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Dicing And Lapping Systems
In semiconductor fabrication, clean die separation and smooth surfaces can make all the difference. While these steps might come late in the process, they play a major role in how well a device ultimately performs. Dicing and lapping bring the necessary level of precision to cut wafers into individual dies and polish surfaces so everything fits, functions and holds up the way it should in real world scenarios.
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Modular Test Systems
Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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Dilution / Sampling Systems
HORIBA offer a full range of full flow CVS and partial flow systems for exhaust gas measurement that cover the requirements of all of the global emissions standards. These are complemented by a full range of solutions for the measurement of particulate mass and particulate number required to meet the latest legislative standards.
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Meteorological System
200M
The Model 200M is a complete instrument for the measurement of Atmospheric Dew Point, Ambient Temperature, % Relative Humidity, or other Psychrometric Variables. It employs the very reliable optical chilled mirror sensing technique which provides a primary measurement of dew point, and is traceable to NIST. The Model 200M is ideally suited for installations requiring continuous, automatic, and unattended measurement of humidity over a very wide range.
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Modulation Measurement System
MMC
This connector panel is used to bring test signals from the rear side of a rack up to the front side of the rack so that measurements can be made without climbing in behind the rack.
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X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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Phase ID Systems
LED Meter Probe allows the user to take Real time Phase Angle readings along with AC nominal voltage readings. A PD800W LED Meter Probe works in conjunction with the Receive Unit to verify phase identification along with the actual phase angle data. This is all done without any calculations or data transfer from the field to a base computer. The meter probe and reference probe or receive unit can operate at 100 feet of separation and up to 300 feet line of sight separation. In the event that this distance would need to be greater, the Receive Unit can be unplugged from the charging cable and taken into the field while operating on it's rechargeable batteries for up to 8 hours at a time.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Vibration Test Systems
G-5 Series
Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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Distributed Control Systems
As the heart of plant-level digitalization, ABB's Distributed Control Systems (DCS) are designed to transform your multi-faceted, 24/7 process operations. Our market-leading control architecture constantly monitors and drives plant productivity, maximizing asset utilization, process efficiency and production quality. A focus on availability, safety and cyber security ensures the protection of your people, assets and equipment. And by maintaining tight controls over raw material consumption, plant energy levels and waste by-products, ABB DCS solutions help to significantly reduce environmental impact.
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Test Equipment
Rotary Field Checker
Smart Three Phase Rotation Tester. Test Leads. Phase Rotate Tester is a 3 phase tester to identify the correct connection from the power supply. Also, it can identify the missing phase of the power supply too.
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VLF Testing and Diagnostics System
PHG 70 TD/PD
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PHG 70 TD/PD. With the PHG TD/PD, you get a multifunctional cable testing and diagnostics system that was specially designed and developed for medium-voltage networks. The PHG TD/PD system is also the only cable testing and diagnostics system that gives a comprehensive overview of the quality and ageing condition of the test sample. The diagnostic methods TD and PD are mutually complementary, because on one hand you can detect the complete condition and on the other hand locate * individual faults in the operating resources.* High performance VLF truesinus testing device (3 kW) with regulated output voltageCompact, enclosed design in 19" format* Variable installation option with separate control and voltage unit* Variable connection options to cable stations of different models
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Electron Diffraction System
Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Test Automation
Test automation helps in reducing regression testing time and cutting down the time to market with significant cost savings on long term basis. However, a clear automation strategy and roadmap is key to ensuring the right return on investment on your automation initiatives. With disparate application architecture, multiple environments, third party integrations and multiple user devices, a standardized and consistent automation approach is needed to ensure high reusability, ease of maintenance and lower upfront cost.
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V4 Marine Radio Analyser - MF/HF/VHF DSC Marine Radio Test System
ICS Electronics Limited is a world leader in the design, integration and supply of GMDSS VHF, MF/HF DSC Coast Radio and NAVTEX Broadcast solutions with a direct and active participation in the governing committees.
