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Showing results: 7606 - 7620 of 8141 items found.

  • USB-6343, 32 AI (16-Bit, 500 kS/s), 4 AO (900 kS/s), 48 DIO USB Multifunction I/O Device

    781439-01 - NI

    32 AI (16-Bit, 500 kS/s), 4 AO (900 kS/s), 48 DIO USB Multifunction I/O Device - The USB‑6343 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB‑6343 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6343, 32 AI (16-Bit, 500 kS/s), 4 AO (900 kS/s), 48 DIO USB Multifunction I/O Device

    782252-01 - NI

    32 AI (16-Bit, 500 kS/s), 4 AO (900 kS/s), 48 DIO USB Multifunction I/O Device - The USB‑6343 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB‑6343 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6343, 32 AI (16-Bit, 500 kS/s), 4 AO (900 kS/s), 48 DIO USB Multifunction I/O Device

    782253-01 - NI

    32 AI (16-Bit, 500 kS/s), 4 AO (900 kS/s), 48 DIO USB Multifunction I/O Device - The USB‑6343 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB‑6343 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • cDAQ-9178, 8‑Slot, USB CompactDAQ Chassis

    781156-01 - NI

    8‑Slot, USB CompactDAQ Chassis - The cDAQ‑9178 is a CompactDAQ USB chassis designed for small, portable sensor measurement systems. The chassis provides the plug‑and‑play simplicity of USB to sensor and electrical measurements. It also controls the timing, synchronization, and data … transfer between C Series I/O modules and an external host. You can use this chassis with a combination of C Series I/O modules to create a mix of analog I/O, digital I/O, and counter/timer measurements. The cDAQ‑9178 also has four 32‑bit general-purpose counters/timers. You can access these counters, as well as share clocks and triggers, through two built-in BNC connectors.

  • USB-6346, 8 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO USB Multifunction I/O Device

    785814-01 - NI

    8 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO USB Multifunction I/O Device - The USB-6346 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6346, 8 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO USB Multifunction I/O Device

    785815-01 - NI

    8 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO USB Multifunction I/O Device - The USB-6346 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • IC-3120, 1.91 GHz Intel Atom Quad-Core Processor, 2-GigE Port Industrial Controller

    784959-01 - NI

    The IC‑3120 is a compact and rugged industrial controller that withstands the harsh environments common in automation, supervisory control, distributed control, and industrial embedded OEM applications. The IC‑3120 offers two Gigabit Ethernet ports with Power over Ethernet (PoE) technology, FPGA-based I/O capabilities, and network connectivity for distributed control applications. The advanced features include the ability to synchronize image inspection results with industrial I/O and configure hardware-timed network triggers to trigger camera acquisition, motion control, or data acquisition. You can use the advanced FPGA personality that is shipped with the system or customize the FPGA functionality using the LabVIEW FPGA Module.

  • 10-in-1 Environmental Meter

    Extech EN510 - Extech Instruments Corporation

    Convenient 10-in-1 Environmental Meter measuring Air Velocity, Air Flow, Air Temperature, Type K Temperature, Heat Index, Humidity, Wet Bulb, Dew Point, Windchill, and Light Level. Includes built-in low friction ball bearing mini vane wheel, a precision photo diode with cosine and color correction filter, and a capacitive humidity sensor for high accuracy. The Type K input accepts standard Type K Thermocouple probes to measure surface temperature up to 2372°F (1300°C). Features large dual LCD with backlighting, Data Hold, and Min/Max function.

  • RF Power Amplifiers

    Precision Milimeter Wave

    Microwave and millimeter wave power amplifiers offer a wide variety of frequency ranges, bandwidths, gain and power outputs. Power amplifiers are used to convert low power signals to high power signals in the device. These are typically used in the Tx chain to amplify the signal before it is sent out via an antenna signal.Example specification in test data will be. Frequency, Small Signal Gain (dB), Output P1dB (dBm), Output Saturated Power, Amplifier Bias, Heat Sink Fan Bias, Maximum RF Input Power.If you are looking for RF Power Amplifiers we have the production capabilities to meet your needs.

  • Thermal Vision for ADAS and AV Developers

    FLIR ADK™ - Teledyne FLIR

    The FLIR ADK is a cost-effective way to develop the next generation of automotive thermal vision for advanced driver assistance systems (ADAS) and autonomous vehicles (AV). Thermal infrared cameras are the best sensor technology for pedestrian detection and provide the critical data needed to improve automated decision making in vehicle safety functions including automatic emergency braking (AEB). The ADK’s rugged, IP67 rated enclosure incorporates a heated window for all-weather driving. With the GMSL, USB, and FBD-Link interfaces and drivers available form Teledyne FLIR, installation and testing is plug-and-play easy. Interested in a thermal vision enhancement system for today’s vehicles, please see PathFindIR II.

  • VOIP

    Macom Technology Solutions Holdings Inc.

    MACOM’s family of VoIP processing devices, in concert with carrier-grade media stream processing software, delivers a complete, integrated VoIP media, data and fax, signaling and control processing solution. Combined with dual-core ARMs, powerful DSP cores, dual Gigabit Ethernet with flexible packet processing engine and a rich set of interfaces, the processors support 8 to 160 channels of packet-TDM and packet-packet operations, with an integrated host controller supporting control, signaling and other application specific functions. Major applications include next-generation network (NGN) POTS/ISDN line cards focused on class 5 replacement, xPON MDUs, IP-DSLAMS, MSAN, and IP-PBX, and Unified Communications.

  • Analyzer Test Set

    280 Series - Teledyne LeCroy quantumdata

    The Teledyne LeCroy quantumdata 280 HDMI/HDBaseT Video Generator (Tx) and Analyzer (Rx) is small compact, battery powered test set ideally suited for professional A/V integrators and home theatre installers. This convenient test set enables you to conduct basic verification and diagnostic tests on HDMI/HDBaseT cables, video distribution networks and individual A/V components. The HDMI input and output ports support testing up to 18 Gbps data rate and 600 MHz pixel rate and the HDBaseT input and output ports support testing up to 300 MHz pixel rate. The HDBaseT interface supports transmission in Long Reach mode as well.

  • 3 Phase Power Analyzer

    VPA-60080 - Veer Electronics

    VEER Power Analyzer VPA-60080 is result of continuous R & D activities. It is an accurate Instrument to test 3 phase & 1 phase electrical Machines due to high sampling rate & simultaneous measurement of parameters. It has no adjustable components inside so, accuracy remains long time. We provide Free Software VEER POWER ANALYZER TOOL with VPA-60080 to communicate with computer which is capable to collect all parameters from VPA-60080 & generates test report. You can see parameters in different view like Digital, Analog, Graphical etc in real time. You can record test data in real time to eliminates Human error in Testing.

  • Temperature Forcing System

    ETF-SERIES - Envisys Technologies

    Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system

  • Design for Test Service

    Testing House, Inc.

    Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.

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