Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Catalysis and Thermal Analysis
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A system for catalyst characterisation, reaction testing, kinetic and thermodynamic measurements.
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Aggregation Analysis System For Biopharmaceuticals
Aggregates Sizer
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The "Aggregates Sizer" aggregation analysis system enables the quantitative evaluation of particle amounts in the SVP range as a concentration (unit: μg/mL). Aggregations of biopharmaceuticals can be categorized into 3 ranges: IVP (In-visible Particle), SVP (Sub-visible Particle), and VP (Visible Particle), according to their particle size. Until now, no particle size analyzer could cover the SVP range with a single measurement. Therefore, multiple methods had to be used. Aggregates Sizer completely covers the SVP range.
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Pro Antenna Analysis Software
MININEC
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MININEC Pro is an antenna analysis program for Windows and Macintosh computers. Any type of antenna may be analyzed. The physical design of the antenna is entered (such as the lengths of wires and elements). For a given frequency, the feedpoint impedance is calculated, along with theoretical efficiency.
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Analysis System
Trident (EDS-EBSD-WDS)
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The Trident Analysis System combines the latest advances in Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Wavelength Dispersive Spectrometry (WDS) in a single analytical tool. With the Smart Features included in the easy to use EDAX analysis software, each technique can be optimized and used independently or they can be combined to provide seamless integration, resulting in comprehensive data collection that can then be shared between the different techniques.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
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Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Contactless One-Point Wafer Thickness Gauge
MX 30x
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The MX30x series are manual one-point Thickness gauges for silicon wafers.
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Silicon & Compound Wafers
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Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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High Performance Isotope analysis of LC Separated Compounds
Iso CHROM® LC
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Elementar Analysensysteme GmbH
Unlike the existing LC-inlet solution via chemical oxidation, the iso CHROM LC works with high-temperature combustion. It quantitatively converts organic carbon to CO2.In addition, the easy-to-use iso CHROM LC shows outstanding precision, accuracy, and linearity without significant peak broadening that can diminish the chromatographic performance. In continuous operation, virtually all peaks in a chromatogram can be analyzed for the stable isotope ratios of carbon.
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Spectrum Analysis For P50xxB Up To 9 GHz
S970902B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Blade Timing Analysis Software
Blade Timing BT
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APEX Turbine Testing Technologies
BT is a data analysis software product for post-processing tiptiming data from laser-based and capacitance-based tiptiming systems (also known as NSMS).
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3D Sound Intensity Analysis Software
DS-0225A
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Finding out the position where the noise is occurring, and grasping the state of acoustic propagation are important ways to find effective noise countermeasure or improvement of acoustic environment.
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High Resolution Frequency Response Analysis (FRA) System
TR-AS FRA
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The Frequency Response Analysis (FRA) on power transformers is used for diagnosis at works, after putting into operation and for maintenance on site. The frequency dependent admittance is determined and recorded as fingerprint.
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Portable Wafer Probe Station
PS-5026B
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High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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Non-contact Inline P/N Checker Module For Solar Wafer
PN-100BI
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*Principle: Photovoltaic effect with the laser diode*Suitable for production line and tranceportation system*Connect to host PC by LAN to send measurement command and data
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AXIe Logic Analysis & Protocol Test
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Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
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NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Chemical Analysis and Corrosion Testing
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Performing chemical analysis of metal alloys including both ferrous and non-ferrous alloys.Chemical analysis involves determining the chemical constituents of metals and related materials.An industry leader and co-operating laboratory for qualifying Calibration Standards for Chemical Analysis.Our chemical laboratory processes include Spectroscopy – Optical Emission Inductively Coupled Plasma, gas analysers, wet chemical, Intercrystalline/ Intergranular Corrosion (including G28, G48 etc).
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IP Video Stream Analysis And Monitoring
TSM100
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The Mividi TSM100 is an MEPG transport stream analyzer and IP video monitoring system for monitoring the quality of digital video services (QoS) delivered via IP or ASI interfaces. It can simultaneously monitor up to 300 services and perform deep MPEG analysis and video quality check 24 x 7. The system can be used for analyzing MPEG-2, H.264 and HEVC programs delivered over the Internet, as well as head-end equipment that uses IP for video transmission. The TSM100 provides IP layer analysis, MPEG transport layer analysis, key frame decoding, audio loudness measurement and service profiling. The system receives IP encapsulated digital audio and video data via 1 Gbits or 10Gbits Network adaptor. It will monitor all media flows in the network, perform extensive tests on standard compliance and user profile matching, and generate alarms when TS, video or audio errors occur.
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Multifunction Data Collection and Analysis System
2002
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The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Water Analysis Meters & Electrodes
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Ideal for Accurate Everyday Measurements in the Laboratory
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Stator Wedge Analysis
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Loose stator wedges can lead to coil vibration and erosion of stator insulation. Iris Power stator wedge tightness testing provides a consistent and quantitative means of identifying the location and severity of loose stator wedges in order to plan rewedging or other necessary repairs.
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Seismic Analysis Software
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GeoSonics announces our latest software suite. AnalysisNET is the most comprehensive and advanced software for GeoSonics 3000 Series seismograph. The software combines Seismic Analysis and Event Manager software in a single package that employs the .NET framework. AnalysisNET allows easier access to data files provides multiple report combinations and gives you the ability to manage your data.
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Measurement Analysis Equipment
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Facility fault diagnosis measuring instrument with technology that accurately tracks the heating part and abnormal noise generating part during operation of machinery using thermal imaging camera and microphone
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Advanced NDT Data Acquisition & Analysis
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WeldSight™ software’s comprehensive acquisition and analysis tools enable you to engineer compliant and repeatable advanced phased array (PA), ultrasonic testing (UT), and time-of-flight diffraction (TOFD) weld inspections.
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Single Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Single Wafer Transfer Tools
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X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Standard Parameters for Analysis
C-Cell Mono
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C-Cell Mono is the original system and comes with the standard parameters for analysis. C-Cell Mono takes 1 image of the sample to produce analytical results such as crust wall thickness, size, shape and location. C-Cell Mono is the entry level model of the C-Cell range and offers all the basic image analysis needs for a baker.
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Time-Series Data Analysis Software
OS-2000 Series
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OS-2000 series have been received well as time-series data analysis software which can perform flexible data-edit from huge amount of time-series data. The OS-2000 series can handle original format of other company's recorder and general-purpose formats of CSV and WAVE. In addition, simultaneous display, layout and overlapping can be performed smoothly without restrictions by the kind of data format or the number of sampling frequency.
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Comprehensive Analysis for MediaLB Data
MediaLB System
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A MediaLB system consists of several MediaLB devices and one MediaLB controller (typically an INIC chip). The INIC serves as a transceiver for the MOST network and as a controller for MediaLB, which assures synchronization to the MOST network.
