Memory Test Systems
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Measuring Systems
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Select your individual Meter Test System (MTS) from our single components. Hints for useful combinations of devices can be found on the corresponding product page.
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Digital Interconnect Test System, Reference Solution
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When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Automation Systems
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Omron's extensive portfolio of PLC and MAC controllers, networking solutions, remote IO, IPC and HMI technology support a fully integrated application
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ADAS System
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Is the precise physical alignment, testing, and electronic aiming of sensors that collect data to inform your vehicle’s advanced driver assistance systems (ADAS).
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DTP Systems
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A versatile range of products designed to support long distance signal transmission over shielded twisted pair cable in AV switching environments.
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Mini-MRI Systems
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Magnets for Magnetic Resonance Imaging (MRI) are required to generate a high homogeneity field over the imaging volume which remains stable in time.
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Fuel Cell Test Systems
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For 100Watt DMFC single cell testCompact sizeConsists of electronic load, gas/liquid controller, humidifier and methanol pump etc.
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Spectrometer Systems
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ZEISS spectrometer systems leverage our longstanding experience in process optimization and expertise as a pioneer in scientific optics. Regardless of whether it’s in the lab, on the production line or in the field, plan your next project with ZEISS and benefit from:
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Sound Level Test System
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In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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DynoLAB Test Cell Supervisory System
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SAKOR Technologies’ DynoLAB™ data acquisition and control systems offer reliable, cost effective automation of all types of dynamometer test systems. As with all SAKOR products, the DynoLAB system undergoes a continuous program of upgrade and improvement, regularly expanding and enhancing DynoLAB’s capabilities.
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Monitoring Systems
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Sensors alone do not provide the complete answer to measuring vibration and using the data to better understand machine health. Monitran offers a short range of monitoring systems that can be used not only to measure vibration but to display values, constantly watch the levels and take action in case of excess and dangerous vibrations.
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Product
160MHz Test System
IQxel-MW 7G
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Platform solution for 802.11 a/b/g/n/ 802.11ac, 802.11ax, and 802.11be testing in the 2.4 and 5 GHz and 6 GHz bands and the most popular wireless connectivity standards (Bluetooth®, Bluetooth® 5, Bluetooth® 5.1, Bluetooth® 5.2, Zigbee, Z-Wave) as well as LPWAN technologies (Sigfox, LoRa).
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C-Mic Testing System
BK3010
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The BaKo BK3010 is our main C-Mic tester. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is so easy and intuitive, we based the BK3012 D-Mic Tester on it. It is also the model for our BK9010B Fully Automatic C-mic Tester.
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Modular Breakout System 37-Pin D-type Plugin Module for 40-293
95-293-001
Modular Breakout System
The 95-293-001 Plugin Breakout Module is designed to be fitted to a PXI 40-293 Programmable Resistor Module as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Various Systems
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Our experienced and highly qualified engineering team enables Innco systems to offer a wide range of possibilities to design positioning systems according to your specifications or measurement applications.The control of the system, singular or complex can be realized with our standard CO3000 controller, which allows connections to your measurement systems by GPIB or LAN.
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Product
Power Cycling Semiconductor Life Test System
ITC52300
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The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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Discrete Device Test System
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capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Streaming System
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When intermittent errors need to be captured with high speed camera and streaming systems we offer mobile and fix installed systems combined with a powerful software. Slow down your fast processes and gain insight into what happens."
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300mm Single Touchdown Burn-in and Test System
FOX-15
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Up to 15 wafers at a time Known Good Die solution Lowers production cost
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Function Test and In-Circuit Test
CT350
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ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Product
Programmable Read Only Memory (PROM)
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Is a Static Random Access Memory. The pinout is the JEDEC 28 pin, 8-bit wide standard, which allows easy memory board layouts which accommodate a variety of industry standard ROM, PROM,EPROM, EEPROM and RAMs.
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Dynamic and Fatigue Testing Systems
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Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
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Small Drop Test System
KRD41 series
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KRD41 series small drop tester is suitable for free-fall test of small consumer electronics and components such as mobile phones, walkie-talkies, electronic dictionaries, CD / MD / MP3 and so on, applicable standards JISC 0044 and IEC 60068-2-32. Through standard tests on electronic products (surface drop, corner drop, edge drop, etc.) and collecting data, it simulates the vertical drop impact of electronic products during transportation and handling. It provides a basis for the design of the product's buffer and vibration damping and the selection of structural materials.
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Flammability Test System
COMP0804CAP
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Active flammability test system according to IEC 60384-14 Ed4. For testing X & Ycapacitors up to 1uF. The test system includes control of the nominal AC supply via an integrated variac up to 1800V. Impulse amplitudes are programmable up to 8kV which covers all requirements. X1 capacitors are stressed up to 4kV, X2 and Y4 capacitors up to 2.5kV and Y2 capacitors up to 5kV.
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Automated Testing System
PV-LIT
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Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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CATV Systems
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Sumitomo Electric Industries, Ltd.
We provide CATV solution that flexibly meet the needs of CATV operators.
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Microinjection Systems
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Sutter designs and manufactures modular microinjection systems for precise cell manipulation like embryonic stem cell transfer, DNA injection, nuclear transfer, and more. Our experience with precision motor control has culminated in this state-of-the-art system.
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Complete Systems
Universal Testing Device
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The universal testing device is intended for a diverse range of measurement and automation tasks in laboratories and in test engineering. Thermocouples, RTDs and other sensors can be directly connected. Electrical AC/DC values can also be acquired with the universal testing device.
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PED Systems
Pulsed Electron Deposition
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Is a process in which a pulsed (80-100 ns) high power electron beam (~1000 A, 15 kV) penetrates approximately 1 μm into the target resulting in a rapid evaporation of target material. The non-equilibrium heating of the target facilitates stoichiometric ablation of the target material. Under optimum conditions, the target stoichiometry is preserved in the deposited films. All solid state materials – metals, semiconductors and insulators, including those transparent to laser wavelengths in PLD – can be deposited as thin films with PED. By combining PLD and PED, the range of complex materials that can be prepared as thin films can be greatly enhanced.
