Memory Test Systems
-
Product
Arc System
ACQUITY
-
The ACQUITY Arc System is a quaternary-based, modern LC system for scientists working with established methods who are looking for the versatility and robustness required to bridge the gap between HPLC and UHPLC while continuing to support validated assays.
-
Product
System Solutions
-
The modular and flexibly expandable system solutions from aixACCT Systems ensure that you always measure the characteristics of your samples independently of the operator and according to the specifications of the entire system.
-
Product
Embedded System Test Automation Software
ECU-TEST
-
ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
-
Product
In Vivo Systems
-
To achieve low minimum detectable activities with count times as fast as one minute.
-
Product
Analysis System
Pegasus (EDS-EBSD)
-
The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
-
Product
Leak Test System
NorCom 2020
-
The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
-
Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
ADAS System
-
Is the precise physical alignment, testing, and electronic aiming of sensors that collect data to inform your vehicle’s advanced driver assistance systems (ADAS).
-
Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
-
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
-
Product
Transportation Simulation Test System
KRD50 series
-
KRD50 series transportation simulation test system is to simulate the actual road conditions such as shocks and vibrations during the transportation of various items of a specific load, and to evaluate the effect of the actual working conditions on the loading, unloading, transportation, packaging, sealing or internal structure of the goods. In order to assess or confirm the products and packaging.
-
Product
Manufacturing Test Only System
MTO
-
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
-
Product
Immersion Systems
-
Immersion systems are the workhorses of the industry. Our latest NXT machines have shown the ability to run in excess of 6,000 wafers per day, with an average five percent productivity increase over 12 months, supporting our customers' value requirements. We continue to innovate our immersion systems to meet the requirements of future nodes, benefiting from commonalities in R&D with our EUV program, while ensuring the platform’s extendibility through System Node Enhancement Package upgrades. Thanks to these packages, any NXT system can be upgraded to the latest technology.
-
Product
Test Adapters / Aeroflex Test System
52xx / 5300
-
We develop and manufacture test adapters for your existing interface including documentation and test program
-
Product
Semiconductor Test System
-
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
-
Product
Standalone with Drop-In Test Systems
800 Series ATE
-
The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.
-
Product
Pneumatic Vertical Shock Test System
KRD11 series
-
KRD11 series pneumatic vertical shock test system is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and bump test, can perform conventional half-sine wave, post-peak sawtooth wave, trapezoid wave and other waveform shock tests.
-
Product
Development System
FE-51CC01
-
* Emulates Atmel T89C51CC01/2 and T89C51AC2, T89C5115 * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
-
Product
Dynamic Component Test Systems
-
RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
-
Product
Bipolar/FET/Diode Dual Head Production Test System
36XX
-
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
-
Product
OPTICAL PHASE NOISE TEST AND MEASUREMENT SYSTEM
-
OEwaves’ HI-Q® Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
-
Product
Projectile Speed Measurement Test System
-
This test equipment will help manufacturers, trading standards, consumer bodies, CPSC, CPSIA laboratories and regulatory authorities to check that they meet the requirements of ASTM F963 - 08 Standard Consumer Safety Specification for Toy Safety and ISO 8124-1:2009 projectile Safety of Toys –Part 1:Safety aspects related to mechanical and physical properties. It may also be valuable for certain sports equipment and related tests.
-
Product
Scanning Systems
-
Electro-Optical Products Corp.
We combine deep proprietary technology expertise and competencies in photonics, with a proven ability to solve complex technical challenges to manufacture various optical scanning systems and sub-systems tailored to our customers' demanding applications.
-
Product
Antenna Test Systems and OTA Chambers
-
With our well-established experience in innovative solutions based on top-quality engineering, Rohde & Schwarz provides you with leading antenna test systems and OTA chambers.
-
Product
Portable Ruggedized Test System
BADGER
-
Badger systems utilize NI's CompactRIO (cRIO), Single Board RIO (sbRIO), and/or CompactDAQ (cDAQ) hardware. The Badger product line offers high speed data acquisition/control and flexibility in an industrial package. Badger chassis and instrumentation have a 50 g shock ratings and a wide -40 to 70 °C operating temperature. These systems are ideal for automotive, industrial automation, remote monitoring, field service, and advanced control applications.
-
Product
Surge Voltage and Surge Current Testing Systems
-
HIGHVOLT Prüftechnik Dresden GmbH
Pulse Voltage Test Systems are used for surge testing on transformers, cables, gas insulated switchgear (GIS), arresters, and other high voltage equipment.
-
Product
Raman Spectrometer System
IndiRAM CTR Mini Series
Spectrometer
IndiRAMTMCTR-mini Series Raman Spectrometer system is one of the best solution for carrying out reaction-monitoring or insitu analysis of the samples as it is a compact system capable of moving oform one place to another but at the same time maintaining high resolution and SNR
-
Product
200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
-
Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
-
Product
Camera Barrel Test System
BK8612
-
We designed the BK8612 2 Channel Noise Test System to provide noise and vibration testing for your digital camera barrel DC Motors. Because it is based on the BaKo BK2120B DAQ, it is capable of monitoring a microphone and an accelerometer concurrently to obtain data from the motor. Because you can change the parameters of functions and limits, it is versatile but still quick and easy to set up. In addition, you can look at data in real time and also store it for future analysis. Easy to use and set up, fast and accurate; if you need to maintain the quality of your camera barrel motors, this is the tester you want.
-
Product
Safety Testing
-
Underwriters Laboratories Inc.
As the global safety science leader, our safety offerings and expertise are unparalleled. We can help you engineer safety into your products throughout your development process, reducing costs and challenges associated with innovative offerings. Our testing and certification services focus on helping our customers create a safer, more secure and sustainable world. Our mission of "working for a safer world" drives everything we do. Leverage our offerings and insights to build trust and confidence in your products and services.
-
Product
Upstream Monitoring System
X16/KWS & VAROS 107
-
Fast internet services, VoIP, online gaming … an interferencefree return path is essential for a high-quality broadband DOCSIS connection. The combination of a special KWS version of the real time X16 Kronback Tracer spectrum analyser in the headend and the successful portable TV analyzer VAROS 107 as a field device provides a system that ensures high signal quality in the upstream frequency range.
