Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Test Sockets
Non Standard
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Chances are good Ardent can help you with that. We can adapt our technology to just about any package, device or module. Small volumes of custom sockets for higher bandwidth applications are a niche all in their own, and our engineering team has many years of experience designing custom sockets for all kinds of applications.
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Product
Dual Channel Clock Driver Card
PI-41400
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The PI-41400 is a dual channel Clock Driver card capable of operating up to 190 MHz into a 50-ohm load and up to 80 MHz at an amplitude of 8 volts into a 1-megohm load. Into a high impedance load the output voltage range is from a –3 volts to 8 volts with the output pulse amplitude ranging from 0.5 V to 9 V. When driving a 50 load the voltage range is –1.5 volts to 4.5 volts with the output pulse amplitude ranging from 0.25 V to 4.5 V. The rise and fall times of the output pulse are variable from 1.2 ns to 9 ns into a 50-ohm load and <5 ns to 9 ns into a HiZ load. The output pulse amplitude and the load being driven determine the range of variability. The driver output can be set for tri-state operation and the output polarity can be set for ‘Normal’ or ‘Inverted’ operation through software.
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Product
Parametric Test Fixture
U2941A
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The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Device Testing
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The BTL Working Group (BTL-WG) has developed a test package which contains a set of testing procedures. These can be acquired and used by manufacturers to pre-test their products for BACnet compliance before they send their products to an RBTO (Recognized BACnet Testing Organization) for BTL Testing. The BTL Test Package is available on the test documentation page.
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Product
Processor Cards
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Curtiss-Wright Defense Solutions
Whether you're looking for hardened Trusted Computing capabilities or alignment to open standards like CMOSS or the SOSA Technical Standard, our selection of rugged processor cards has you covered. Featuring industry-leading Intel and NXP Arm and Power Architecture processors, our 3U and 6U VPX, 6U VME, and XMC single board computers (SBCs) and digital signal processing (DSP) cards are backed by our lifecycle management services to support extended availability for the duration of your program.
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Product
Testing Consumables
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Solar Light offers a plethora of consumables for SPF and other testing requirements, including high quality Molded and Sandblasted PMMA Plates, Pre-Analyzed and Certified SPF and UVA Sunscreen Standards, Disposable Medical-Grade Pads, and long-life spare Xe Lamps for use with our state of the art Solar Simulators.
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Product
Isolated Four-Port Serial Interface Cards
PCI-ICM422-4 and PCI-ICM485-4
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These cards can be installed in any 5-volt PCI-bus computer that can accommodate "long" cards and are designed to provide effective communication on long communication lines in noisy environments. The data lines are opto-isolated from the computer and from each other to assure communication even when large common mode noise and voltages are superimposed. Type 16550 UARTs are used. These include a 16-byte transmit/receive FIFO buffer to insure against lost data in multitasking operating systems. All ports are independently addressable and an on-board crystal-controlled oscillator permits precise selection of baud rates up to 115,200 baud or, by changing a jumper, up to 460,800 baud.
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Product
RTD Simulator PCI Card 6-Channel PT1000
50-262-102
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This RTD Simulator is a PCI card that supports 6 channels of RTD simulation. The card can provides a setting resolution of <90mΩ (also available in <8mΩ - PT100) and a resistance accuracy of better than 0.1% on all channels. Each simulation channel is able to provide a short or open circuit setting to simulate faulty wiring connections to a sensor. Calibration or verification of each resistor channel can be verified by using the calibration port connected to a high performance DMM and a supplied software package.
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Product
Functional Test
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A type of software testing that verifies a program's functions against its requirements, checking that the software works as expected by comparing the actual output to the expected output.
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Product
Engineering Testing
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At ARC, we know engineering testing, and with our in-house mixed signal test capabilities, we can get you the right test services for what you need. Working with our leveraged partnerships (National Instruments, Keysight and others), we can augment our standard capability with whatever test requirements you have for power, precision analog, high-speed digital, and RF testing up through to 50Ghz.