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Wire Damage Test Device For Pull Testing
IEC60884 FIG11
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG11 Wire damage test device for pull testingThe wire damage test device is a special test instrument designed and manufactured according to the requirements of IEC884 Figure 11, , etc. It is mainly used to judge whether the screw-clamp type terminal is in design and structure.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Test Fixtures
At Global Test Services LP, we know that verifiable yields are the backbone of your business, which is why we offer innovative, robust solutions that offer you better availability, improve efficiency, and offer flexible, scalable systems that meet the specific quality and test needs of your business.
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Batteryless System Logger
SKU-004-01
The Batteryless System Logger is a unique device that was designed to log system data from any serial port, and store the data in the Logger’s non-volatile memory; this is done in the event of a system crash or power outage. The Logger is ideal for companies in the embedded appliance market.The System Logger connects to the embedded system via the serial RS-232 port. It continuously receives log info from the system, and stores this log info on an internal cycle buffer. This info can be retrieved via the serial interface at any time.
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Vision Measuring System
CNC Vision Measuring System. Supporting non-contact and contact hybridContact measurement of detailed shape is achieved by extra small stylus with minimum diameter of 15um
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Armature Testing
Electronic Systems of Wisconsin, Inc.
ESW Armature Test Systems are equipped with the latest features the market has to offer. The on-screen display makes it easier to read, track, and record your armature information. ESW's data collection software is compatible with almost any type of system that allows the user to store the information on any software platform. Our Testers store your data, so that you never have to worry about losing important information again. We will work with you to meet your customized testing needs. Please see the videos and slideshow below to view some of our Armature Testers.
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Preparative HPLC Systems
Nexera UC Prep
The Nexera UC Prep is a new preparative supercritical fluid chromatography system that offers both the high basic performance developed for the previous Nexera UC model and original state-of-the-art preparative SFC technologies. It resolves a number of issues in preparative tasks, reducing labor and improving efficiency while fitting into pre-existing workflows. Not only does the Nexera UC Prep achieve superior recovery rates for purification, it provides flexible system configurations in a compact design, requiring low installation space and allowing you to maximize lab resources.
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Automatic Driving System
ADS EVO
Vehicle developers face increasing pressure to reduce development times, while vehicle complexity is increasing. The ADS EVO ensures accurate and repeatable global test cycles on chassis dynamometers.
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Corosion Testing
Materials Evaluation and Engineering
Electrochemical corrosion experiments can provide a variety of data related to the pitting, crevice corrosion, and passivation behavior for specific sample/solution combinations. These data are useful in selecting materials and/or determining how manufacturing processes affect corrosion properties.
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Chassis and Safety ICs
ST is a world-class supplier of IC smart power solutions for all the Chassis and Safety applications, ranging from passive safety, braking, vehicle dynamics and steering systems. Type of devices in ST portfolio are analog and mixed-signal ICs, integrating different functions such as supply modules, drivers for loads and actuators, diagnostic functions, system monitoring and communication interfaces.
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SOI Bonding Systems
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
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Network Testing
UX Series
The VeEX UX series includes the robust UX400 and UX400R Universal Expert platforms. The UX400 is the most versatile portable multi-service transport test solution to offer a wide range of modules with test capabilities ranging from DS1/E1 all the way up to the latest 100GE and OTU4 network speeds, for a total of up to 600G traffic generation in a single compact modular chassis. Available in Portable and Rack-mount versions.
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Test Data
Studies by major universities were conducted in response to a request from the military, scientific and engineering communities for scientific validation of claims that Pulse Technology actually improves battery efficiency and lengthens battery life. PulseTech contracted with Oakland University in Rochester, Michigan and Ohio State University in Columbus, Ohio to conduct separate evaluations of the technology. These extensive evaluations began in the summer of 1998 and concluded in the fall of 2000.
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Modular I/O System
ADAM-5000 Series
ADAM-5000 PC-based SCADA controllers, including the ADAM I/O series, feature an Intel Atom D510 CPU along with control specific features such as watchdog timer, battery backup RAM and deterministic I/O and acts as a automation controller.
