP-2037;vibration excitation system LW 139.151-30 with mounting kit for the disk.The software of the complex provides the following functions:spectral analysis of vibration signals in the regulated range;search for natural excitation frequencies in given frequency ranges;Formation of database of existing disks;generation of reporting forms;and etc.
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Product
Probe Systems
Mini-PS4L
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The mini-PS4L series of probe systems are built using a similar concept as our patented Probe System for Life (PS4L) Architecture. The base system is built on a 300 mm x 300 mm metric breadboard and that allows the user to configure the system to meet the application and budget.
