Showing results: 226 - 240 of 587 items found.
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T5822 -
Advantest Corp.
Wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).
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327/328 -
Sensoray Co., Inc
Model 327 and 328 are bus-to-bus adapters that allow operating a PCI board from a PC/104+ card stack. They allow selection of important PC/104+ signals using jumper plugs, thereby avoiding the requirement of using hardwired settings. Model 327 aligns the PCI board parallel to the PC/104+ boards, while model 328 places it perpendicular.
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MIG0612T-K12 -
EMC Partner AG
Designed for testing telecom surge protection devices according to ITU-T K12. The generator has two indepedent impulse outputs which allow testing of two and three terminal protection devices such as gas discharge tubes (GDT). The generator can be configured for two terminal devices or with the outputs in parallel to increase the current impulse for two terminal devices.
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MIG0624T-K12 -
EMC Partner AG
Designed for testing telecom surge protection devices according to ITU-T K12. The generator has two indepedent impulse outputs which allow testing of two and three terminal protection devices such as gas discharge tubes (GDT). The generator can be configured for two terminal devices or with the outputs in parallel to increase the current impulse for two terminal devices.
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AUTO DIAGNOSTECH LTD
This Digital Auto Multi-Meter (DAMM) was designed solely for Automotive Technicians for troubleshooting all electrical problems encountered in the vehicle. Be it a 6V, 12V or 24V system it can be used to check Amps draw directly on the fuse (Mini, ATC or Maxi Fuses) without having to remove it and measure parasitic drain current using the parallel method at the fuse box.
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PDMS-SP -
FiveLab Co.,Ltd.
≫Since "Rotating retarder method" is used for this system, the system can perform very accurate measurement for all range of Delta value without retarder in/out.≫Since detector unit can be turned independently from detector arm, it can detect parallel shifted light.≫Standard software is including "Data Viewer" which make it easy to confirm about
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STAr Technologies, Inc.
STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.
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PW-7033 -
PINTEK Electronics
*Portable type, small size design*Overload protection*3 sets output: 0~32V/0~3A x 2 + 5V/3A*Parallel: 0~64V/0~3A or + 32V ~ -32V/0~3A*Series: 0~32V/0~6A*3 digits, 4 sets LED display, Green is display for voltage, Red is display for current, easy to read, no mistakes.
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Axiomtek Co., Ltd.
The ETX modules (114 x 95 mm) are very compact and highly integrated SBCs that integrate core CPU and memory functionality, standard personal computer (PC) peripheral function such as graphics, USB, serial and parallel ports, keyboard/mouse, Ethernet, IDE, PCI, and ISA buses. All ETX modules have a standardized form factor and a standardized connector layout.
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YAVTB000 -
6TL Engineering
When wiring a test fixture, you often have a need to join three or more wires onto the same test point. This module solves this problem, adding test points for manual test probes and a 4 position DIP switch. Circuits 1 and 2 feature up to 5 poles in parallel to increase the space for power supply terminals.
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MA 2013/D/H/VPC-G12x-18 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 25,00 kg
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MA 2013/D/H/Pylon -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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MA 2013/D/H -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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MA 2012/D/H/VPC-G12x-18 -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,50 kg
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MA 2011/D/H -
INGUN Prüfmittelbau GmbH
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg