Showing results: 6076 - 6090 of 9089 items found.
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ETS788 -
Hilevel Technology, Inc.
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Advantest Corp.
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
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Labtone Test Equipment Co., LTD
Products are inevitably affected by impact, bump, free fall, tumbling etc. during production, transportation, loading and unloading as well as during the use of the products. All of these are transient excitation on the object, causing the object to produce mechanical characteristics of high speed, acceleration, strain rate instantly. These kind of characteristics are completely different from that in static load, and may cause problems to the object in terms of structural strength and stability and sometimes the object may fail. Therefore, it's necessary to study the effect of impact and reproduce the shock environment, to assess the structural strenghth and performance of the object under shock environment.
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SEE-RAD -
Hilevel Technology, Inc.
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Mentor Graphics Corp.
Mentor Graphics SystemVision is a mixed-signal modeling and simulation environment using the power of VHDL-AMS and SPICE to verify your control and mechatronic systems. SystemVision includes graphical design entry, VHDL-AMS modeling and library tools, leading-edge simulation technology and powerful waveform viewing and analysis tools
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YIS and SF Series -
RMS Vision Systems Inc
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.
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TAS7500 Family -
Advantest Corp.
The TAS7500 series is a family of compact and multipurpose terahertz spectroscopic / imaging systems. Utilizing the unique properties of the terahertz region (0.1 10.0THz) of the electromagnetic spectrum, these systems perform non-destructive analysis of pharmaceuticals, chemicals, communications materials, etc., without requiring a specially constructed analysis environment. Speed and ease of operation are the hallmarks of Advantest's terahertz analysis systems. In addition to industrial applications, the TAS7500 series is also an optimal choice for terahertz related research, leveraging Advantest's high-precision detection technology to provide best-in-class sampling performance.
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OhmTech.io
We bring our experience in electrical engineering, sensors, hardware design and systems integration in the IoT industry to consult on your business use-case or new product idea.
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BME280 (Qwiic) -
SparkFun Electronics
The SparkFun BME280 Atmospheric Sensor Breakout is an easy way to measure barometric pressure, humidity, and temperature readings, all without taking up too much space. Basically, you can find out anything you need to know about atmospheric conditions from this tiny breakout. The BME280 Breakout has been designed to be used in indoor/outdoor navigation, weather forecasting, home automation, and even personal health and wellness monitoring. Utilizing our handy Qwiic system, no soldering is required to connect it to the rest of your system. However, we still have broken out 0.1"-spaced pins in case you prefer to use a breadboard.
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Silex Technology
The SDK helps system integrators and device manufacturers add Silex SX Virtual Link functionality into Windows applications. It provides communication across the network with USB Device Servers or with devices integrated with the SX-Virtual-USB-SDK.
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CHANGSHA KAIYUAN INSTRUMENTS CO., LTD.
* Ruggedized for use in pulsed airborne, naval and ground radar* Found in weather forecasting Doppler radar systems* Utilized world-wide in air traffic control and precision approach radar systems
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Sonix Inc.
Sonix offers powerful microscopy analysis software to enhance packaged semiconductor imaging, accelerate production and adapt systems based on the ECHO platform to customer-specific requirements.
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DiagLink -
Autel
Besides providing safe replacement and recalibration of brake pads for modern vehicles with EPB systems, the DiagLink device also offers the most convenient oil service reset functions. As a specialized diagnostic tool for DIY users and technicians of service workshop, DiagLink supports the diagnosis for all electronic systems of makes and models compliant with OBD II/EOBD and CAN. This compact handheld device enables you to accurately diagnose complex problems and makes your vehicle service experience much easier!
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7505-K007 -
Chroma ATE Inc.
The Chroma 7505-K007 Thin Film Thickness Automated Optical Metrology System equipped with 3D sensor is suitable for Roll to Roll processing and thin film thickness measurement. The stage embedded with vacuum adsorption function, making soft UUT a flat surface.
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PrimeTest Automation
PrimeTest Automation delivers custom test, measurement, and data acquisition systems that include the best hardware and software available. Drawing on vast resources from multiple disciplines, each system is carefully designed and constructed to provide the most accurate and repeatable results. Test systems can be deployed as standalone or as part of an automated line such as a rotary index dial or conveyor.
