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Showing results: 7891 - 7905 of 8141 items found.

  • PCIe-6346 , 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device

    785813-01 - NI

    PCIe, 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe-6346 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality, leveraging the high-throughput PCI Express (PCIe) bus and multicore-optimized driver and application software. Because of its multi-ADC architecture, the device offers simultaneous sampling. Onboard NI-STC3 timing and synchronization technology deliver advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • PCIe-6353 , PCI Express, 32 AI, (16-Bit, 1.25 MS/s), 4 AO (2.86 MS/s), 48 DIO Multifunction I/O Device

    81049-01 - NI

    PCI Express, 32 AI, (16-Bit, 1.25 MS/s), 4 AO (2.86 MS/s), 48 DIO Multifunction I/O Device - The PCIe‑6353 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality … leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6353 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • PXIe-4138, 60 V, 3 A System PXI Source Measure Unit

    782856-01 - NI

    ±60 V, 3 A System PXI Source Measure Unit—The PXIe‑4138 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4138 features 4-quadrant operation. The PXIe‑4138 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.

  • PXI-6711, 12-Bit, 4-Channel, 1 MS/s PXI Analog Output Module

    777794-01 - NI

    12-Bit, 4-Channel, 1 MS/s PXI Analog Output Module—The PXI‑6711 is a high-speed analog output device designed to deliver simultaneous, multichannel updates for control and waveform output applications, such as stimulus-response, power supply control, high-speed, deterministic control, and sensor/signal simulation. In addition, the device provides eight 5 V TTL/CMOS digital I/O lines; two 24‑bit, 20 MHz counter/timers; and digital triggering and external clocking capabilities. The PXI‑6711 can replace several kinds of instruments, including stand-alone proportional integral derivative (PID) controllers, low-speed arbitrary waveform generators, and function generators. You can control each data point for each channel to define common waveforms, such as square, sine, or sawtooth, as well as complex waveforms.

  • PXI-6713, 12-Bit, 8-Channel, 1 MS/s PXI Analog Output Module

    777795-01 - NI

    12-Bit, 8-Channel, 1 MS/s PXI Analog Output Module—The PXI‑6713 is a high-speed analog output device designed to deliver simultaneous, multichannel updates for control and waveform output applications, such as stimulus-response, power supply control, high-speed, deterministic control, and sensor/signal simulation. In addition, the device provides eight 5 V TTL/CMOS digital I/O lines; two 24‑bit, 20 MHz counter/timers; and digital triggering and external clocking capabilities. The PXI‑6713 can replace several kinds of instruments, including stand-alone proportional integral derivative (PID) controllers, low-speed arbitrary waveform generators, and function generators. You can control each data point for each channel to define common waveforms, such as square, sine, or sawtooth, as well as complex waveforms.

  • Weather Resistant Surge Protector for RS485 Control & 12VDC Power Lines

    SP-RS485-12V-O - Network Technologies Inc

    Ideal for applications such as video surveillance cameras and access control. Protects sensors running on 22 AWG 2-wire sensor cables or 12VDC power lines against the effects of electrostatic discharge, faulty wiring and lightning. RS485 protection: Stage 1 clamping voltage: ±90V; Stage 2 resistance: 3.3 Ohms; Stage 3 clamping voltage: ±7.5V. 12VDC power lines protection: Stage 1 clamping voltage: ±90V; Stage 2 current rating: 3A; Stage 3: 12V TVS (transient voltage suppression) diode. Screw terminal pairs for RS485 and 12VDC power lines protection. Will also protect two single ended data, analog or control lines. Impact and weather resistant enclosure with locking hinged cover.

  • Light Meters

    PCE Instruments

    A light meter is a very sensitive electronic measuring device used to help monitor the illumination of any given area. Most light meter devices are small in size, simple to operate and equipped with an easy-to-read lighted screen made of special glass. Typically, a heavy-duty housing protects the light sensor inside the light meter from damage. A light meter is used for measuring brightness in lux (lx), foot candle (fc) or candela per square meter (cd/m²)measuring units. Some light meter devices are equipped with an internal memory or data logger to record and save measurements. The measurement of light intensity with a light meter is becoming increasingly important in the workplace due to safety concerns. Light measurement is also necessary to determine the best location and angle when installing and adjusting solar panels.

