Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Software Composition Analysis
SCA
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Black Duck® software composition analysis (SCA) helps teams manage the security, quality, and license compliance risks that come from the use of open source and third-party code in applications and containers.
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Product
Data Acquisition & Analysis
FlowCam 5000
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Yokogawa Fluid Imaging Technologies, Inc.
FlowCam 5000 is our most affordable instrument. Streamlined for rapid data acquisition and analysis, it quickly and easily images, measures, analyzes, and counts microparticles suspended in a fluid medium.
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Product
Sensor Placement & FEA Analysis
GageMap - GM
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APEX Turbine Testing Technologies
Apply strain gages and accelerometers to your finite elementmodel independent of the mesh anywhere you want, or letGagemap do it for you.
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Product
High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
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The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Product
Surface Form Analysis System
Tropel® FlatMaster®
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Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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Product
In-situ Wafer Temperature Monitoring
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CI Semi's family of noncontact temperature monitors (the NTM line), offers high end pyrometry products for the measurement of wafer temperatures during process. CI Semi’s flag ship of the line, the NTM Delta, incorporates real-time, same point emissivity measurement and compensation making it the ideal solution for in situ monitoring for processes such as RTP, CVD and PVD. The NTM family is sold to leading tool manufacturers.
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Product
WDXRF Wafer Analyzer
2830 ZT
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Product
Log Analysis Reporting Suite
Cyfin
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Cyfin is a customizable employee Web-use forensic log file analyzer and reporting solution. It is used by a variety of business and government organizations around the world. Scalability - Most scalable commercial log data analysis tool. Forensics - Capable of generating extremely detailed user audit reports. Comprehensive - Dashboard charting and trending system. Compatibility - Palo Alto, IronPort, SonicWall, WatchGuard, and many others. Regulatory Compliance - Covers requirements such as CIPA, HIPAA, & others.
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Product
Circuit Breaker Analysis System
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Weshine Electric Manufacturing Co., Ltd
1. Time measurement: 12 fracture intrinsic points, closing time, with the same period, phase with the same period.2. Reclosing measurement: each fracture closing - minute, minute - closing, minute - closing - minute process time, one minute time,one closing time, two closing time, gold short time, no current value.3. Bounce measurement: closing bounce time, bounce times, bounce waveform of each fracture, rebound amplitude of each fracture.
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Product
Thermalyze Extension for Steady State Analysis
Lock-In
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Steady-state thermography is limited to detecting hot spots that heat up a minimum of 100 mK (0.100°C). This may be useful for locating shorts on high-power devices, but is inadequate for detecting low power defects such as semiconductor device leakage current or short circuit with very low or very high resistance. Steady-state thermography also suffers from poor spatial resolution as the heat from localized hot spots diffuses rapidly, blurring the location of the heat source.
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Product
Blade Timing Analysis Software
Blade Timing BT
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APEX Turbine Testing Technologies
BT is a data analysis software product for post-processing tiptiming data from laser-based and capacitance-based tiptiming systems (also known as NSMS).
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Product
Thermal Image Analysis Software
Thermalyze
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Thermalyze software provides a stable platform from which to perform sophisticated temperature analysis and failure analysis testing. Tools such as Emissivity Tables allow you to perform true temperature mapping on the surface with varying emissivity. Lock-in thermography tests enable you to detect heating below 0.001°C.
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Product
Analysis Software
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Analysis software that can streamline how you collect, analyse and report your bat call data.
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Product
PoE LLDP Emulation (PD) & Analysis for 802.3at & 802.3bt
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Integrated PoE LLDP and Load Emulation in a Single Instrument. IEEE 802.3at and 802.3bt LLDP Compliance Analysis. Independent, Per-Port 802.3at and 802.3bt LLDP Emulations. Flexible Single and Dual Signature PD LLDP Emulations. One-Click LLDP Protocol Capture and Analysis. Pop-Up Excel Spreadsheet Reports Assess Protocol Content and Timing. Enables One-Click Emulated Power-Ups and Standard Waveforms with LLDP Power Granting PSE's. Enables 2-Pair and 4-Pair PSE Conformance Test Suties with LLDP Capable PSE's. Enables 2-Pair Multi-Port Suite with LLDP Capable PSE's. Available for PSA-3000 and PSL-3000 Platforms.
