Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Complete Graphical Power Quality Analysis System
PK5064-PRO+
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The PK5064-PRO+ is the top choice for comprehensive power quality studies, energy audits, load studies, harmonic analysis, and more. Wide-range flexible current probes allow you to get into tight and confined spaces, wrap around large conductors, and measure almost any AC circuit that comes your way.
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BACnet Basic Evaluation, Analysis And Testing
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BACbeat is the industry's first easy-to-use all-purpose BACnet evaluation, analysis and testing tool for Windows. BACbeat runs under Windows 7,8,10, Server 2008/2012 and XP, and provides a robust set of client features tailored to the needs of end-users, installers and product developers.
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Dynamic Mechanical Analysis
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The DMA systems from Anton Paar perform dynamic mechanical analysis in torsion, tension, bending and compression at unprecedented precision. Whatever your DMA requirements are, the DMA systems from Anton Paar are efficiently and comfortably adapted to meet your needs. Use the systems for the dynamic mechanical analysis of solutions, melts, solid bars, films, foils, or reactive resins.
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Water Iron Analysis
Aztec AW633
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The Aztec 600 colorimetric iron analyzer provides reliable and accurate measurement of iron concentrations to improve drinking water quality and optimize chemical usage.
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Inline Wafer Testing
IL-800
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Image Analysis Software
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Offering you a complete choice of products which include brinell pro software, caliper pro software, cast iron analysis software, hardness pro image analysis software, live measurement software and material plus software.
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Thermal Analysis
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The TORC (Thermo-optical Oscillating Refraction Characterization) technique applies decades of know-how in optical instrumentation to thermal analysis in a novel and unique way. The technique requires minimal sample preparation at maximal tolerance for sample properties. You can determine the coefficient of thermal expansion, glass and phase transitions as well as polymerization for various samples: liquids, gels, pastes, and certain solids. For example: cured and uncured resins, adhesives, glues, etc. can easily be characterized. Both thermal and time-dependent processes can be monitored with minimal effort.
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Wafer Test
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Product
Complete Power Quality Analysis System
PK4564-PRO
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This system contains the all recommended equipment for almost any power quality study in the world. Other tiers in the PK4564 class include the base PK4564 and PK4564-PRO+ systems.
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Spectroscopy, Elemental & Isotope Analysis
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Research, production and analytical laboratories worldwide rely on us for rapid, efficient qualitative and quantitative analysis. Our innovative instruments and user-friendly software serve a range of industrial, educational, environmental and health markets. We offer a comprehensive portfolio for the quantification and identification of trace elemental species at ppm to sub-ppt levels in addition to isotopes. We also provide a wide range of lab-based and handheld instruments employing analytical techniques including XRF, FTIR, NIR, Raman spectroscopy, IRMS, ICP-MS and more.
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Product
Contactless Wafer Geometry Gauge
MX 20x series
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The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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Contactless One-Point Wafer Thickness Gauge
MX 30x
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The MX30x series are manual one-point Thickness gauges for silicon wafers.
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Static Code Analysis Tool
Klockwork
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Klocwork integrates seamlessly into desktop IDEs, build systems, continuous integration tools, and any team's natural workflow. Mirroring how code is developed at any stage, Klocwork prevents defects and finds vulnerabilities on-the-fly, as code is being written.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Test Instrument
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Structural Analysis Professional Software
Robot™
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Robot Structural Analysis Professional software provides engineers with advanced BIM-integrated analysis and design tools to understand the behavior of any structure type and verify code compliance.
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Gas Analysis
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Our infrared gas detectors provide superior sensitivity and reliability that may be translated into a more effective early warning system when monitoring atmospheres for gases at trace levels. Our technology also offers the opportunity to perform sophisticated gas analysis. One example: To assure personal safety during a medical procedure, our gas detectors deliver a precise monitoring of the ratio of exhaled gases of a hospital patient who is under general anesthesiology. Another example, no canary need die in a mine if Dexter gas detectors are installed on the job. Infrared lead detectors, whether mobile or mounted, can be a critical element in your health and safety strategy at home and on the job, whatever life forms it is your responsibility to protect.
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Serial to Parallel Analysis Package
B4601C
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Your system uses serial buses to communicate between ICs and transfer data to and from peripheral devices. Sifting through thousands of serial bits by looking at long vertical columns of captured 1's and 0's can be very tedious, time-consuming, and error prone. The Keysight Technologies B4601C serial to parallel analysis package is general-purpose software that allows easy viewing and analysis of serial data.
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Measuring & Analysis Equipment
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Quality management for semiconductor manufacturing processes and liquid crystal panel manufacturing processes, which require nano-order precision. Oxygen analyzers used in firing furnaces and N2 reflow ovens.Water quality meters used to monitor the water quality of plant discharge and the pure water used in semiconductor manufacturing processes.Our measuring and analysis equipment is used in a wide range of fields.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Static and dynamic analysis
MEMS
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Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
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Carbon/Nitrogen Analysis by Combustion
928 Series
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By incorporating state-of-the-art hardware and an on-board touch-screen software platform, the 928 Series allows you to easily handle the most demanding sample applications. The core capabilities and performance of previous generations of LECO macro combustion instruments have been maintained, while key improvements have been made in throughput, uptime, and reliability. Macro sample mass ability (up to 3 grams for Nitrogen/Protein model regardless of sample carbon content) with rapid cycle times and a resulting low cost-per-analysis make the 928 Series ideal for analysis of characteristically heterogeneous, difficult to prepare, or low analyte level samples.
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Multi-Laser Nanoparticle Tracking Analysis (NTA)
ViewSizer 3000
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Exosomes, viruses, and nanoparticles all have wide size distributions which defeat traditional Nanoparticle Tracking Analysis (NTA) analyzers. The ViewSizer 3000 features simultaneous measurement with three lasers to collect the most accurate distribution and concentration information over a wide range of sizes within the same sample. Where the signal from a particle is too bright and saturates the detector from one laser, the software automatically uses data from a lower power laser to ensure the most accurate size and concentration information. On the other hand, when scattering from one laser is too weak for detection, the software uses data from a higher power laser to accurately track the particle.
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Fat Analysis
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Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
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Biomolecule Analysis Tools
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In gene therapy and vaccine products, ensuring purity during downstream processing is especially challenging. Fast and efficient tracking of target biomolecules and removal of impurities is critical, because it directly affects product yield and purity. Sartorius‘ analytical chromatography column solutions can help provide this information in real-time, through at-line monitoring of large biomolecules including viruses, pDNA, and mRNA.
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PathWave Vector Signal Analysis Software
89600 VSA
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A comprehensive set of tools for demodulation and vector signal analysis.
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Product
8VSB/QAM And ASI Analysis Probe For USB-2
DTU-236A
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DekTec's USB-2 hardware-based analyzer for 8VSB and QAM. Equipped with advanced RF measurement options and designed to operate USB powered, this is a very convenient tool for analysis in the field.
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Sound and Vibration Analysis
Compact Analysis
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Compact Analysis is an ArtemiS SUITE module which is focused on the basic functions and the ideal tool for tasks that only require a few clicks.
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Analysis Software
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The Waveform Processing Software AS-70 reads data from WAVE files and offers a wide range of functions, including graph display, level processing, frequency analysis(FFT analysis and octave band analysis), file output, and playback.
