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Long Range Systems
Long-range lightning detectors are helpful in advance planning. The LD-250 and LD-350 are suitable for both desktop and laptop computers. The LD-250 can be used mobile for storm chasing. The LD-350 can be used as a stand-alone lightning network detector. Similar to the LD-250 & LD-350, StormTracker is a long-range lightning detector helpful in advance planning and can also be used as a lightning network detector. The StormTracker PCI requires installation in a desktop PC. CLICK HERE FOR A PRODUCT COMPARISON CHART
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Metrology System
Atlas V
The new Atlas V metrology system is designed to measure several key steps that include buried features, not visible by CD-SEM and other techniques. Through remarkable improvements in the optical systems, mechanical sub-systems and software algorithms, the Atlas V system can precisely measure the very subtle variations for device parameters and reveal weak process corners for engineers to improve their process robustness in the fab.
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Materials Testing
Materials testing is a diligent approach to ensuring that your infrastructure and vital equipment will provide continued production, undergo minimal degradation and are designed with optimal performance in mind. Materials testing can also supply a wealth of information about the materials you are developing or incorporating into products to ensure they perform within expected specifications.
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Test Kit
983V2-984V2-KIT
The Meech 983v2 & 984v2 test kit gives operators & maintenance staff the ability to diagnose static related issues and monitor the performance of their ionising equipment.
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Inclinometer Systems
Columbia Research Laboratories
Columbia Research Labs offers our standard Inclinometer System and our Differential Inclinometer System. The standard system includes a temperature compensated force balance inclinometer in conjunction with a power module and convenient digital display. It is available with either AC or DC Power supply input. The Differential System allows the customer to match the slope of two remotely located surfaces. The readout can be set to indicate the absolute tilt of either sensor or the differential angle between them.
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SIP-90-4 Test System Interface Probe
SIP-90-4
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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EV Battery Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
5V cell equipment adopts Sinexcel innovative circuit design + high-speed DSP complex algorithm, the detection process supports multi-gear switching; The equipment integrates voltage, temperature, pressure and other auxiliary channels, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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System Trace Emulators
XDS560v2
The XDS560v2 System Trace Emulator is the second generation of the XDS560-class emulator design from Texas Instruments. It provides cost effective real-time emulation, debugging, and high-performance System Trace (STM) for Texas Instruments devices over both USB and Ethernet PC interfaces.
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FPGA Test System
DO-254/CTS
DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.
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Analyzer System
Ruggedized Test Systems (RTS)
This analyzer is a rugged, field deployable system that detects and locates faults and detects degradation in electrical interconnect systems ranging from simple to complex.
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In-Sight Vision System
D900
The In-Sight D900 is a smart camera powered by In-Sight ViDi software designed specifically to run deep learning applications. This embedded solution helps factory automation customers easily solve challenging industrial OCR, assembly verification, and random defect detection applications anywhere on the line that have gone uninspected because they are often too difficult to program with traditional, rule-based machine vision tools.
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Cell, Battery, And Module Test Systems
Maximize your testing capabilities with Maccor's hardware and software. Our comprehensive turn-key systems come bundled with all the essentials to jumpstart your testing process. Select from multiple options and configurations to match your requirements.
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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Testing Framework
TestDrive
TestDrive™ automates all types of testing for data integration applications for dramatically improved quality of applications as well as the data they produce.
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Product Testing
E-Z-Hook can provide most client requested test reports for their purchased product. Some of our more common report requests include first article inspection, process control plans, product validation, RoHS, and tensile tests. In addition to product test reports, we can incorporate additional inspection criteria and lot number management if needed. Please contact us to discuss your custom test and inspection requirements.
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6TL19 Off-Line Base Test Platform
H71001900
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Layer Release Systems
EVG's IR LayerRelease Technology is a fully front-end-compatible layer release technology that features an infrared (IR) laser that can pass through silicon, which is transparent to the IR laser wavelength. Coupled with the use of specially formulated inorganic layers, this technology enables an IR laser-initiated release of any ultra-thin film or layer from silicon carriers with nanometer precision.
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Telemetry System for Electrics
HTS-SS Blue
Our HTS-SS Blue sensor station system provides comprehensive telemetry information about your electric-powered aircraft and is compatible with the HTS-Volt, HTS-GPS, HTS-TEMP, HTS-ORPM, HTS-MRPM, HTS-C200 and HTS-C50 suite of sensors.
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Classroom AV Systems
Solutions for classroom AV, voice amplification, and campus communications.
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Automotive Electronics Functional Test Systems
Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Measuring Systems
Select your individual Meter Test System (MTS) from our single components. Hints for useful combinations of devices can be found on the corresponding product page.
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Data Monitoring System
1S663-001
The 1S663-001 Data Monitoring System was specifically developed for the Cessna Citation X and serves as the primary diagnostic tool for the aircraft?? electronic Logic Modules. The system is FAA certified for airborne operation. Aft compartment and cabin modules can be tested two at a time while remaining in place. The system is also capable of monitoring the fuel quantity system during flight.
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Millimeter-wave and Microwave GaAs Specialty ICs
Keysight Technologies provides MMIC Specialty ICs ideal for microwave radio, aerospace and defense, and instrumentation applications.
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X-ray Inspection System
Cougar ECO / Cheetah ECO
Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry. These microfocus systems, which have been developed by Yxlon in Germany, are characterized by an excellent price-performance ratio. Being entry-level systems in two sizes, each of them provides best inspection results in quality control in the SMT and semiconductor industries.
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Data Acquisition and Control System
DAQ 7000
data acquisition and control system that provides connectivity, signal conditioning and modular I/O for variety of sensors or signals, and it is an ideal DAQ for field deployment.
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Ellipsometry And Reflectometry Systems
Based on non-contact optical techniques, FilmTek tools simultaneously measure multiple-angle and multi-modal data to determine film thickness and refractive index. By measuring multiple angles of incidence, a wavelength shift is introduced between spectra collected at different angles. The wavelength shift between the spectra is only a function of the refractive index of the film and the angle difference between the spectra. By independently determining refractive index from a wavelength shift (as opposed to extracting index information from amplitude changes), FilmTek tools have best-in-class performance for film thickness and refractive index measurement. This level of performance allows FilmTek tools to address applications that otherwise may not be possible with more conventional ellipsometry or reflectometry methods.
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Test Fixtures
At A.T.E Solutions we have a dealt with a wide range of test subjects in the past 30 years and have extensive experience in providing reliable test fixture solutions.
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ATE Test Probes
For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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XTP Systems
Flexible, reliable systems that support multi-format switching and management of local and remote AV devices.
