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Parallel

Of two or more bits, circuits, processors or computers.

See Also: Bus, Serial, CAMAC, ISA, Multibus, Parallel ATA, VME, PC/104


Showing results: 436 - 450 of 587 items found.

  • Time History Recording to Throughput Disc

    M+P International

    For the most critical tests time history data can be recorded in parallel with vibration control with no reduction in control performance. The real-time throughput data capture function of the m+p VibControl system allows you to record all selected channels continuously in the time domain on the embedded data server (“throughput to disc”) irrespective of the channel count and the frequency range utilized. This means that you can always access all the original data for analysis purposes.

  • 100 MHz 32-CH High-Speed Digital I/O Card

    PCIe-7360 - ADLINK Technology Inc.

    ADLINK's PCIe-7360 is a high-speed digital I/O board with 32-CH bi-directional parallel I/O lines. Data rate up to 400 MB/s is available through the x4 PCI Express® interface. Clock rate can support up to 100 MHz internal clock or 200 MHz external clock, ideally suiting applications of high-speed and large-scale digital data acquisition or exchange, such as digital image capture, video playback and IC testing.

  • Earth Ground Tester

    1625-2 - Fluke Corporation

    The Fluke 1625-2 earth ground tester measures earth ground loop resistances using only clamps, only stakes, or one clamp and stakes. With the stakeless test method, the Fluke 1625-2 is able to measure earth ground loop resistances for multi-grounded systems using only current clamps. This technique eliminates the dangerous, and time consuming job of disconnecting parallel grounds, and finding suitable locations for auxiliary ground stakes.

  • Image Sensor Test System

    IP750 - Teradyne, Inc.

    Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.

  • Closed-Loop Servohydraulic Test Bench Control System

    ZETLAB Company

    Closed-loop servohydraulic test bench control system is based on digital devices of ZETSENSOR series with CAN interface. This system has fast response characteristics, high precision, and compact dimensions. The system enables comprehensive control of the servo drive in automated mode in compliance with the set test parameters such as pressure (force), displacement, along with the parallel control of other system parameters such as temperature, pressure, filter plugging, oil pressure, etc.

  • I²C/SPI Interface Device

    NI

    The I²C/SPI Interface Device is a master or slave interface for inter-integrated circuit (I²C), or master interface for serial parallel interface (SPI) devices. With plug-and-play USB connectivity, the I²C/SPI Interface Device is a portable solution to communicate with consumer electronics and integrated circuits. The I²C/SPI Interface Device can be physically located more closely to I²C/SPI devices than PCI interfaces, reducing I²C bus length and minimizing noise problems. The I²C/SPI Interface Device supports I²C rates up to 250 kHz and SPI rates up to 50 MHz, and it also includes eight general-purpose digital I/O lines for a variety of applications, such as configuring the address of I²C devices or toggling LEDs.

  • Linear regulated power supply with thyristor pre-regulation

    NTN - FuG Elektronik GmbH

    High efficiency Short circuit proof and unlimited operation with full current in short circuit condition voltage and current regulation with automatic and sharp transition; control mode indicated by LEDs Voltage and current setting with 10-turn potentiometers with precision scale; the adjusting knob can be locked 4 digit DVM for voltage and current (for table-top models) Sense terminals for the compensation of voltage drop on the load lines. The nominal voltage always refers to the output terminals Parallel and series connection possible Suitable for inductive and capacitive loads for 700 W nominal power and higher, limitation of inrush current on switching on Interlock loop to monitor the external load and internal loop as a standard for three phase units Elapsed-hour meter as a standard for three phase units

  • Wattmeter

    PowerMaster II for SO2R - Array Solutions

    The Power Master II wattmeter has the ability to have two couplers connected to it, and it has provision to allow switching very easily between the two couplers through only two button presses on the front panel.When operating SO2R, you do not want to have to toggle from one coupler to another. We make matched couplers available for SO2R users and due to the nature of these couplers being high impedancedevices, we can actually connect the two coupler inputs in parallel and instead of toggling between the two couplers, they will both be connected and active at the same time. The first step is to disconnect all connections to the rear panel of your Power Master II and remove the two #6-32 philips screws on either side of the cabinet.

  • Test System

    LPDDR4 and LPDDR3 - Triad Spectrum, Inc.

    Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.

  • Power Supply PowerLab 305d-ii

    TOMSAD

    PowerLab triple Series power supplies are reliable and accurate laboratory equipment with two outputs with adjustable and stabilized DC voltage and regulated (limited) power consumption and additional output has-voltage. Adjustable outputs can work independently, in series (max output voltage 120V DC for model 605-II) or parallel (max current of 10A for models 305-II and 605-II). Power can be used in the design of electronic products, scientific works, laboratories, production lines and in teaching.

  • Ball Pressure Test Apparatus

    CX-Q03 - Shenzhen Chuangxin Instruments Co., Ltd.

    The Ball Pressure Apparatus is used to check the integrity of dielectric materials by exerting 20N force. The BPA10 is called out in IEC 60335, 60950, 61010, UL, CSA and European Norms. It is used to check the integrity of dielectric materials by exerting 20N force. The Ball Pressure Apparatus is made of stainless steel for long life. Since accelerated life procedures are used for this oven test, more than one apparatus may be useful for parallel testing.

  • BiGEN Power Supplies

    BiRa Systems Inc.

    BiRa Systems and TDK-Lambda collaborated to develop and support an accelerator laboratory family of programmable DC power supplies. The BiGEN family of power supplies provides many features including EPICS compatibility, interlock monitoring, precision current regulation, and air filter kits to fit the harsh accelerator environment. The BiGEN family of power supplies was based on the TDK-Lambda Genesys™ power supplies which can be configured in parallel and series for additional output power.

  • Pattern Generator

    PI-2005 - Pulse Instruments

    As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.

  • 42.0Hz~5.00MHz, Programmable Impedance / LCR Meter

    3550 - TEGAM Inc.

    The Model 3550 Programmable Impedance/LCR Meter tests within the extensive frequency range of 42.0 Hz to 5.00 MHz. It measures L, C, R, |Z|, Y, D, Q, R, Phase, G, X, B, V, I, F, in series or parallel modes. With a basic accuracy of 0.10%, the 3550 is designed for a wide variety of automated or manual test applications. RS-232C & I/O interfaces are standard; GPIB or BCD interfaces are optional.

  • Hot Swap, Fault Tolerant, Ultra Reliable Power Supply

    Series HSP - Kepco, Inc.

    The Kepco HSP series provides mission critical power. HSP comprises a group of twelve models, eight 1000 watt power supplies with outputs from 3.3 volts to 125 volts and four 1500 watt power supplies with outputs from 24 volts to 125 volts. All models feature current-sharing for parallel redundant N+1 operation. Models with the or-ing diode, option R, are capable of hot swapping when plugged into Kepco¹s RA 60 series rack adapter. Models with a digital meter, option M, are also available (see photo, right). A mechanical keying scheme allows the user to define which power supply will plug into a specified slot in the housing. Output voltage and current limit settings are adjustable from the panel and may be remotely adjusted.

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