Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Air Quality Analysis
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Ambient Gas Monitoring: We offer a variety of analyzers for the ambient monitoring of the criteria pollutant gases, including CO, NOX, SO2, and others such as CH4 and CO2. Source Gas Monitoring (Emissions Monitoring): Experience reliable measurement in your process for emissions compliance every time.Ambient Particulate Monitoring: Experience our monitoring technology and gain the power to do more than just inform.Emissions Calibrators: For continuous monitoring of mercury in exhaust stacks, waste incinerators, and cement kilns, or multi-gas models to control the calibration of gas concentrations.
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Vibration Analysis Software For Squeak & Rattle Testing
MB BSR Suite
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MB BSR SUITE is the complete solution for all measurement tasks in the field of NVH, Squeak & Rattle and Sound Quality testing. Comprehensive analysis and assessment capabilities also enable the use of the BSR Suite for analysis and evaluation of functional and operating noise, vibrational effects on humans as well as the acoustic and haptic feedback of controls and actuators. Predefined test configurations for typical tasks such as multi-channel road load data acquisition, drive-file generation and objective Squeak & Rattle and Sound Quality testing allow for fast and simple operation. Signal statistics and user defined thresholds or reference-curves can be used for objective evaluation of different acoustic or haptic quality criteria. In addition the development and integration of application- or customer-specific analyses and evaluation methods is also possible at any time. Contact MB to find a solution for your measurement task!
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Digital Image Correlation System for Complete 3D Warpage, Thermal Expansion, and Strain Analysis of Materials and Components in the Heating and Cooling Phase
Q-400 TCT
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The Q-400 TCT system is designed for complete three-dimensional and highly sensitive warpage, thermal expansion measurement and strain analysis of materials and components in the heating and cooling phase. Areas from 50 mm x 70 mm down to 2 mm x 3 mm can be investigated. Measurements can be done from room temperature up to 300°C and down to -40°C. The system is specially suited for thermal expansion measurement of electronic components and is frequently used in the development and testing of complex anisotropic materials, components, and structures in electronic applications.
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FTT Analysis Software
DS-0321A
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The DS-0321 is basic software for frequency analysis. With this software, you can resolve time-axis waveform into each frequency, and observe the level of each component. It fits the purpose of resonance frequency observation or careful observation of sound frequency component.
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Finite Element Analysis (FEA) Solution
Femap
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Siemens Digital Industries Software
Femap is an advanced engineering simulation software program that creates finite element analysis models of complex engineering products and systems, and displays solution results. Femap can virtually model components, assemblies or systems and determine the behavioral response for a given operating environment.
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SF6 Gas Analysis Systems
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Weshine Electric Manufacturing Co., Ltd
Discharges during switching operations in SF6 gas-filled plant lead, over time, to increased concentrations of toxic and highly corrosive decomposition products. The use of gas analysis instruments is absolutely necessary to monitor the concentration of harmful decomposition products, thus ensuring long-term plant safety.
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Sample Analysis
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With the wide range of particle characterization methods, having the right measuring device readily available and fully utilized can be challenging. At Particle Metrix, we offer professional sample analysis in our application laboratories, ensuring precise and reliable results. Our comprehensive consulting services complete our offering.
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Functional/Protocol Debug and Analysis Reference Solution
DDR4
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Highest confidence in measurement accuracy! Industry’s fastest triggering and data capture for DDR4 analysis, test, and debug.
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Packet Analysis Probe for PCI Express
N4220A/B
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When purchased with a logic analyzer, the application software you order is installed on the instrument hard drive. If you need to add application support after your initial logic analyzer purchase or are controlling a logic analyzer from a host PC, you must install the appropriate software before you can make measurements.
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Memory Analysis Software for Logic Analyzers
B4661A
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DDR3, DDR4, DDR5, LPDDR2, LPDDR3, LPDDR4, and LPDDR5 Analysis . The Keysight B4661A memory analysis software offers a suite of options that include the industry’s first protocol compliance violation testing capability across speed changes, a condensed traffic overview for rapid navigation to areas of interest in the logic analyzer trace, powerful performance analysis graphics, and DDR and LPDDR decoders. With the B4661A memory analysis software and a Keysight logic analyzer*, users can monitor DDR/2/3/4/5 or LPDDR2/3/4/5 systems to debug, improve performance, and validate protocol compliance. Powerful traffic overviews, multiple viewing choices, and real-time compliance violation triggering help identify elusive DDR/LPDDR system violations.
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Test and Analysis
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ESDEMC Technology will calibrate; the Contact Mode ESD current waveform and tip voltage to 4 GHz and 30 kV, the frequency response of ESD Target & Adapter Line to 4 GHz, and the DC Resistance
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Component Test and Analysis Laboratories
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The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Gas Analysis
FLOW EVO
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SmartGAS NDIR sensors offer many advantages for successful gas analysis and are ideal for process control. They are convincing where extreme precision and reliability are required. Various versions can be combined easily, which thus allows complex measurement tasks. All smartGAS sensors are characterized by low detection limits, low drift, a wide temperature range and extremely low operating and maintenance costs.