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Product
OC-3/STM-1 And OC-12/STM-4 Analysis And Emulation Card(w/ GigE And USB 2.0)
LightSpeed1000™
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Voice, data, and video traffic is exploding as smartphones, IP TV, video streaming, and "cloud" based services takeoff. A majority of the backbone transport for these applications continues to be SONET and SDH optical transmission networks. A dominant protocol for IP transport is PoS (Packet over SONET) and another is ATM (Asynchronous Transfer Mode). Both schemes are packet based, with ATM using fixed size packets of 53 bytes called "cells", and PoS using variable packet sizes closely matching to Ethernet frames. GL's LightSpeed1000™ hardware platform (PCIe Card and USB Pod) is capable of OC-3/12 and STM-1/4 wire-speed processing on quad optical ports for functions such as wire-speed recording and wire-speed playback of Unchannelized and Channelized ATM, PoS, and RAW Traffic.
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Product
Thermal Analysis
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The TORC (Thermo-optical Oscillating Refraction Characterization) technique applies decades of know-how in optical instrumentation to thermal analysis in a novel and unique way. The technique requires minimal sample preparation at maximal tolerance for sample properties. You can determine the coefficient of thermal expansion, glass and phase transitions as well as polymerization for various samples: liquids, gels, pastes, and certain solids. For example: cured and uncured resins, adhesives, glues, etc. can easily be characterized. Both thermal and time-dependent processes can be monitored with minimal effort.
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Product
Microwave Furnace for Ash, Bone Content & Carbohydrate Analysis
Phoenix
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The Phoenix line of microwave muffle furnaces offers unmatched versatility and speed in a rugged, easy-to-use system. Choose from two configurations and a variety of options!
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Product
Collaboration, Reporting, And Analysis Platform
Link-Live™
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Serving as a centralized site survey, test results, analysis, and tester management system, the free Link-Live™ Cloud Service transforms team workflows with the ability to quickly and easily log, document, and report test activity from all NetAlly hand-held network testers and analyzers. Once the instrument is connected to the Link-Live Cloud Service, your test results are automatically uploaded to the dashboard for project management, analysis, collaboration and reporting. You have the option of uploading additional files, screenshots, images, profiles, packet captures, location information, and comments anytime. Also, certain NetAlly instruments with AllyCare Support can receive firmware updates “over the network” from Link-Live as they become available.
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Big Data Analysis Platform
Essentia
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Essentia is a highly efficient and highly scalable solution for managing, processing and analyzing vast amounts of unstructured, semi-structured and structured data stored in cloud data lakes. This can be categorized as big data and/or complex data.
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Product
Spectrum Analysis, Up To 26.5 GHz
S930902B
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The S930902B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 26.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Signal Analysis
Harmonic Distortion Analysis
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The software is used for automatic measurement of the harmonic distortion factor and voltage r.m.s. of signals coming to the input channels of FFT spectrum analyzers. Adjustment to the frequency of the main component is performed automatically. The program is based on the measurement of the voltage r.m.s. of higher components by an external or internal reference signal.
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Failure Analyziz and Quality Assurance
NX20
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There's no room for error in the data provided by your instruments. Park NX20, with its reputation as the world's most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
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Product
Systems Analysis Interface
Saint2
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The Systems Analysis INterface Tool 2, a Delphi Preferred Tool, for Low-cost EOL Testing & Reflashing Without the Need of Additional Hardware.
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Product
AC Line Harmonics Analyzer Including Flicker Analysis With UK, Schuko Or US Socket.
HA1600A
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Compliance quality measurements to EN61000-3-2 and EN61000-3-3Measures peak or rms voltage or current, real or apparent power, power factor, phase etc.Tabular/histogram of 40 harmonicsVoltage/current waveforms displaysContinuous analysis with real-time graphical updateWide range of power connectors available320 x 240 pixel high-contrast displayUSB, RS232 and printer interfaces fittedPC control and documentation software supplied (HA-PC-Link+)
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Product
Water Silica Analysis
Navigator AW641
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ABB's Navigator 600 Silica analyzer substantially cuts the costs and maintenance associated with silica monitoring in power generation and other large-scale steam and water dependent applications.
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Product
Single Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Single Wafer Transfer Tools
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Product
Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
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*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
