Showing results: 346 - 360 of 587 items found.
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Commander Accelerator -
HARRIS TUVEY
The Commander High Speed Programmer (HSP) is low overhead system designed to test Flash Memories, PLA's and Micro-controllers. The parallel multi-module architecture provides the flexibility to program and test multiple devices. It's full-featured capabilities support chip erasing and programming, sector erasing and programming, sector protect and unprotect, and data verification functions.
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Carl E. Holmes Company
The MS-Series features constant voltage and current control with easy, quick installation and maintenance. Modular versions easily increase the output by means of series or parallel connection. All models have DC short circuit protection. With forced air-cooled models, the cooling air quantity is controlled in relation to the load reducing contamination and noise levels.
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Model 4910 -
Aplab Limited
Aplab Model 4910 is a microprocessor based digital Autocompute LCR-Q Meter that meets today’s laboratory requirements, in the production line and the quality assurance area. It features fully autoranging and automatic operation over a wide range of measurements. Model 4910 measures inductance, capacitance, resistance and quality factor to a basic accuracy of ±0.25% of the reading for values upto 2000H, 2000μF, 2M ohm and Q factor upto 99 respectively. Measurements can be made at a frequency of 100Hz or 1KHz as required and either the series equivalent or parallel equivalent component values can be displayed.
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VP39701 -
LinkedHope Intelligent Technologies Co.,Ltd.
Based on NVIDIA GeForce GTX 1060 embedded GPU architecture, VP39701 is a high-performance 3U VPX GPU image & video processing board designed for applications of embedded image processing and GPGPU.VP39701 has 2x DisplayPort and 1x VGA on front with the resolution up to 3840*2160. Besides, GPU of VP39701 is equipped with 6GB GDDR5 video memory, 3.59 TFLOPS single/double precision peak processing ability and 1280 CUDA cores. Therefore, VP39701 is highly suitable for HD output (1920x1080), 4K output (3840x2160), high-performance parallel computing and other applications and fields.
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PCS500AU -
TEAM SOLUTIONS, INC.
The PCS500AU is a digital storage oscilloscope that uses a computer and its monitor to display waveforms. All standard oscilloscope functions are available through the supplied Windows program. Its operation is identical to that of normal oscilloscope apart from the fact that all operations can be performed with the mouse. Connection is through the computer's parallel port and the scope is completely optically isolated from the computer port. The oscilloscope and transient recorder have two completely separated channels with a sampling frequency up to 1GHz. Any waveform displayed on the screen can be stored for later use in documents or for the comparison of waveforms.
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mks Ophir
Integrating spheres are used especially for measuring divergent light sources such as LEDs. The light is introduced through the input port, then reflected many times by the highly reflective interior of the sphere until it illuminates the inner surface uniformly. A detector samples a small fraction of this light to measure the total power input. Ophir integrating spheres have a highly reflective diffuse white coating for measurements independent of beam size, position and divergence. There are several sphere sizes, apertures and wavelength regions available. The large IS6 series has 2 configurations for measuring divergent or parallel beams.
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Pilot -
The Phased Array Company
Pilot is a next generation multi-channel UT device. Its one-of-a-kind specifications make the Pilot capable to perform advanced ultrasound inspections. Pilot is unique in its capacity to meet the most demanding needs of various industries, from aeronautics (employing composite and honeycomb structures) to in-line, as well as TOFD and many other applications with stringent requirements. Compact and powerful, this 8-channel full parallel, or up to 64 multiplexed, unit pushes the boundaries of the UT benchmark as it is more efficient than any other conventional UT system in the NDT market.
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61610 -
Chroma Systems Solutions, Inc.
Power Rating:61511/61611: 12KVA61512/61612: 18KVAVoltage Range: 0-150V/0-300V / AutoConfigurations with input voltage of 220V or 480VFrequency: DC, 15Hz-1500HzSingle-phase or three-phase output selectableProgrammable slew rate setting for changing voltage and frequencyProgrammable voltage and current limitHigh output current crest factor, ideal for inrush current testingTurn on, turn off phase angle controlTTL signal which indicates output transientComprehensive measurement capability, including current harmonicsAnalog programmable interfacesRemote interface: GPIB, RS-232, USB and EthernetCapable of delivering power output up to 90KVA by implementing Master-slave parallel operation
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A1 / C1 / C2 -
Becker & Hickl GmbH
*bh FLIM Embedded in Nikon NIS-Elements Software*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Excellent Timing Stability*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Detection Wavelength Range from 360 nm to 700 nm
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RPT-5 -
DeltaTech Electronics
The RPT-5 device is used for performing an independent, parallel pressure measurement in storage fuel systems such as Common Rail (Diesel) and GDI/FSI (petrol). The tester, apart from pressure value, also diagnoses power supply of a sensor. Additional advantage is the capability of automatically detecting the terminals of the sensor, which is useful especially when using needle probes.
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EAC-4Q-KS -
ET System Electronic GmbH
*Single system from 15 kVA to 90 kVA and in parallel up to 500 kVA*Seamless transition between source and sink mode*Output: AC, DC, AC + DC*Output up to 2000 Hz (-HF option)*Add single-phase output (option -1P)*Up to 750 V LN output*Modular construction
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Extech 382270 -
Extech Instruments Corporation
382270 is a Quad Output DC Power Supply has two 0 to 30V/0 to 5A outputs plus two fixed auxiliary outputs of 3 to 6.5V/3A and 15V/1A. The two 30V outputs can be combined in parallel for 10A or in series for 60V. Comes complete with 4 pairs of test leads (banana plug to alligator clip) and an AC cord.
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6310/A -
Chroma Systems Solutions, Inc.
Chroma 6310A Programmable Electronic Load integrates microprocessor capabilities into each load module and mainframe to provide simple and accurate parallel operation to optimize the speed and control among multiple load modules. All load modules may be configured to work synchronously, to test multiple outputs simultaneously, thus simulating real life applications.
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SKZ156B -
SKZ Industrial Co., Ltd
It is suitable for the determination of tear strength (Elmendorf Method). It adopts single chip for data detection and processing, pneumatic component performance process control, large-sized LCD dot matrix display screen, which prompts operation procedures and tests data. With serial and parallel output, it can output the detection report via printer, and also get connected with the computer.
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Amida Technology, Inc.
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