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Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Multivariate Analysis and Experimental Design Software
The Unscrambler
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Analytical Spectral Devices, Inc.
The Unscrambler software from Camo Software is a complete Multivariate Analysis and Experimental Design software solution, equipped with powerful methods including PCA, Multivariate Curve Resolution (MCR), PLS Regression, 3-Way PLS Regression, Clustering (K-Means), SIMCA and PLSDA Classification etc.
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Failure Analysis And Magnetic Imaging Services
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Micro Magnetics offers failure analysis services on a contractual basis. We maintain two current density metrology systems at our headquarters in Fall River and can produce maps of current flow in a wide variety of ICs and packages, usually with initial results delivered within 48 hours. Our engineers will work closely with you to understand and interpret the results in order to determine the root cause of the failure.
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Portable Oil Analysis Kits
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Monitoring lubricant condition in machine wear when and where it is needed significantly reduces the time required for laboratory analysis and improves machine reliability. Spectro Scientific offers a wide range of portable devices with field simplicity and lab accuracy. The product combinations are powerful for different applications as together they provide more comprehensive analysis of oil condition, contamination and machine wear condition. All Spectro portable devices are battery powered, use small amounts of oil, and do not require solvents or chemicals to clean. They are light weight and ideal for field use.
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Water Silica Analysis
Navigator AW641
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ABB's Navigator 600 Silica analyzer substantially cuts the costs and maintenance associated with silica monitoring in power generation and other large-scale steam and water dependent applications.
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Failure Analyziz and Quality Assurance
NX20
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There's no room for error in the data provided by your instruments. Park NX20, with its reputation as the world's most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
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Real-Time Analysis up to 255 MHz, Optimum Detection, Multi-touch
N9041B-RT2
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See, capture, and understand elusive signals as short as3.51 s with 100% POI and a complete set of advanced triggers, up to 110 GHz View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 VSA software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Chemical Analysis
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Chemical analysis involves determining the elemental constituents of a material. This information can then be used to determine if the material matches a required specification. At Keighley Laboratories analysis of a wide range of products covering many material types is undertaken although these are mainly metal or metal related products.
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Time Domain Analysis
S96010B
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The S96010B time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to time domain or time domain data to the frequency domain and runs on the E5080B.
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Wafer Bonder
AML
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Wafer bonding has found many applications in the field of MST, MEMS and micro engineering. These include the fabrication of pressure sensors, accelerometers, micro-pumps and other fluid handling devices. The process is also used for first-order packaging of silicon microstructures to isolate package-induced stresses. The OAI AML Wafer Bonder facilitates both the alignment and bonding to be performed in-situ, in a high vacuum chamber. For anodic bonding the wafers are loaded cold and heated in the process chamber. For high accuracy alignment the wafers are aligned and brought into contact only after the process temperature has been reached, thus avoiding differential thermal expansion effects which can compromise alignment. The AML Wafer Bonder is excellent for anodic bonding, silicon direct and thermal compression bonding applications. These features enable the bonder to be used with virtually any processing tool.
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High Power Beam Analysis
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The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Cross Platform Data Collection and Analysis Software
PARKvue
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SPARKvue makes data collection, analysis, and sharing quick and easy on every platform. Compatible with all of PASCO’s wireless and PASPORT sensors, students can quickly set up their lab, or use a built-in Quick Start Lab and begin collecting data immediately. SPARKvue is for all sciences and grade levels. However, if you’re an advanced user looking for more capabilities such as video analysis, advanced statistics and calculations, and greater customization of data displays on a PC or Mac®, then check out our PASCO Capstone™ software.
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Embedded Analysis Software for the 2000 X-Series
D2000GENB
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Test and debug I²C, SPI, RS232/422/485/UART designs with triggering, decoding, and pass / fail mask limit testing.
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Partial Discharge Measurement and Analysis System
UHF 800
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Our UHF 800 is a system for measuring and analyzing partial discharges in the ultra-high frequency (UHF) range in testing environments with high levels of external noise.
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System for the Analysis of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel
SierraNet T328
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The SierraNet T328 system provides for analysis of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet T328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced T.A.P4 capture, triggering and filtering capabilities in the industry.
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Single or Multi-Track Stereo Image Analysis
StereoScope Pack
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The best tools to check the stereo image of your audio projects: the Blue Cat's StereoScope Pro plugin offers you high precision and advanced audio to MIDI CC capabilities for single track analysis, and Blue Cat's StereoScope Multi has unique multiple tracks monitoring features.