  • 11 Function True RMS Multimeter

    Extech EX363 - Extech Instruments Corporation

    The EX363 is a Compact HVAC True RMS MultiMeter with a Built in Non Contact Voltage Detector. Featuring highly accurate True RMS measurements, LoZ for the prevention of false readings caused by ghost voltages, .5% basic accuracy, a 1000V AC/DC volt range, resistance up to 40MΩ, continuity beeper with visual alert, smart data hold, peak hold, auto power off with disable, relative mode for capacitance zero and offset adjustment. Additionally, the EX363 excels in HVAC flame rod measurements with a µA function, as well as Type K Temperature measurements from -40 to 742°F (-40 to 394°C) and Frequency and Capacitance measurements. Complete with test leads, 9V battery, holster with tilt stand, general purpose bead wire temperature probe and built-in magnet.

  • ±6 kV ANSI/ESDA/JEDEC HBM Test System

    HBM-TS10-A - High Power Pulse Instruments GmbH

    *±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C

  • OpenVPX CPU Blade with 4th/ 5th Generation Intel® Core™ Processor

    MIC-6314 - Advantech Co. Ltd.

    The MIC-6314 is Advantech’s next generation single processor 6U VPX blade, based on the 4th/ 5th Generation Intel® Core™ embedded platform with increased cache size and efficiency, as well as instruction set improvements. The MIC-6314 provides two configurable PCIE x 8 ports in the VPX data plane and two PCI Express ports x8 lanes in the VPX expansion plane to enable the highest performance available in the 6U VPX form factor compute intense applications. These PCIE interfaces offer high speed up to PCIE gen. 2 (5Gb/s) throughput, low latency, scalable, error recoverable deterministic interconnectivity to the mainstream peripherals and I/O cards such as DSP and FPGA cards. The PCIE widths and ports on the data plane and the extension plane of MIC-6314 is user configurable, which make MIC-6314 capable to replace the PCIE switch blade in a small system. With a SO-DIMM socket and additional soldered, onboard DRAM with ECC in a dual channel design running up to 1600MT/s, the MIC-6314 can be integrated into various harsh environments while maintaining maximum memory throughput, and supports memory expansion by using the latest SO-DIMM technology simultaneously. Tailored for harsh environments, the MIC-6314 has a native ruggedized convection cooled heat sink adaptable to various chassis environments; with the alternated optional air cooled heat sink, additional I/O is provided on the front panel. An onboard soldered, industrial SSD is included for maximum reliability, and a SSD socket is also available for a cost-efficient, modular storage. By using Intel®’s powerful PCH (Lynx Point) with its advanced SATA controller, the MIC-6314 offers high storage capacity at up to 6Gbps transfer speed. An onboard XMC site with PCIe x8 gen.3 connectivity can host high speed offload or I/O mezzanines. Two USB 3.0 ports on the front panel can connect to external devices with up to 5Gbps data rate. Network and remote connectivity can be achieved via a RS-232 console (RJ-45) and two GbE RJ-45 ports, powered by Intel®’s latest Gigabit Ethernet controller. The Intel® next generation graphics engine Iris Pro offers up to 2x the graphic performance compared to previous generation solutions. Triple independent display support can be implemented by using VGA and 2 DVI ports on MIC6314. Audio is powered by a ALC892 controller via the backplane interface, and provides media support. A PCIEinterface is reserved for the optional M.2 high speed storage.Besides the modern M.2 storage, three SATA III one SATA II and four USB ports (2x USB 3.0, 2x USB 3.0) are also connected to the backplane to fulfill the demand for extra IO ports or storage. Four GbE ports (two SERDES selectable) support system level IP connectivity, and four UART interfaces (RS232/422/485selectable) can be leveraged to interface to legacy devices and consoles.

  • SOSA Aligned 1-Slot 3U VPX Development Chassis for Quartz Products

    Model 8257A - Pentek, Inc.

