Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Impact Testing
The Impact Testing software of the m+p Analyzer real time analyzer includes useful tools like the selection of a roving hammer or transducer, selection of data points/nodes, double impact detection and rejection, definition of force and exponential window and a user-definable display configuration as a visual measurement feedback.
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Test And Repair
If you are responsible for maintaining a system where faulty electronic modules are not readily replaceable. Innovasys can assist by providing cost effective repair services or by developing support tools to allow in-house repair.Our IPC J-STD-001 certified technicians provide test and repair of electronic modules and are backed by a team of electronics engineers. This gives us the capability to diagnose and repair complex circuitry.Innovasys provides test and repair services to the Defence Materiel Organisation. Our technicians are experienced in effecting repairs to meet strict quality requirements on complex multi-layered circuit card assemblies.
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EtherCAT Motion Control Card
Advantech offers a range of distributed motion control solutions that include its proprietary motion control network, AMONet and EtherCAT solutions.
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Testing Framework
TestDrive
TestDrive™ automates all types of testing for data integration applications for dramatically improved quality of applications as well as the data they produce.
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Blockchain Testing
ZenQ’s BlockChain Testing Centre of Excellence provides Testing services for Blockchain platforms and implementations.
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PXIe-SMN Interface Card
Avionics Interface Technologies
2.125 Gbps Optical loop networkSingle-mode and Multi-mode optical interfaces supportedUp to 256 Shared Memory Network nodes supportedUp to 200 MByte/sec sustained data ratesMaximum 500 nS latency between nodesNetwork interrupts supportedSoftware Drivers available for Windows (7/8), Linux, LabVIEW Real-Time, and VxWorks
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Standard Test Systems
WaveCore™ Products
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Test Equipment
ST9020
Shenzhen Star Instrument Co., Ltd.
The ST9020 single-phase energy meter test equipment is full-featured and stable. Optional accuracy classes are 0.1 and 0.05. As divided by structure there are combined type, integrated type and auto wiring type. The meter test equipment is controlled via PC-based software. Choices of meter position are 6, 12, 24, 30, 48 and 60.
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Digital Acquisition Card
PI-41000
The PI-41000-4G is a CompactPCI® bus based instrument card that allows the user to capture up to 32-bits of digital data into an on-board memory at clock rates up to 120 MHz. The inputs are software configurable to provide one 32-bit wide channel, one 16-bit wide channel with double depth or two 16-bit channels. When configured with a single 16-bit input, the card will capture at up to 120 MHz. When configured with two 16-bit inputs or as a single 32-bit input, the card will capture at up to 80 MHz. Each digital data channel requires three timing signals, frame, line and pixel to accommodate the data capture. When operating in a two channel mode, clocks from channel A can be used to provide timing to channel B. For wider words or multiple channels, more boards can be used in parallel.
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Packaging Test
Underwriters Laboratories Inc.
UL offers ISTA packaging tests to assess the security of goods during transport, so retailers and manufacturers can feel confident that packaging is up to the job, thus reducing product loss and customer complaints.
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PCI/PCIe-Based Serial Communications Cards
PCI-C588/PCI-C584/PCIe-C588
- IRQ & IO address automatically assigned by BIOS- Supports up to 2 cards per system, jumper-less, easy to configure- Isolated RS-422/RS-485 interface (C422/C485, C518/C514)- PCI Rev 2.1 Plug-and-play- PCI Express® x1 compliant (PCIe-C588)
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Magnetic-Inductive Testing
MAGNATEST® Product Family
Foerster Instruments, Incorporated
The MAGNATEST product family is used for the non-destructive testing of metallic materials for magnetic and/or electrical properties. The test instruments are used in the automotive and aviation sectors as well as in the production of semi-finished products. The focus is on testing components relevant to safety such as brake discs, or ball pins and functional components such as camshafts and drive shafts, pivots and piston pins. Typical test tasks include hardness checks, material differentiation and sorting. MAGNATEST can also be used for the automatic testing for the geometric properties of all metallic series components. The high-performance amplifier installed in MAGNATEST test instruments makes it possible to analyze harmonics, which guarantees an extremely reliable and precise repetition, even when impacted by perturbations.
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Storage Test
Teradyne, Inc. is a leading global supplier of Storage Test solutions. Since delivering our first Hard Disk Drive tester in 2007, we have been supporting our customers in producing the best HDD products in the market. Enabled by our scalable high-density architecture, high-speed automation, precision HDD handling, and carefully controlled test environment, our customers have access to a single platform for all their HDD tests that can keep up with their aggressive production schedules.
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Telecom/NEBS Testing
Eurofins E&E North America’s extensive capabilities in telecommunications include testing, compliance assistance & design reviews, application preparation and agency liaison. Eurofins tests products for compliance to U.S., Canadian, and international standards for telecom devices, from NEBS equipment to consumer products such as DSL modems.
