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Showing results: 7081 - 7095 of 8141 items found.

  • SMART Constant Current DC Load Banks

    SLB-Series - Eagle Eye Power Solutions

    SMART Constant Current DC Load Banks are designed for acceptance testing, discharge testing, battery capacity testing, battery maintenance, engineering examination and other testing for DC power with load. The SMART technology allows a constant current discharge without the need for manual adjustment of current during the discharge test. Our SLB-Series load banks are portable, durable, economic, safe, easy-to-use and come complete with our DataView software, providing the user with a complete data management and analysis program.

  • Software

    DataPRO  - DTS, Inc.

    DataPRO is a powerful set-up, control and data viewing software including ISO MME support. The modern user interface is designed to help test engineers create, control and manage every aspect of a test. DataPRO can be installed with an SQL server database and configured with individual user logins and access levels to support facilities and users of all sizes and capabilities. DataPRO works with all SLICE, TDAS G5 and TDAS PRO hardware and is required for systems using SLICE PRO TOM, DIM or TDM modules.

  • PXI Single 44x4 Matrix, 2 Pole Switching

    40-523-022 - Pickering Interfaces Ltd.

    Medium density PXI dual 44x4, 2-pole matrix - it is also available in reed relay formats of 1-pole and 1-pole screened (see "also in this range" on right). The screened version is suitable for switching signals up to 50MHz. Typical applications include signal routing in ATE and data acquisition systems. The two banks may be used for operating a 4-wire measurement system (bank-1 for source, bank-2 for measure). Larger matrices may be constructed by daisy chaining the common signals from multiple PXI Modules.

  • PCI Express Gen 3 Test Backplane

    SKU-015-01-PCIe - Amfeltec Corp.

    PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.

  • Optical Signal Test Set

    OST - Spectronix

    The Optical Signal Test Set (OSTS) combines a state of the art optical power meter, a variable attenuator, and a high stability laser source.  The unit is able to measure optical signals below -100dBm with 0.001dB resolution at a fraction of the size, power, and cost of competing solutions.   Other features include data logging, programmable filtering, and auto calibration.  Its small shielded ruggedized package, USB/power interface, and low cost make this unit perfect for lab use or for integration into larger systems.

  • VME – NIM Power Supplies

    CAEN S.p.A.

    VME solutions are an integral part of CAEN’s design history. CAEN VME solutions for Data Acquisition and Front End applications have been part of were first developed decades ago. These solutions have been upgraded and modernized multiple times, and were recently joined by CAEN VME programmable High Voltage Boards. Thanks to the innovative GECO2020 Control Software, and the multi-master capability of CAEN VME Bridges, it is now possible to accommodate and independently control an integrated VME DAQ/HV System.

  • Chassis Dynamometer Smoke Testers

    Van Leeuwen Test Systems BV

    A chassis dynamometer smoke tester (CDST) is used to test diesel emissions when the engine is under load. This is of course a much more realistic test than the commonly used free acceleration test. It is also better for the diesel engine.During a CDST test an automatic test cycle is performed, whereby the emission is measured at different engine loads. The monitor shows checks and actions to perform before the test, shows real-time measuring data and instructions for the driver during the test, and the end results after the test.

  • C/I Clamp Meters

    CLAMPMETER,OPEN JAW (CSJ-100) - Greenlee Tools

    *AC amperage, AC/DC voltage measurement*Open jaw design eases AC current measurement*Slim profile with build-inprobe storage on back*Measures resistance up to 20MΩ*Audible continuity and diode test*Bright LED and audible alarm for non-contact voltage detection*Auto power off for longer battery life*Data hold to capture measurements*2000 count LCD*Accessories included: (2)1.5V AAA batteries, test leads and carrying case*Lifetime Limited Warranty

  • Detective Logic Analyzer

    LPDDR5 - FuturePlus Systems

    Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 512M of captured States at up to 6400+ MT/sContinuous, real time analysis, not post-processing2D (voltage & time) Eye Detector guarantees valid data acquisition on each signalExtensive Triggering and Storage Qualification allows precise insightIndustry Leading Protocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specifications, NOT post processing. No other tool can provide this!Mode Register Listing provided

  • T3/E3, OC3/OC12, & STM1/STM4 Testing

    GL Communications Inc.

    T3 E3 Analysis software compliments the hardware and supports simultaneously monitoring up to 12 x T3 E3 lines (2x Rack units) for all alarms, frame errors, signalling and data. If one adds the Channelized T1 Analyzer software to the system, then the T1s within the T3s can also be analysed in software, 12 x T3 E3 lines (=12*28 T1s) constituting 336 full duplex T1s, or 672 simplex T1s monitored simultaneously using a single Rack unit.

  • O-E PROBE

    OptCom Company, Ltd

    O-E probe is the unit to convert optical signals to electrical signals. It can be connected to Oscilloscopes or data loggers via a BNC connector and monitor the conversion waveform. It can acquire the optical signal easily by just pointing the optical fiber probe at the light source. Recently, more and more light sources utilize optical modulation for next generation lighting such as LED. Acquiring the emission timing is required to measure the emission phenomenon of the light source. This O-E probe unit is the ideal tool for these tasks.

  • System for the Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel

    SierraNet M328 - Teledyne LeCroy

    The SierraNet M328™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.

  • System for Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel

    SierraNet M328Q - Teledyne LeCroy

    The SierraNet M328Q™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with two QSFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328Q includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.

  • System for the Analysis of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel

    SierraNet T328 - Teledyne LeCroy

    The SierraNet T328 system provides for analysis of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet T328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced T.A.P4 capture, triggering and filtering capabilities in the industry.

  • Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)

    Rocky Mountain Laboratories, Inc.

    Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.

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