Memory Test Systems
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System Layout
CARGOMASTER®
The parts that build up the system. Signal Control unit, the Computer Unit, Power Supply and Tank Sensors.
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Blackbody System
IR-563/301
Infrared Systems Development Corp.
IR-563 is a ideal source for the Near (1-3 um), Mid (3-8) and Far (8-30+ um) infrared bands. The IR-563 has been the industry standard 1000º C blackbody for more than 30 years, and continues to provide excellent service to infrared applications throughout the industry. The IR-564 extends the temperature range of the IR-563 to 1200º C by changing cavity materials to Silicon Carbide and high purity Alumina ceramics, otherwise the two units are virtually identical.
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Laser Distance Meter for 40m With 10 Memories and Min. Measurement
MS-LDM340
*Measuring distance: 0.05 to 40m*Accuracy: ±1.5mm (±0.06in)*Unit conversion: mm/in/ft*Laser classification: Class 2*Laser type: 635nm <1mW*Dynamic measurement*Area, volume measurement*Pythagorean proposition measurement
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VIP IFEC & CMS Systems
Astronics is the smart choice for inflight connectivity, entertainment, and cabin management solutions for VIP, VVIP, and business aircraft. From the highest-performing global SATCOM connectivity for optimum productivity and entertainment, to our Avenir IFE/CMS line that incorporates the latest technologies to deliver native 4K video distribution through the highest bandwidth Ethernet network system in the industry, Astronics is ready with a cutting-edge solution that delivers the ultimate VIP experience.
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Cost-Effective ATE System
PRO RACK ATE
Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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Laser Systems
Laser systems (laser range finders, laser designators, laser receivers, laser trackers, laser pointers) are one of crucial technologies for defense/security sector. Laser systems have also found mass applications outside defense sector. Testing laser systems is needed for both manufacturers, maintenance workshops and final users for a set of different and important reasons. Hi-tech test equipment can help significantly in manufacturing, maintenance, training, purchase optimization, and optimal use of night vision devices.
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Life Cycle Module Testing System
LCN
Full featured test system for quality control and R&DLife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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Development System
FE-900
# Emulates Philips P89LPC932 Microcontrollers# Real-Time and Transparent Emulation up to 12MHz# 8K Emulation Memory# Real-Time Trace# Uses Philips Bond-Out Technology# Ceibo Windows Debugger and Keil uVision2# High-Level Support for all C/C++ Compilers and Assemblers# On-Line Assembler and Disassembler# Target Board, ISP Programmer and Power Supply Included# PLCC-28 Emulator Plug Included (TSSOP-28 Optional)
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Off-Line Seat Operation Base Test Platform
6TL23
The 6TL23 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation since there’s space for the operator’s legs under the fixture receiver.
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Test And Measurement System
TM400
The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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In-Circuit Testing and Test Engineering
Teradyne Z1820
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Inspection System
Pixie
3-D Metrology for automation. Pixie is a standard system for automated optical quality inspection. Pixie can be configured with 2 to 5 servo driven axis movement and the high-speed measurement capabilities make it suitable for inline and stand-alone solutions.
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Surge Voltage and Surge Current Testing Systems
HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
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High Power & Voltage Pack Testing System
FTF
Drive simulations with standard Electric Vehicle tests: FUDS, SFUDS, GSFUDS, DST and ECE-15LDrive Cycle TestingIntegration with motor test benchesCycle testing of EV/HEV Battery Packs
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GPS Systems
High accuracy 100Hz GPS with Real-time Kinematics (RTK) correction for the most precise position-based test and measurement applications.
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LT-300A Aging-Life Test System For LED Luminaires
Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Stator Test Systems
Automation Technology's STS-3800 has become the "gold standard" in Stator Testing Equipment. The STS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems, it is backed by the industry leading two-year limited warranty. The STS-3800 offers the most comprehensive testing of stators and fields available.
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Integrated 5G mmWave Test System
IQgig-5G
The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
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M-Class System
ACQUITY UPLC
The ACQUITY UPLC M-Class System delivers the performance you expect from nano- to microscale separations with the usability of an analytical-scale UPLC system. Each part of the system was designed and tested to deliver the right flow for the right column. The ACQUITY UPLC M-Class System provides excellent performance with overflow rates from 200 nL/min to 100 µL/min and a range of column inner diameter (I.D.) from 75 µm to 1.0 mm.
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3-in-1 Test System
CIBANO 500
CIBANO 500 combines a micro-ohmmeter, timing analyzer, and a coil and motor supply. All important CB tests on all types of CBs can be carried out even when a station battery is not available.
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Impulse-Calibration-System
KAL1000 Series
The impulse calibration system KAL1000 is a modular system to perform tests on complete impulse voltage measuring systems and on digital recorders for the measurement of high impulse voltages and impulse currents. The modular design allows an optimal KAL-configuration depending on the actual application.Additional, this modularity allows to up-grade or modify and existing KAL1000 system in case of changing or additional requirements
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Battery and DC System Testing
HAOMAI Electric Test Equipment Co., Ltd.
Testing for battery and DC power systems.
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Development System
FE-RE2
* Emulates Atmel AT89C51IE2/RE2 and others * 128K Code Memory * Real-Time Emulation * Frequency up to fmax 60 MHz * 3V and 5V Support * ISP and X2 Mode Support * Windows Debugger For C, C++ and Assembler * RS-232 and USB Interface * C Compiler and Assembler
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Dielectric Material Test Fixture
16453A
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Reflective Memory Node Card
PMC-5565PIORC
The PMC-5565PIORC Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board may be configured with 128 MB or 256 MB of onboard SDRAM.The local SDRAM provides fast Read access times to stored data.
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GSM RF Interference Test System
Guangzhou Jumho Electric Co., Ltd.
Cell phones and other wireless devices radiate powerful electromagnetic fields that can cause interference and noise in microphone signals. The interference and noise is called RF interference, which is an unwanted “signal” that occurs at the same time and frequency as a data signal. The RF interference disrupts the flow of data and degrades quality-of-service. Jumho Electric provides a cost-effective RF interference test system for GSM interference level measurement of wireless microphone.
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12/24 CH Insertion Loss/Return Loss Automatic Testing System
CA3201
UC INSTRUMENTS CA3201 12/24 CH INSERTION LOSS/RETURN LOSS AUTOMATIC TESTING SYSTEM is special designed for MPO/MTP fiber cable and multi-channel fiber optical devices like PLC device. It also can be easy changed into AWG DWDM devices testing system ifwe change 1310 /1550 nm light source into UC INSTRUMENTS’ tunable laser source.
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Automatic Electrical Protective Equipment Test Systems
CBC-50С (CBC-100C)
Automatic systems CBC-C-series are designed for high-voltage withstand testing of electrical protective equipment and insulated hand tools. The tests are carried out with AC voltage (CBC-50C: UAC ≤ 50 kVRMS; CBC-100C: UAC ≤ 100 kVRMS) at industrial frequency (f = 50 Hz).
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Metrology System
Echo
The Echo system is a comprehensive in-line metal film metrology tool for single and multi-layer metal film measurements in leading-edge logic, memory, advanced packaging, and specialty semiconductor devices.
