Highly Accelerated Stress Test
High reliability testing using a destructive high temperature, humidity and pressure enviroment.
See Also: HAST
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Product
Accelerated Life Test Systems
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Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Iridium Physical Layer Test Systems
PLTS
Test System
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Mechanical Stress Card Testing
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Wheels are transversely positioned with micromechanical stopsPressure exercised on the card's chip and microcircuitryThe card is free to deform in the Z axisThe stress is controlled by an accurate, precise force sensorProgrammable number of cycles
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Communications Test System for Frontline Diagnostics
ATS3000P
Test System
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
Automated Screenshots of Webpages for Accelerated Layout Testing
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Auto-generate full-paged screenshots of your webpages across multiple devices, operating systems, browsers, and resolutions - in a single go! LambdaTest Automated Browser Screenshot feature accelerates your UI and Layout testing helping you quickly identify layout issues across browser versions and screen sizes.
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Product
Conformance Test System
TS8980
Test System
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Non-standard Constant Acceleration Tester
KRD32 series
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KRD32 series non-standard constant acceleration testing machine is test equipment for military products to simulate dynamic centrifugal motion, dual environmental force centrifugal motion and central high-speed rotating motion.
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Product
Accelerated Aging
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The purpose of accelerated aging testing is to speed up the effects of time on a product. This is done to predict the long-term durability and to support shelf-life and expiration dating claims. This is often used in the medical device packaging industry. The relationship between temperature and product life is utilized to determine the test duration of accelerated aging.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Encoder Stress Pattern
ESP™
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SRI's ESP is a sophisticated video clip consisting of specialized and complex artificial test patterns that stress various aspects of processing to quickly reveal television encoder deficiencies. Its unique motion sequences allow users to visually evaluate and objectively compare the quality and performance of standard- and high-definition encoders.
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Product
Acceleration Testing
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The acceleration test is performed on a centrifuge to assure that material can structurally withstand the steady state inertia loads that are induced by platform acceleration, deceleration, and maneuver in the service environment, and can function without degradation during and following exposure to these forces. Acceleration tests are also used to assure that material does not become hazardous after exposure to crash loads. The acceleration test method is applicable to material that is installed in mobile platforms such as aircraft, helicopters, aerospace vehicles, air-carried stores, ground-launched missiles, trains, ships, automotive vehicles, etc.
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Product
Constant Acceleration Tester-Arm Type
KRD31 series
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KRD31 series constant acceleration tester are used to test articles under extreme acceleration conditions based on standard like MIL-STD-810F, MIL-STD-202 and IEC68-2-7. It is most suitable for testing electronic components or devices. Under high g effect on microcircuits, to check adaptability and reliability of wiring and the internal structures. It may expose mechanical and structural defects that are not found with vibration and shock tests.
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Product
PV Accelerating Tester
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King Design Industrial Co., Ltd.
*Spectrum mis-match: IEC 60904-9 class A*Non-uniformity <5%*Instability <5% ( within 30 mins)*Irradiance range: 800 W/m2 ~ 1200W/m2*Effective range: 30cm x 30cm; 1.1m x 1.4m*(customize accepatble)*Temperature：40℃ ~ 90℃*Humidity: 20% ~ 85%
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Electrification Testing Solutions
Test System
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
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Product
High Accelerated Life Test Chamber
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Guangdong Test EQ Equipment co., Ltd.
- Rapid Temperature Cycling: Achieves rates up to 100°C/min for accelerated stress screening hass.- Multi-Axis Vibration: Combines pneumatic (6-DOF) and electrodynamic vibration for multi-stress accelerated life testing halt simulations.- Precision Control: halt process ±0.5°C temperature uniformity and real-time monitoring.- Customizable Profiles: Supports stress levels user-defined stress protocols (step-stress, dwell times).- Durability: Robust construction with corrosion-resistant materials
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Accelerators
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Our GPGPU embedded processing accelerators are powered by NVIDIA or AMD devices that are picked for their long service life support and suitability for embedded processing applications. Each GPU processor is mounted on a rugged mezzanine for upgradability.
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Product
Accelerated Mobile Pages (AMP) Testing Tool
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Accelerated Mobile Pages (AMP) is a great way to make content on your website accessible in an extremely fast way. To help ensure that your AMP implementation is working as expected , Search Console now has an enhanced AMP testing tool. This testing tool is mobile-friendly and uses Google's live web-search infrastructure to analyze the AMP page with the real Googlebot. The tool tests the validity of the AMP markup as well as any structured data on the page. If issues are found, click on them to see details, and to have the line in the source-code highlighted. For valid AMP pages, we may also provide a link to a live preview of how this page may appear in Google's search results.
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Product
SKYvec: Accelerates Software Development
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The SKYvec software development tools simplify code development for large multiprocessor systems by automating many of the processes which otherwise would have to be designed or managed by the programmer.
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Product
Accelerated Stress Test Chamber
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CSZ's accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. Chambers are typically designed with a change rate up to 30C (54F) per minute based upon the part temperature. Common uses are production stress testing circuit boards, electronic drives, assemblies, etc. Design allows the user to quickly control and change the temperature of the product.
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Product
Strain Measurements and Experimental Stress Analysis
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Experimental structural testing using strain gauges is necessary in a wide range of applications from airframes and sub-assemblies down to individual components such as turbine blades, satellites, wind turbines, buildings, bridges and many others. These tests enable the engineers to compare the acquired data with the predicted results from the design calculations.
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Product
Optical Receiver Stress Test Solution
N4917BSCB
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The Keysight N4917BSCB optical receiver test solution is a complete, automated and repeatable solution for optical receiver stress test.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