    - Ideal development platform for Mercury's- Model 5553 8-Channel A/D & D/A Zynq UltraScale+ RFSoC Gen 3 - Processor - SOSA Aligned 3U VPX- Model 5550 8-Channel A/D & D/A Zynq UltraScale+ RFSoC Processor - SOSA Aligned 3U VPX- Access to data and control planes provided through RTM- 1-slot, small footprint development chassis- Rear panel access to RF I/O, 100 GigE and chassis manager- Supports VITA-67.3C- Compatible with the Quartz product family- Pentek's Quartz Family of Xilinx Zynq UltraScale+ RFSoC FPGA Products Video- Live Signal Acquisition Video: Quartz Model 5950 and Model 6001 RFSoC boards- Pipeline Newsletter: Strategies for Deploying Xilinx's Zync UltraScale+ RFSoC- Please refer to the product datasheet for Installed FPGA IP Module details

  • Electromagnetic Radiation Tester

    Model KM 196 - Kusam Electrical Industries Limited

    • Unit : Electric Field : V/m; Magnetic Field : mT• Precision : Electric Field : 1V/m; Magnetic Field : 0.01 mT• Range : Electric Field : 1V/m ~ 1999V/m.• Magnetic Field : 0.01 mT ~ 19.99 mT• Alarm Threshold : Electric Field : 40V/m, Magnetic Field : 0.4 mT• Reading Display : 3½ Digit Digital LCD display with Backlight.• Frequency Range : 5Hz ~ 3500MHZ• Sampling Time : About 0.4 second.• Measuring Mode : Dual Mode• Overload Alert : “1” appears on LCD• Sound & Light Alarm• Data Hold function.• Auto Power Off.• Average & Peak measurement.• Low Battery Indication.• Operating Temperature & Humidity : 0°C ~ 50°C; below 80%RH.• Power battery : 9V Battery.• Dimension : 63.6 x 31 x 125.8mm• Weight : Approx. 146g.

  • Computery Control Torsion Tester

    SG-L10 - Jinge Testing Machine Co.,Ltd

    The machine is mainly used for torsion test of metal and nonmetal,also it is applicable to the torsion test of parts and members. Servo-motor and cycloid gear reducer are introduced to the loading system in this product, the system for measuring torque and distortion angle are composed of high accurate torsion sensor, photoelectric encoder and computer measuring force.It possesses automatically tracking test torque and distortion angle, maintaining maximum peak load and displaying loading speed.Test data automatically display and process, print the test report according with the national criterions, including test date, number, material quality and torsion strength etc. The machine characterizes advanced technology, high accuracy, good stability, reliable quality and easy to operate, and it is necessary test instrument for aeronautics & astronautics, construction material, traffic, wire & cable, science research departm ent and universities.

  • 12V 0-500 Amp Carbon Pile Battery Load Tester and 12/24V Electrical Systems Tester

    6042 - Associated Equipment Corp.

    • Test batteries up to 1000 CCA• Interprets data from the charging/starting system on easy-to-read LCD displays• Shows positive and negative amps for easy diagnosis of current leakage problems• 0-500 Amp variable carbon pile load tester• Unique curved carbon discs ensure maximum contact, fewer hot spots, smoother operation and longer life• Heavy-duty single extruded leads for testing up to 15 feet apart• Test electrical systems on 12/24 Volt systems• Test all battery types• Ideal for testing remotely mounted batteries accurately• INCLUDES: Model 6043 1000 Amp AC/DC Inductive Amp Clamp for checking starter draw or parasitic drain test, also can be used with conventional multi-meters; heavy duty, two wheel tilt-back cart with 8” wheels and 2 trays.• Made in USA of US and Global Components

  • 80Gbps Video Analyzer/Generator for DisplayPort 2.0 Testing

    M42d - Teledyne LeCroy quantumdata

    The Teledyne LeCroy quantumdata M42d Video Analyzer/Generator provides functional and will support compliance testing for video, audio and protocol of DisplayPort 2.0 and DisplayPort 1.4. The M42d supports legacy DisplayPort lane rates of 1.62, 2.7, 5.4, 8.1 Gb/s and the new DP 2.0 higher speed lane rates of 10.0, 13.5, & 20.0 Gb/s data rates with the new line coding—128b/132b. The protocol analyzer provides a snap shot status view and deep analysis using captures of incoming DisplayPort 2.0 streams from source devices including DSC/FEC compressed streams. The M42d’s video generator can be used for testing silicon as well as devices such as displays, USB-C adapters, extenders, etc. The video generator offers a large library of standard video timings and test patterns necessary for testing next generation high resolution displays.

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