Parallel Memory Test Solution

Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.

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Memory Test Software

Teradyne, Inc.

Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.

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Ultra-High Performance FLASH and DRAM Memories Test Solution

Magnum V - Teradyne, Inc.

Teradyne’s Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance FLASH and DRAM memories. Magnum V’s largest configuration delivers up to 20,480 digital channels at 1600Mbps per channel.

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Magnum VUx for NAND Protocol Test Enhancement

Magnum VUx - Teradyne, Inc.

Teradyne’s Magnum VUx system is a flexible, superset test platform for all NAND and MCP products, both cutting edge UFS 3.0, uMCP, and PCIe Gen 4 mobile and automotive devices, as well as SSD NAND ONFI and Toggle, and legacy NAND products such as UFS 2.1, PCIe Gen 3, e.MMC, and eMCP.

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Ultra-high Performance Solution for Memory Device Test

Magnum EPIC - Teradyne, Inc.

Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.

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Parallel Memory Test Solution

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Memory Test Software

Ultra-High Performance FLASH and DRAM Memories Test Solution

Magnum VUx for NAND Protocol Test Enhancement

Ultra-high Performance Solution for Memory Device Test