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Product
Digital Signal Processor Card for PCI bus
SI-C33DSP
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The SI-C33DSP-PCI from Sheldon Instruments is a powerful Digital Signal Processor (DSP) card for your PC equipped with a PCI bus. It is based on Texas Instruments’ new 150Mhz TMS320VC33, 32 bit floating point DSP, and can transform your PC into an ultra high performance development system and DSP accelerator.
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Product
Test Solution
Eye-BERT MicroX
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The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Product
Probe Cards
LCD Driver
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LCD Driver devices are utilized in some of the most popular high definition tech products such as LCD televisions, high functioning smart phones and tablets.
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Product
Detector Testing
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CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
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The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
FPGA Mezzanine Cards
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FMCs bring modularity to high performance I/O - whether you need high bandwidth ADCs and DACs for radar applications, Gigabit Ethernet for digital communications, or clock and trigger distribution for multi-board synchronization.
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Product
Test Sets
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A set of examples used only to assess the performance of a specified classifier on unseen data.
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Product
VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Performance Testing
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If you want to check the strength of your application or the server’s strength you will need to find out how much load, in terms of the number of users the application can handle. We use the Performance Testing techniques, to check the load an application can handle.
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Product
Expansion Card
PMC238
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The PMC238 is a 6U form factor card that expands a single PMC site on a VMEbus processor board to two PMC sites and one PCMCIA/CardBus socket or to three PMC sites. Compatible with many VMEbus single board computers, it provides an extension of PCI and PCMCIA capacity within the VMEbus form factor. The PMC238 has the option for the PCMCIA/CardBus cards to be mounted outside the chassis using an 18-inch cable.
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Product
Avionics Test
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VIAVI Solutions offers a wide range of avionics test solutions supporting engineering, factory, flightline, and return to service test requirements. Working closely with avionic OEM’s and users, we strive to develop a comprehensive and user friendly solution utilizing modern technology to meet the long term needs of the aviation industry.
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Product
Load Tests
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For the production and quality assurance of electric motors and electric drive systems, the use of flexible and customer-specific testing technology is required. Vogelsang & Benning supplies the same to the needs and the application of the customer.
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Product
Wafer Test
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Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Product
Termination Cards
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A signal conditioning board that provides eight independent SPDT relays, eight isolated outputs, and eight isolated inputs for applications requiring medium current capacity plus I/O isolation between an embedded computer and monitoring/control points.
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Product
Osprey Probe Card
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The Osprey probe card is MPI’s solution to demand for ever finer pitch. It is designed for smaller Al pad, and is ideal for tiny pitch application with peripheral and full array pattern. With precise alignment and better planarity control, Osprey can reach higher productivity by multi-DUT design. The forming wire (FW) type needle produced with MPI’s own micro fabrication process not only delivers high-quality performance but also allows easy needle replacement and shortens maintaining cycle time.
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Product
Test & Development
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Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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Product
PCI/PCIe-Based Serial Communications Cards
PCI-C588/PCI-C584/PCIe-C588
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- IRQ & IO address automatically assigned by BIOS- Supports up to 2 cards per system, jumper-less, easy to configure- Isolated RS-422/RS-485 interface (C422/C485, C518/C514)- PCI Rev 2.1 Plug-and-play- PCI Express® x1 compliant (PCIe-C588)
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Product
Test Adapter
FECVF1600
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Frothingham Electronics Corporation
The VF1600 Test Station is a high current forward pulser designed to be used in conjunction with our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of much higher forward current. The VF1600 station can produce a maximum current of 1600A at up to 5V using an 8.3 mS half sine waveform at the built in test station, and THETA and DVF tests at up to 500A at 10mS pulse width. It is derated for wider pulses. For rectangular VF pulses at 300us or 1ms, it can produce up to 2000A. The station can also test all of the usual FEC200 tests in the same test program.
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Product
PRODUCTION TESTING
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The Production Test Department is a component of the Engineering Department where production test technicians perform routine factory testing in accordance with approved test procedures. Most of the electronic testing is automated, whether ambient acceptance testing or environmental ESS testing.
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Product
In-circuit Test
i3070
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The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
