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Product
GPIB Parallel Interface
Model 4813
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* Provides 128 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Optional Relay Driver boards add 64 or 128 Relay Drivers.
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Product
Parallel Memory Test Solution
Magnum2
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Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Product
Parallel Active Multifunction Filter
SINAF 3.0
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Lifasa - International Capacitors, SA
The active filters offer the best possible solution to solve the problems related to the quality in the electrical network, both in industrial three-phase installations, as commercial or service installations. These problems are caused, not only by the harmonics, but also by the consumption of reactive power (generally of capacitive type).
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Product
Dual Parallel Strain Gauges
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Dual Parallel Strain Gauges strain gauges have two measuring grids arranged parallel to each other. Typical applications include measurements on bending beams
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Product
GPIB Parallel Interface
Model 4803
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* 4803 Board provides 40 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Dual GPIB headers support connections to a GPIB Connector/Address Switch Assembly or to a GPIB Flat Ribbon Cable Assembly.* Optional Relay Driver board drives 24-40 relays.
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Product
Serial to Parallel Controller
E84 SPC
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300mm equipment manufacturers utilize this off-the-shelf E84 communications controller to provide SEMI E84 compliant communications for their products. With its built-in Load and Unload algorithms it is the perfect E84 communications solution for process tools, stockers, load ports, FOUP buffers, smart storage shelves and simulation load ports. The E84 SPC easily integrates with equipment controllers through a standard serial communications connection.
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Product
IP-Parallel-BA1 "IP-Tape"
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The IndustryPack compatible IP-Tape design adds 48 digital parallel IO lines to one slot of your carrier board. The IO is dedicated to a DTC interface. Other interfaces can be implemented. The DTC interface has 22 Address, 16 Data plus Parity, 4 control and 5 status lines. Parity is automatically generated in write mode and checked in read mode.
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Product
GPIB to Parallel Printer Interface
Model 4892B
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* Adds a GPIB Interface to Printers with Centronics or IEEE-1284 parallel interfaces. See the compatible printer list. * Replaces obsolete printers and plotters with a current HPGL/PCL5 printer.* Prints and Plots from most Analyzers. * Large 256 kbyte buffer and high speed GPIB interface off-loads the instrument and reduces printing time.* No program changes required.* Rack mountable in 1 U high rack mount kit.* Includes universal VAC Power Adapter and printer cable.
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Product
PXI 32 Chan I/O Parallel I/P Prog Threshold
40-412-111
Digital I/O
A 32-channel Digital I/O module with high output voltage and currentcapability and a dual variable threshold input. Each of the 32 channel outputs can be used to drive the output high or low usinga high current capacity drive capable of sourcing 0.4A from the high side or 0.5Asink on the low side for each channel. The module is available in two versions witheither serial or parallel capture of the input levels.
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Product
Serial And Parallel Port For PCIe
DTA-2142
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Serial and parallel interfaces for ASI and SD-SDI, supporting multiple electrical standards including M-LVDS and LVTTL. Clock rates up to 108MHz are supported.
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Product
Portable Parallel Analyzer
SL1000
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Perform up to four colorimetric and two probe-based measurements in parallel, and complete the entire test suite in 25% of the time. Complete more tests on site, get the results you need faster, and visit more sites in each shift.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Ethernet Parallel Interface
Model 8013
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* Provides 128 high-power TTL I/O lines.* Fully VXI-11 Compliant plus Raw Socket for easy programming with Visual Basic or C, Agilent VEE and LabVIEW.* Standard board has a horizontal Ethernet connector and 150-pin Digital IO connector on the component side. * Mates to Relay Driver Boards with 64 or 128 Relay Drivers.* Mates to 115650 Connector Board with 4 flat ribbon headers.
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Product
Parallel Electrode SMD Test Fixture
16192A
Test Fixture
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
PXI 32 Chan I/O Parallel I/P Prog Threshold
40-412-101
Digital I/O
A 32-channel Digital I/O module with high output voltage and current capability and a dual variable threshold input. Each of the 32 channel outputs can be used to drive the output high or low using a high current capacity drive capable of sourcing 0.4A from the high side or 0.5A sink on the low side for each channel. The module is available in two versions with either serial or parallel capture of the input levels.
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Product
MEMS Device-Oriented Testers
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Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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Product
Automatic Span Gasgenerator Unit
ASGU-370 Series
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The multi point calibration units ASGU-370 series is designed for simultaneous (parallel) or step by step (serial) checking of gas analyzers. It is primarily installed in laboratories for quality assurance and is also used for the production of gas analyzers.Furthermore are the calibration units as a Transfer standard in portable suitcase available. Here we have for ongoing quality control in field the versions all in one aluminum suitcase and for a flexible and back-friendly wearing comfort the ASGU-370TS SPLIT.
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Product
MEMS Microphone Test
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The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Validation Testers
M Series
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The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
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Product
High-power Programmable DC Laboratory Power Supply (5kW~180kW)
FTP9000 Series
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Shenzhen FaithTech Technology Co., Ltd.
FTP9000 series DC power supplies provide wider voltage and current output range at full power, this means both low voltage/high current and high voltage/low current devices can be tested using a single power supply. The FTP9000 series offer a high power density, with 15 kW in a 3U chassis. The standalone power ranges from 5 kW to 180 kW, voltage ranges from 80 V to 2250 V, and current up to 6120 A. For ultra-high-power applications, FTP9000 series allow for master-slave parallel up to 10 identical units, maximum output 1.8 MW, with current automatically shared.
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Product
IP Parallel IO
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IndustryPack compatible IP-Parallel-IO with counter and timer design adds up to 48 digital parallel IO lines to one IP slot of your carrier board.
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Product
Linear Slide
M-011
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Physik Instrumente GmbH & Co. KG
M-011 ultra-high-precision magnetically-coupled stages use the force of integrated magnets to preload the bearing. This magnetic preload results in extremely uniform and smooth motion with minimum friction. Unlike conventional stages, where two bearings with limited parallelism guide the carriage (inducing runout and rotational errors) in M-011 stages, only one of the two linear bearings has a guiding function (V-groove) while the second bearing is for support only (U-groove).
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Product
Shore Durometer Test Stand
UI-FT31
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Shore Durometer Test Stand is used to support the durometer presser foot surface parallel to the sample support table to better complete the test.





























