Showing results: 6376 - 6390 of 9089 items found.
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dataConductor -
PDF Solutions
dataConductor is an interactive enterprise yield management solution for the semiconductor industry. With dataConductor, semiconductor manufacturers can collect data from diverse, global manufacturing systems and combine them into a single warehouse to manage yields during data characterization, yield ramp and volume production.The dataConductor platform is a comprehensive enterprise yield management system built upon our high-performance dC Warehouse. dataConductor features an optimized Oracle database, standard and custom data parsers, and a full suite of analysis capabilities that can be tailored to your particular environment.
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AURIGA 4850 -
Focus Microwaves
Auriga’s 4th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
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NED-LMD W-Series -
Gamma Scientific Inc.
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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2400 -
Photon Kinetics
The 2400 Fiber Geometry System is designed to provide high-speed automated measurements of optical fiber end-face geometry. Repeatable and accurate measurement of parameters such as core and cladding diameter, core and cladding non-circularity, as well as core-cladding concentricity provide invaluable process control information, and ensure that customer demands for low loss fiber splices are satisfied. Measurement options are available for both side view coating geometry measurement and fiber curl characterization.
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Optokey, Inc.
Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.
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Innova-IRIS -
Bruker Optics
This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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NED-LMD WG Series -
Gamma Scientific Inc.
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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IQgig-IF -
LitePoint Corporation
When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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OPTOWARE-S300 (FOTS-ORL Meter Systyem) -
Notice
The Optical Return Loss(ORL) Meter is an efficient system for the characterization and test of optical components and systems to be performed in high quality.
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TriboLab CMP -
Bruker Nano Surfaces
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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MB Dynamics Inc.
Acoustic quality, vehicle dynamics and stability, and driver comfort play an increasingly important role in the development of new chassis and suspension systems – both passive and active. Noises in suspension components can cause customer dissatisfaction and lead to high warranty costs and are difficult to diagnose especially on historically-used, noisy hydraulic test rigs. The MB Suspension Component Test Rig (SCTR) enables dynamic simulation of real road excitations and synthesized waveforms, performing industry-standard Force-Velocity and Force-Displacement tests and low speed friction tests, and assessing other NVH and structure-borne noises for comprehensive performance characterization and sound and vibration analyses on a wide variety of chassis components.
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ESDEMC Technology LLC
Microwave Absorbing Material Characterization System that measures the signal loss through a material sample in a frequency range of 5 15GHz (with the option of extension to lower frequencies).
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KLA-Tencor Corp
KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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ADCS -
Matrix Test Equipment Incorporated
The Automated Distortion Characterization and Information System (ADCS) is an extension of the Matrix equipment control software that automatically makes RF measurements selected from the following: Cross Modulation (XMOD), Composite Triple Beat (CTB), Composite Second Order (CSO), Carrier to Noise (C/N), Discrete Second Order, Discrete Third Order Distortion. Measurements are made, and the test results and a profile describing the test conditions are saved in a database for later retrieval or reporting.