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Low Profile Isolated Digital Input/Output Card
LPCI-IIRO-8
The LPCI-IIRO-8 is a half-size Low-Profile PCI bus compatible card that provides isolated digital input and output interface for PCI-Bus computers. The card has eight optically-isolated digital inputs for AC or DC control signals and eight electromechanical relay outputs. LPCI-IIRO-8 occupies four consecutive 8-bit registers in I/O space.
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6U Horizontal Card
2370
VECTOR Electronics and Technology, Inc.
Versatile chassis for horizontal card installation
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Multibus Ethernet Card
MS 1750
- Processor: LPC3250 processor with ARM 9 core running at 266 MHz- SDRAM Memory: DDR2 256 MB (scalable to 512 MB)- Flash Memory: NAND flash 512 MB- Display & Graphics: Programmable color LCD controller supports up to a TFT interface- Touch screen: Integrated touch screen controller- Network Support: 10/100 Base-T Ethernet PHY- PC Interface: One USB 2.0 high-speed On-the-Go interface- Multibus Interface- Serial Interfaces: Up to four external UARTs- CAN 2.0B controller- Three I2C ports- Three SPI ports- GPIO: Programmable I/O depending on peripheral requirements
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Dual Channel Clock Driver Card
PI-41400
The PI-41400 is a dual channel Clock Driver card capable of operating up to 190 MHz into a 50-ohm load and up to 80 MHz at an amplitude of 8 volts into a 1-megohm load. Into a high impedance load the output voltage range is from a –3 volts to 8 volts with the output pulse amplitude ranging from 0.5 V to 9 V. When driving a 50 load the voltage range is –1.5 volts to 4.5 volts with the output pulse amplitude ranging from 0.25 V to 4.5 V. The rise and fall times of the output pulse are variable from 1.2 ns to 9 ns into a 50-ohm load and <5 ns to 9 ns into a HiZ load. The output pulse amplitude and the load being driven determine the range of variability. The driver output can be set for tri-state operation and the output polarity can be set for ‘Normal’ or ‘Inverted’ operation through software.
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Test Connectors
A wide range of standard test Connectors that can fit many of your applications and services. We offer a ideal solution for your testing needs in automatic or manual mode.
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Test Software
American Probe & Technologies, Inc.
This new series of software allows you to analyze materials or semiconductor leakage with all of the capabilities of your HP 4140B to resolutions of 1 fA @ 100VDC. Completely rewritten in Visual Basic for Windows XP operating system, it offers Virtual Front Panel Operation of 4140B for I-V & CV Analysis and allows operator to virtually control the 4140B for any instrument operation. I-V Plots with options of displaying current over time. CV Plots with high resolution plotting capability.
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RIBBON 20Pin 0.3M J2 (4 cards)
50-976-020-0.3M
Ribbon Expansion Cable for 50-51x series of PCI matrix cards
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Game Testing
Testing mobile game means ensuring that it is running properly, it meets its all specific requirements and provides fantastic user experiences to gamers. This may sound difficult – especially when there are bazillion different device configurations where the game must run well. If you consider that significant portion of Google Play and App Store revenues are generated by mobile games, there is absolute need to automate as many mobile game components as possible.
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Mobile Testing
Mobile devices are inarguably the most disruptive technology invention in recent times and have had an impact on human lives like no other. With a number of mobile devices surpassing the number of human population on earth, making your application mobile-ready is key to keeping today’s digital consumers happy. Across enterprises of all sizes, mobile apps have fuelled growth in the business operations and customer services. However, with the variety of platforms, devices and networks, there is significant infrastructure required for mobile application testing. The testing either is not exhaustive or very costly due to the sub-optimal approach used for testing.
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Digital I/O Card
PCI-DIO-120
The PCI-DIO-120, PCI-DIO-96 and PCI-DIO-72 are parallel digital input/output cards designed for use in PCI-Bus computers. The same printed circuit board is used for all three models and is populated for 120 bits, 96 bits and 72 bits respectively. The card is 12.2 inches (310 mm) long and may be installed in any 5-volt PCI slot in IBM and compatible computers.
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Test Chambers
Drug test chamber, ozone test chamber, plant grown chamber, salt spray test chamber, sand test chamber, temperature and humidity test chamber, UV test chamber, xenon test chamber
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Leak Testing
T SERIES
The new T series marks the evolution of the leak testers for the industry. A touch of innovation that fosters man-machine interaction thanks to the innovative tempered glass touch capacitive panel and other technological innovations that make the range, the natural evolution of the previous M series, the new benchmark for testing and proof brought.
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Arbitrary Waveform Generator PCI Card
GC1300
The GC1300 is a single-channel PCI-based Arbitrary Waveform Generator. It is a high performance waveform generator that combines many powerful functions in one small package. Supplied free with the instrument is Arbconnection software, which is used for controlling the GC1300 and for generating, editing and downloading waveforms from a remote computer.
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Leakage Test
Leakage current and discharge current depend on the insulation of the device. The measurement simulates various fault situations that could occur during operation. The test determines whether the measured current is within the permissible limits and poses no danger to the user in case of a fault.
